SCOPE: QUAD SPST CMOS ANALOG SWITCHES
Device Type
01
02
Generic Number
DG201AA(x)/883B
HI(x)-201A/883B
SMD Number
7705301
7705302
Case Outline(s).
The case outlines shall be designated in Mil-Std-1835 and as follows:
Case Outline
Package Code
Outline Letter
Mil-Std-1835
SMD (x for 01) (x for 02)
X
L
CDFP4-F16
16 LEAD FLATPACK
F16
E
K
1
GDIP1-T16 or CDIP2-T16 16 LEAD CERDIP
J16
2
Z
4
CQCC1-N20
20-Pin Ceramic LCC
L20
Absolute Maximum Ratings
Supply Voltage (Between V
+
and V
-
) for 01 ..................................................................... 44V
Supply Voltage (Between V
+
and V
-
) for 02 ..................................................................... 40V
Digital Input Voltage (V
IN
) for 01 1/ ...................................................…..... V
-
-0.3V dc to V
+
Digital Input Voltage (V
IN
) for 02 1/...................................................….. V
-
-4V dc to V
+
+4V
Analog Input Voltage (V
S
) ...................................................................... V
-
-2V dc to V
+
+2V
Current, Any terminal except S or D for 01..................................................................... 30mA
Current, Any terminal except S or D for 02 .................................................................... 25mA
Continuous Current, S or D for 01 ................................................................................... 20mA
Continuous Current, S or D for 02 ................................................................................... 25mA
Peak Current S or D(Pulsed at 1ms, 10% duty cycle max) for 01.................................... 70mA
Peak Current S or D(Pulsed at 1ms, 10% duty cycle max) for 02.................................... 40mA
Lead Temperature (soldering, 10 seconds) ........................................................................ +300°C
Storage Temperature ........................................................................................... -65°C to +150°C
Continuous Power Dissipation ............................................................................ T
A
=+70°C
16 lead Flatpack (derate 6.1mW/°C above +70°C) ................................................. 485mW
16 lead CERDIP(derate 10mW/°C above +70°C) ................................................... 800mW
20-Pin LCC (derate 9.1mW/°C above +70°C) ........................................................ 727mW
Junction Temperature T
J
..................................................................................…. +150°C
Thermal Resistance, Junction to Case,
ΘJC:
Case Outline 16 lead Flatpack ............................................................….. 65°C/W
Case Outline 16 lead CERDIP.................................................................. 50°C/W
Case Outline 20-Pin LCC ..................................................................…... 20°C/W
Thermal Resistance, Junction to Ambient,
ΘJA:
Case Outline 16 lead Flatpack .......................................................….... 165°C/W
Case Outline 16 lead CERDIP...........................................................…. 100°C/W
Case Outline 20-Pin LCC ................................................................….. 110°C/W
Recommended Operating Conditions.
Ambient Operating Range (T
A
) ................................................................ -55°C to
+125°C
NOTE 1: Signals on S
X
, D
X
, or IN
X
exceeding V
+
or V
-
are clamped by internal diodes, and are
also internally current limited to 25mA.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
----------------------------
Electrical Characteristics of DG201Axx/883B and
HIx-201/883B for SMD 77053
19-0336
Page 2 of
Rev. B
6
TEST
Symbol
CONDITIONS
-55
°C
<=T
A
<= +125°C
V+=+15V, V-=-15V, GND=0V
Unless otherwise specified
R
L
=1kΩ, CL=35pF,
V
IH
=+3V,V
IL
=0V
R
L
=1kΩ, CL=100pF,
V
IH
=+4V,V
IL
=0V
Group A
Subgroup
Device
type
Limits
Min
1/
Limits
Max
1/
1000
Units
DYNAMIC
Turn ON time
t
ON
9,10,11
01
ns
9
10,11
9
10,11
9
10,11
02
01
600
800
500
650
ns
500
650
Turn OFF time
t
OFF
R
L
=1kΩ, CL=35pF,
V
IH
=+3V,V
IL
=0V
R
L
=1kΩ, CL=100pF,
V
IH
=+4V,V
IL
=0V
02
NOTE 1: The limiting terms “min” (minimum) and “max” (maximum) shall be considered to apply to magnitudes
only. Negative current shall be defined as conventional current flow out of a device terminal.
NOTE 2: Guaranteed, if not tested, to the limits specified.
FIGURE 1: SWITCHING TIME TEST CIRCUIT:
See Commercial Data Sheet
TRUTH TABLE
Device Type
01 & 02
Logic
0
1
Switch
ON
OFF
TERMINAL CONNECTION
Terminal
DG201A & DG201A &
NUMBER
HIx-201
HIx-201
J16 & F16
L20
1
IN
1
NC
2
D
1
IN
1
3
S
1
D
1
4
V-
S
1
5
GND
V-
6
S
4
NC
7
D
4
GND
8
IN
4
S
4
9
IN
3
D
4
10
D
3
IN
4
11
S
3
NC
12
NC (01)
IN
3
3/ 12
V
REF
(02)
IN3
13
V+
D
3
14
S
2
S
3
15
D
2
NC (01)
3/ 15
D
2
V
REF
(02)
16
IN
2
NC
17
V+
18
S
2
19
D
2
20
IN
2
ORDERING
SMD #
7705301EA
7705301XC
77053012C
7705302EA
77053022C
INFORMATION
Maxim #
DG201AAK/883B
DG201AAL/883B
DG201AAZ/883B
HI1-201/883B
HI4-201/883B
Pkg.
J16
F16
L20
J16
L20
NOTE 3: V
REF
is normally floating, but voltage up to 10V can be applied to raise the threshold voltage.
----------------------------
Electrical Characteristics of DG201Axx/883B and
HIx-201/883B for SMD 77053
19-0336
Page 4 of
Rev. B
6
QUALITY ASSURANCE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2.
ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements
Subgroups
per Method 5005, Table 1
1
1*, 2, 3, 9
1, 2, 3, 9, 10, 11
1
Interim Electric Parameters
Method 5004
Final Electrical Parameters
Method 5005
Group A Test Requirements
Method 5005
Group C and D End-Point Electrical Parameters
Method 5005
*
PDA applies to Subgroup 1 only.
----------------------------
Electrical Characteristics of DG201Axx/883B and
HIx-201/883B for SMD 77053
19-0336
Page 5 of
Rev. B
6
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