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LV8727GEVB

产品描述board eval for lv8727
产品类别开发板/开发套件/开发工具   
文件大小322KB,共23页
制造商ON Semiconductor(安森美)
官网地址http://www.onsemi.cn
标准  
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LV8727GEVB概述

board eval for lv8727

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Ordering number : ENA1998
LV8727
Bi-CMOS LSI
PWM Current Control
Stepping Motor Driver
Overview
http://onsemi.com
The LV8727 is a PWM current-controlled micro step bipolar stepping motor driver. This driver can do eight ways of
micro step resolution of Half, 1/8, 1/16, 1/32, 1/64, 1/128, 1/10, 1/20 Step, and can drive simply by the step input.
Features
Single-channel PWM current control stepping motor driver.
Output on-resistance (upper side : 0.25Ω ; lower side : 0.15Ω ; total of upper and lower : 0.4Ω ; Ta = 25°C, IO = 4.0A)
Half, 1/8, 1/16, 1/32, 1/64, 1/128, 1/10, 1/20 Step are selectable.
Advance the excitation step with the only step signal input.
BiCDMOS process IC.
Available forward reverse control.
IO max=4.0A
Thermal shutdown circuit.
Input pull down resistance
With reset pin and enable pin.
Specifications
Absolute Maximum Ratings
at Ta = 25°C
Parameter
Supply voltage
Output current
Output peak current
Logic input voltage
VREF input voltage
MO / DOWN pin input voltage
Allowable power dissipation
Operating temperature
Storage temperature
Symbol
VM max
IO max
IO peak
VIN max
VREF max
VMO /VDOWN max
Pd max
Topr
Tstg
Indipendent IC
tw≤10ms, duty 20%
Conditions
Ratings
50
4
4.6
6
6
6
2.45
-30 to +85
-55 to +150
Unit
V
A
A
V
V
V
W
°C
°C
Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.
Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current,
high voltage, or drastic temperature change, the reliability of the IC may be degraded. Please contact us for the further details.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013
June, 2013
N1611 SY 20111019-S00003 No.A1998-1/23

 
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