REVISIONS
LTR
A
B
C
D
E
DESCRIPTION
Changes to slew rate test. Changes IAW NOR 5962-R194-93.
Changes boilerplate to add one-part numbers. Add device type 03.
Add delta test limits. Redrawn.
Change to group A subgroups for TCVOOS in table I. Update boilerplate. - rrp
Add device type 01 limits to table I
IB
. - ro
Drawing updated to reflect current requirements. - ro
DATE (YR-MO-DA)
93-08-25
97-06-03
00-10-26
02-11-22
06-05-16
APPROVED
M. A. FRYE
R. MONNIN
R. MONNIN
R. MONNIN
R. MONNIN
THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED.
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
REV
SHEET
E
1
E
2
E
3
E
4
E
5
E
6
E
7
E
8
E
9
E
10
E
11
E
12
PREPARED BY
CHARLES E. BESORE
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
CHECKED BY
WILLIAM J. JOHNSON
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
APPROVED BY
MICHAEL A. FRYE
MICROCIRCUIT, LINEAR, INSTRUMENTATION
AMPLIFIER, MONOLITHIC SILICON
DRAWING APPROVAL DATE
88-09-13
AMSC N/A
REVISION LEVEL
E
SIZE
A
SHEET
CAGE CODE
67268
1 OF
12
5962-88630
DSCC FORM 2233
APR 97
5962-E464-06
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)
and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or
Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
1.2 PIN. The PIN is as shown in the following examples.
For device classes M and Q:
5962
-
88630
01
V
X
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
/
Device
type
(see 1.2.2)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
\/
Drawing number
For device class V:
5962
-
88630
01
V
V
X
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
/
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
\/
Drawing number
1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A
specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
02
03
Generic number
AMP-01A
AMP-01B
AMP01
Circuit function
Low-noise, precision, instrumentation amplifier
Low-noise, precision, instrumentation amplifier
Low-noise, precision, instrumentation amplifier
1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed
below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q
designators will not be included in the PIN and will not be marked on the device.
Device class
M
Device requirements documentation
Vendor self-certification to the requirements for MIL-STD-883 compliant, non-
JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A
Certification and qualification to MIL-PRF-38535
Q or V
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
5962-88630
SHEET
E
2
1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows:
Outline letter
K
V
3
Descriptive designator
GDFP2-F24 or CDFP3-F24
GDIP1-T18 or CDIP2-T18
CQCC1-N28
Terminals
24
18
28
Package style
Flat pack
Dual-in-line
Square leadless chip carrier
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,
appendix A for device class M.
1.3 Absolute maximum ratings. 1/
Supply voltage (V
S
) .....................................................................................
±18
V dc
Power dissipation (P
D
) ................................................................................ 500 mW 2/
Common mode input voltage ....................................................................... Supply voltage
Differential input voltage:
R
G
≥
2 kΩ ................................................................................................
±20
V dc
R
G
< 2 kΩ ................................................................................................
Output short circuit duration .........................................................................
Storage temperature range ..........................................................................
Lead temperature (soldering, 60 seconds) ..................................................
Thermal resistance, junction-to-case (θ
JC
) ..................................................
±10
V dc
Indefinite
-65°C to +150°C
+300°C
See MIL-STD-1835
Thermal resistance, junction-to-ambient (θ
JA
):
Case V ..................................................................................................... 120°C/W
Case 3 ...................................................................................................... 104°C/W
Case K ..................................................................................................... 69°C/W
1.4 Recommended operating conditions.
Supply voltage (V
S
) .....................................................................................
±15
V dc
Ambient operating temperature range (T
A
) ................................................. -55°C to +125°C
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 -
MIL-STD-1835 -
Test Method Standard Microcircuits.
Interface Standard Electronic Component Case Outlines.
________
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ Must withstand the added P
D
due to short circuit test, e.g., I
OS
.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
5962-88630
SHEET
E
3
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 -
MIL-HDBK-780 -
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
(Copies of these documents are available online at
http://assist.daps.dla.mil/quicksearch/
or
http://assist.daps.dla.mil
or from
the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in
MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this
drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and
herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2
herein) involving devices acquired to this drawing is required for any change that affects this drawing.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
5962-88630
SHEET
E
4
TABLE I. Electrical performance characteristics.
Conditions 1/
-55°C
≤
T
A
≤
+125°C
unless otherwise specified
Group A
subgroups
1
2, 3
1
2, 3
Input offset current
I
IO
1
2, 3
1
2, 3
Offset referred to input vs.
positive supply
+PSR
V+ = +5 V to +15 V,
V- = -15 V, G = 1000
V+ = +5 V to +15 V,
V- = -15 V, G = 100
V+ = +5 V to +15 V,
V- = -15 V, G = 10
V+ = +5 V to +15 V,
V- = -15 V, G = 1
V+ = +5 V to +15 V,
V- = -15 V, G = 1000
V+ = +5 V to +15 V,
V- = -15 V, G = 100
V+ = +5 V to +15 V,
V- = -15 V, G = 10
V+ = +5 V to +15 V,
V- = -15 V, G = 1
Offset referred to input vs.
negative supply
-PSR
V- = -5 V to -15 V,
V+ = +15 V, G = 1000
V- = -5 V to -15 V,
V+ = +15 V, G = 100
V- = -5 V to -15 V,
V+ = +15 V, G = 10
V- = -5 V to -15 V,
V+ = +15 V, G = 1
See footnote at end of table.
1, 2, 3
All
02
1, 2, 3
01, 03
120
110
95
75
110
100
90
70
105
90
70
50
dB
02
01, 03
02
Device
type
01,03
Limits
Unit
Min
Max
±4
±10
±6
±15
1
3
2
6
dB
nA
nA
Test
Symbol
Input bias current
I
B
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
5962-88630
SHEET
E
5
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