REVISIONS
LTR
A
B
DESCRIPTION
Technical change for I
DDQ
and ΔI
DDQ
in table I. - PHN
Add die requirements with appendix A. Correct low and high level bounce
noise test condition for subgroup in the table IA. Update boilerplate
paragraphs to current MIL-PRF-38535 requirements. - MAA
Update electrical test requirements in table IIA for group C and D. Update
radiation features in section 1.5 and table IB. Update boilerplate paragraphs to
current requirements of MIL-PRF-38535. - MAA
Add equivalent test circuits footnotes to figure 6. Delete class M requirements
per updated boilerplate paragraphs. - MAA
DATE (YR-MO-DA)
07-04-02
09-02-10
APPROVED
Thomas M. Hess
Charles F. Saffle
C
11-06-14
David J. Corbett
D
12-11-19
Thomas M. Hess
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
D
15
D
16
D
17
D
18
REV
SHEET
PREPARED BY
Phu H. Nguyen
CHECKED BY
Charles F. Saffle
APPROVED BY
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
Thomas M. Hess
DRAWING APPROVAL DATE
07-01-24
AMSC N/A
REVISION LEVEL
SIZE
CAGE CODE
D
19
D
20
D
21
D
1
D
22
D
2
D
23
D
3
D
24
D
4
D
25
D
5
D
6
D
7
D
8
D
9
D
10
D
11
D
12
D
13
D
14
STANDARD
MICROCIRCUIT
DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil
MICROCIRCUIT, DIGITAL, RADIATION
HARDENED CMOS, 16-BIT D FLIP FLOP, TTL
COMPATIBLE INPUTS, AND THREE-STATE
OUTPUTS, MONOLITHIC SILICON
D
A
67268
5962-06245
SHEET 1 OF 25
DSCC FORM 2233
APR 97
5962-E041-13
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and
space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or
Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
1.2 PIN. The PIN is as shown in the following example:
5962
R
06245
01
V
X
A
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
/
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
\/
Drawing number
1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
Generic number
UT54ACTQ16374
Circuit function
16-bit D flip-flop, TTL compatible inputs,
and three-state outputs.
1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as
follows:
Device class
Q or V
Device requirements documentation
Certification and qualification to MIL-PRF-38535
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
X
Descriptive designator
See figure 1
Terminals
48
Package style
Flat pack
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V.
.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
5962-06245
SHEET
D
2
1.3 Absolute maximum ratings. 1/
Supply voltage range (V
DD
) .................................................................................................. -0.3 V to 6.0 V
Voltage on any pin during operation (V
I/O
) .......................................................................... -0.3 V to V
DD
+ 0.3 V
Maximum DC input current (I
I
) ............................................................................................
±10
mA
Maximum power dissipation (P
D
) ........................................................................................ 310 mW
Thermal resistance, junction to case (θ
JC
): .......................................................................... 20°C/W
Storage temperature range (T
STG
) ....................................................................................... -65°C to 150°C
Maximum junction temperature (T
J
) .................................................................................... 175°C
1.4 Recommended operating conditions.
Supply voltage range (V
DD
) ................................................................................................... 4.5 V to 5.5 V
Input voltage any pin (V
IN
) ................................................................................................... 0 V to V
DD
Maximum input rise or fall time (t
INRISE
, t
INFALL
) ...................................................................... 20 ns
Temperature range (T
C
) ........................................................................................................ -55°C to 125°C
1.5 Radiation features.
Maximum total dose available (dose rate = 50 – 300 rads(Si)/s) ............................................
Single event phenomena (SEP):
No Single Event Latchup (SEL) occurs at effective LET (see 4.4.4.5) ..................................
No Single Event Upset (SEU) occurs at effective LET (see 4.4.4.5) ....................................
Neutron fluence ......................................................................................................................
100 Krad(Si)
≤ 108 MeV-cm /mg 2/
2
≤ 95 MeV-cm /mg 2/
14
2
1 x 10 n/cm 2/
2
________
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/
Limits are guaranteed by design or process, but not production tested unless specified by the customer through the
purchase order or contract.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
5962-06245
SHEET
D
3
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 -
MIL-STD-1835 -
Test Method Standard Microcircuits.
Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 -
MIL-HDBK-780 -
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
(Copies of these documents are available online at
https://assist.dla.mil/quicksearch/
or from the Standardization Document
Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Non-Government publications. The following document form a part of this document to the extent specified herein. Unless
otherwise specified, the issues of the documents are the issues of the documents cited in the solicitation.
ASTM INTERNATIONAL (ASTM)
ASTM F1192- Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion
Irradiation of Semiconductor Devices.
(Copies of this document is available online at
http://www.astm.org/
or from ASTM International, P. O. Box C700, 100 Barr
Harbor Driver, West Conshohocken, PA 19428-2959).
2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein.
3.1.1 Microcircuit die. For the requirements for microcircuit die, see appendix A to this document.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Function table. The function table shall be as specified on figure 3.
3.2.4 Logic diagram. The logic diagram shall be as specified on figure 4.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
5962-06245
SHEET
D
4
3.2.5 Ground bounce waveforms and test circuit. The ground bounce waveforms and test circuit shall be as specified on
figure 5.
3.2.6 Switching waveform and test circuit. The switching waveform and test circuit shall be as specified on figure 6.
3.2.7 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document
revision level control and shall be made available to the preparing and acquiring activity upon request.
3.3 Electrical performance characteristics and post-irradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and post-irradiation parameter limits are as specified in table IA and shall apply over the
full case operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table IA.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein. The certificate of compliance
submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the
manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall
be provided with each lot of microcircuits delivered to this drawing.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
5962-06245
SHEET
D
5
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