IDT74FCT652AT/CT
FAST CMOS OCTAL TRANSCEIVER/REGISTER (3-STATE)
INDUSTRIAL TEMPERATURE RANGE
FAST CMOS OCTAL
TRANSCEIVER/
REGISTER (3-STATE)
FEATURES:
•
•
•
•
IDT74FCT652AT/CT
•
•
•
•
A and C grades
Low input and output leakage
≤
1µA (max.)
CMOS power levels
True TTL input and output compatibility:
– V
OH
= 3.3V (typ.)
– V
OL
= 0.3V (typ.)
High Drive outputs (-15mA I
OH
, 64mA I
OL
)
Meets or exceeds JEDEC standard 18 specifications
Power off disable outputs permit "live insertion"
Available in SOIC and QSOP packages
DESCRIPTION:
The FCT652T consists of a bus transceiver with 3-state D-type flip-flops
and control circuitry arranged for multiplexed transmission of data directly
from the data bus or from the internal storage registers. The FCT652T
utilizes GAB and
GBA
signals to control the transceiver functions.
SAB and SBA control pins are provided to select either real- time or stored
data transfer. The circuitry used for select control will eliminate the typical
decoding glitch that occurs in a multiplexer during the transition between
stored and real-time data. A low input level selects real-time data and a high
selects stored data.
Data on the A or B data bus, or both, can be stored in the internal D flip-
flops by low-to-high transitions at the appropriate clock pins (CPAB or
CPBA), regardless of the select or enable control pins.
FUNCTIONAL BLOCK DIAGRAM
GBA
GAB
CPBA
SBA
CPAB
SAB
B REG
ONE OF EIGHT CHANNELS
1D
C1
A1
A REG
1D
C1
B1
TO SEVEN OTHER CHANN ELS
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDUSTRIAL TEMPERATURE RANGE
1
JANUARY
2004
DSC-5508/4
© 2004 Integrated Device Technology, Inc.
IDT74FCT652AT/CT
FAST CMOS OCTAL TRANSCEIVER/REGISTER (3-STATE)
INDUSTRIAL TEMPERATURE RANGE
PIN CONFIGURATION
CPAB
SAB
GAB
A
1
A
2
A
3
A
4
A
5
A
6
A
7
A
8
GND
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
V
CC
CPBA
SBA
GBA
B
1
B
2
B
3
B
4
B
5
B
6
B
7
B
8
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Description
Max
–0.5 to +7
–0.5 to V
CC
+0.5
–65 to +150
–60 to +120
Unit
V
V
°C
mA
V
TERM
(2)
Terminal Voltage with Respect to GND
V
TERM
(3)
Terminal Voltage with Respect to GND
T
STG
I
OUT
Storage Temperature
DC Output Current
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage may exceed
Vcc by +0.5V unless otherwise noted.
2. Inputs and Vcc terminals only.
3. Output and I/O terminals only.
CAPACITANCE
(T
A
= +25°C, F = 1.0MHz)
Symbol
C
IN
C
OUT
Parameter
(1)
Input Capacitance
Output Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ.
6
8
Max.
10
12
Unit
pF
pF
NOTE:
1. This parameter is measured at characterization but not tested.
SOIC/ QSOP
TOP VIEW
PIN DESCRIPTION
Pin Names
A
1
- A
8
B
1
- B
8
CPAB, CPBA
SAB, SBA
GAB,
GBA
Description
Data Register A Inputs
Data Register B Outputs
Data Register B Inputs
Data Register A Outputs
Clock Pulse Inputs
Output Data Source Select Inputs
Output Enable Inputs
2
IDT74FCT652AT/CT
FAST CMOS OCTAL TRANSCEIVER/REGISTER (3-STATE)
INDUSTRIAL TEMPERATURE RANGE
FUNCTION TABLE
(1)
Inputs
GAB
L
L
X
H
L
L
L
L
H
H
H
GBA
H
L
H
H
X
L
L
L
H
H
L
CPAB
H or L
↑
↑
↑
H or L
↑
X
X
X
H or L
H or L
CPBA
H or L
↑
H or L
↑
↑
↑
X
H or L
X
X
H or L
SAB
X
X
X
X
X
X
X
X
L
H
H
SBA
X
X
X
X
X
X
L
H
X
X
H
Output
Output
Input
Output
Input
Input
Unspecified
(2)
Output
Output
Unspecified
(2)
Output
Input
Input
Input
A
1
- A
8
Input
Data I/O
B
1
- B
8
Input
Isolation
Store A and B Data
Store A, Hold B
Store A in Both Registers
Hold A, Store B
Store B in Both Registers
Real-Time B Data to A Bus
Stored B Data to A Bus
Real-Time A Data to B Bus
Stored A Data to B Bus
Stored A Data to B Bus and Stored B Data to A Bus
Operation or Function
NOTES:
1. H = HIGH
L = LOW
X = Don't Care
↑
= LOW-to-HIGH transition.
Select control = L: clocks can occur simultaneously.
Select control = H: clocks must be staggered in order to load both registers.
2. The data output functions may be enabled or disabled by various signals at the GAB or
GBA
inputs. Data input functions are always enabled, i.e. data at the bus pins will be stored
on every LOW-to-HIGH transition on the clock inputs.
3
IDT74FCT652AT/CT
FAST CMOS OCTAL TRANSCEIVER/REGISTER (3-STATE)
INDUSTRIAL TEMPERATURE RANGE
BUS
A
BUS
B
BU S
A
BUS
B
GAB
L
G BA
L
CPAB
X
CPBA
X
SAB
X
SBA
L
GAB
H
G BA
H
CPAB
X
CPBA
X
SAB
L
SBA
X
Real-Time Transfer
Bus B to A
Real-Time Transfer
Bus A to B
BUS
A
BU S
B
BUS
A
BUS
B
GAB
X
L
L
GBA
H
X
H
CPAB
↑
CPBA
X
↑
↑
SAB
X
X
X
SBA
X
X
X
GAB
H
G BA
L
CPAB
H or L
CPBA
H or L
SAB
H
SBA
H
X
↑
Storage From
A and/or B
Transfer Stores
Data to A and/or B
4
IDT74FCT652AT/CT
FAST CMOS OCTAL TRANSCEIVER/REGISTER (3-STATE)
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: T
A
= –40°C to +85°C, V
CC
= 5.0V ±5%
Symbol
V
IH
V
IL
I
IH
I
IL
I
OZH
I
OZL
I
I
V
IK
V
H
I
CC
Parameter
Input HIGH Level
Input LOW Level
Input HIGH Current
(4)
Input LOW Current
(4)
High Impedance Output Current
(3-State output pins)
(4)
Input HIGH Current
(4)
Clamp Diode Voltage
Input Hysteresis
Quiescent Power Supply Current
V
CC
= Max., V
I
= V
CC
(Max.)
V
CC
= Min, I
IN
= -18mA
—
V
CC
= Max., V
IN
= GND or V
CC
Test Conditions
(1)
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
V
CC
= Max.
V
CC
= Max.
V
CC
= Max
V
I
= 2.7V
V
I
= 0.5V
V
O
= 2.7V
V
O
= 0.5V
Min.
2
—
—
—
—
—
—
—
—
—
Typ.
(2)
—
—
—
—
—
—
—
–0.7
200
0.01
Max.
—
0.8
±1
±1
±1
±1
±1
–1.2
—
1
µA
V
mV
mA
Unit
V
V
µA
µA
µA
OUTPUT DRIVE CHARACTERISTICS
Symbol
V
OH
V
OL
I
OS
I
OFF
Parameter
Output HIGH Voltage
Output LOW Voltage
Short Circuit Current
Input/Output Power Off Leakage
(5)
V
CC
= Min
V
IN
= V
IH
or V
IL
V
CC
= Min
V
IN
= V
IH
or V
IL
Test Conditions
(1)
I
OH
= –8mA
I
OH
= –15mA
I
OL
= 64mA
Min.
2.4
2
—
–60
—
Typ.
(2)
3.3
3
0.3
–120
—
Max.
—
—
0.55
–225
±1
Unit
V
V
mA
µA
V
CC
= Max., V
O
= GND
(3)
V
CC
= 0V, V
IN
or V
O
≤
4.5V
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. The test limit for this parameter is ±5µA at T
A
= –55°C.
5. This parameter is guaranteed but not tested.
5
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