Tantalum Surface Mount Capacitors – High Reliability
T493 High Reliability Alternative MnO
2
(CWR11 Style)
Overview
The KEMET T493 is designed for the High Reliability
Series (HRA) requirements of military and aerospace
applications. The T493 is a surface mount product,
offering various lead-frame plating options, Weibull grading
options, surge current testing, F-Tech (an improved anode
manufacturing process), and Simulated Breakdown Voltage
(SBDV) screening options to improve long term reliability.
Standard, low, and ultra-low ESR options are available.
All lots of T493 are conditioned with MIL-PRF-55365
Group A testing. This series is also approved for DLA
drawing 07016 (please see part number list specific to this
drawing).
KEMET’s F-Tech eliminates hidden defects in the dielectric,
which continue to grow in the field, causing capacitor
failures. Based on the fundamental understanding of
degradation mechanisms in tantalum and niobium
capacitors, F-Tech incorporates multiple process
methodologies. Some minimize the oxygen and carbon
content in the anodes, which become contaminants
and can lead to the crystallization of the anodic oxide
dielectric. This process methodology reduces the
contaminants, improving quality of the dielectric. An
additional technology provides a stronger mechanical
connection point between the tantalum lead wire and
tantalum anode, enhancing robustness and product
reliability. The benefit of F-Tech is illustrated by a 2,000
hour, 85°C, 1.32 X rated voltage accelerated life test.
F-Tech parts see no degradation while standard tantalums
have 1.5 orders of magnitude degradation in leakage
current. F-Tech is currently available for T493 Series
(select D and X case capacitance values in 25 V and
higher rated voltage). Please contact KEMET for details on
ordering other part types with these capabilities.
The KEMET patented Simulated Breakdown Screening (SBDS)
is a nondestructive testing technique that simulates the
breakdown voltage (BDV) of a capacitor, without the damage
to its dielectric or to the general population of capacitors.
This screening identifies hidden defects in the dielectric,
providing the highest level of dielectric testing. SBDS is
based on the simulation of breakdown voltage (BDV), the
ultimate test of the dielectric in a capacitor.
Low BDV indicates defects in the dielectric, and therefore, a
higher probability of failure in the field. High BDV indicates
a stronger dielectric and high-reliability performance in the
field. This new screening method allows KEMET to identify
the breakdown voltage of each individual capacitor and
provide only the strongest capacitors from each lot.
SBDS is currently available on select part types in the T493
and T497. Please contact KEMET for details on ordering other
part types with these capabilities.
KEMET offers these technologies per the following options:
• F-Tech only
• SBDS only
• Combination of both F-Tech and SBDS for the ultimate
protection
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© KEMET Electronics Corporation • KEMET Tower • One East Broward Boulevard
Fort Lauderdale, FL 33301 USA • 954-766-2800 • www.kemet.com
T2007_T493 • 2/14/2020
1
Tantalum Surface Mount Capacitors – High Reliability
T493 High Reliability Alternative MnO
2
(CWR11 Style)
Benefits
• F-Tech and Simulated Breakdown Voltage (SBDS)
screening options available
• Tape & Reel standard packaging per EIA 481
• Symmetrical, compliant terminations
• Laser-marked case
• 100% surge current test available on all case sizes
• Termination options B, C, H, K, T, N, and M
• Weibull failure options B and C
•• All parts tested per Group A of MIL–PRF–55365
• Approved for DLA Drawing 07016 applications*
* Defense Logistics Agency (DLA), previously identified as DSCC
Applications
Typical applications include decoupling and filtering in military and aerospace applications.
Environmental Compliance
RoHS Compliant (6/6) according to Directive 2002/95/EC when ordered with 100% Sn solder.
K-SIM
For a detailed analysis of specific part numbers, please visit ksim.kemet.com to access KEMET’s K-SIM software. KEMET
K-SIM is designed to simulate behavior of components with respect to frequency, ambient temperature, and DC bias levels.
Ordering Information
T
Capacitor
Class
T=
Tantalum
493
D
227
K
006
C
H
61
Surge
61 = None
62 = 10 Cycles after
Weibull, 25°C
63 = 10 cycles after
Weibull, −55°C and
85°C after Weibull
64 = 10 cycles
before Weibull,−55°
and +85°C
20
ESR
10 = ESR
– standard
20 = ESR
– low
30 = ESR
– ultra-low
Rated
Series Case Capacitance Capacitance Voltage Failure Rate/ Termination Finish
Size Code (pF)
Tolerance
Design
(VDC)
Military
COTS
A,
B,
C,
D,
E,
X
First two
digits
represent
significant
figures.
Third digit
specifies
number of
zeros.
J = ±5%
K = ±10%
M = ±20%
004 = 4
006 = 6.3
010 = 10
016 = 16
020 = 20
025 = 25
035 = 35
050 = 50
063 = 63
A = N/A
B = 0.1%/
1,000 hours
C = 0.01%/
1,000 hours
C = Hot solder dipped
H = Standard solder-
coated (SnPb 5% Pb
minimum)
B = Gold-plated
K = Solder fused
T = 100% tin
N = Non-magnetic
100% tin (Sn)
M = Non-magnetic
(SnPb)
Packaging
(C-Spec)
Blank = 7"
reel
7280 = 13"
reel
7610 = Bulk
Bag
7640 = Bulk
plastic box
WAFL =
Waffle pack
For detailed part number offerings, please refer to: Table 1A – COTS, Table 1B – DLA Drawing 07016
© KEMET Electronics Corporation • KEMET Tower • One East Broward Boulevard
Fort Lauderdale, FL 33301 USA • 954-766-2800 • www.kemet.com
T2007_T493 • 2/14/2020
2
Tantalum Surface Mount Capacitors – High Reliability
T493 High Reliability Alternative MnO
2
(CWR11 Style)
Ordering Information – DLA Drawing 07016
07016-
Drawing Number
001
Dash Number
See Part Number
Table
K
Capacitance
Tolerance
J = ±5%
K = ±10%
M = ±20%
B
Reliability Grade
B = 0.1%/1,000 hours
C = 0.01%/1,000 hours
H
Termination Finish
C = Hot solder dipped
H = Standard solder coated
(SnPb 5% Pb minimum)
B = Gold-plated
A
Surge
A = +25°C after Weibull
B = −55°C and +85°C
after Weibull
C = −55°C and +85°C
before Weibull
Z or no option= No test
required
For detailed part number offerings, please refer to: Table 1A – COTS, Table 1B – DLA Drawing 07016
Ordering Information – F-Tech & Simulated Breakdown Screening (SBDS)
T
Capacitor
Class
T=
Tantalum
493
Series
Military
COTS
D
226
K
020
C
Failure Rate/
Design
A = N/A
B = 0.1%/
1,000 hours
C = 0.01%/
1,000 hours
H
Termination Finish
C = Hot solder dipped
H = Standard solder-
coated (SnPb 5% Pb
minimum)
B = Gold-plated
K = Solder fused
T = 100% tin
N = Non-magnetic
100% tin (Sn)
M = Non-magnetic
(SnPb)
61
Surge
61 = None
62 = 10 Cycles
after Weibull,
25°C
63 = 10 cycles
after Weibull,
−55°C and 85°C
after Weibull
64 = 10 cycles
before Weibull,
−55° and +85°C
20
Screening/ESR
11 = F-Tech + SBDS *
12 = SBDS
13 = F-Tech *
21 = Low ESR + 11
22= Low ESR + 12
23 = Low ESR + 13
31= Ultra-low ESR + 11
32 = Ultra-low ESR + 12
33 = Ultra-ow ESR + 13
Packaging
(C-Spec)
Blank = 7" Reel
7280 = 13" Reel
7610 = Bulk bag
7640 = Bulk
plastic box
WAFL = Waffle
pack
Rated
Case Capacitance Capacitance
Voltage
Tolerance
Size Code (pF)
(VDC)
A,
B,
C,
D,
E,
X
First two
digits
represent
significant
figures.
Third digit
specifies
number of
zeros.
J = ±5%
K = ±10%
M = ±20%
025 = 25
035 = 35
050 = 50
063 = 63
* Select "C", "D" and "X" case sizes in 20 V and higher rated voltage
For detailed part number offerings, please refer to: Table 1A – COTS, Table 1B – DLA Drawing 07016
Performance Characteristics
Item
Operating Temperature
Rated Capacitance Range
Capacitance Tolerance
Rated Voltage Range
DF (120 Hz)
ESR (100 kHz)
Leakage Current
−55° C to 125° C
0.1 – 470 μF at 120 Hz/25°C
J tolerance (5%), K tolerance (10%), M tolerance (20%)
4 – 63 V
Refer to Part Number Electrical Specification Table
Refer to Part Number Electrical Specification Table
≤ 0.01 CV (µA) at rated voltage after 5 minutes
Performance Characteristics
© KEMET Electronics Corporation • KEMET Tower • One East Broward Boulevard
Fort Lauderdale, FL 33301 USA • 954-766-2800 • www.kemet.com
T2007_T493 • 2/14/2020
3
Tantalum Surface Mount Capacitors – High Reliability
T493 High Reliability Alternative MnO
2
(CWR11 Style)
Qualification
Test
Endurance
Condition
Δ C/C
85°C at rated voltage, 2,000 hours
125°C at 2/3 rated voltage, 2,000 hours
DF
DCL
ESR
Δ C/C
DF
DCL
ESR
Δ C/C
MIL–STD–202, Method 107, Condition B, mounted,
−55°C to 125°C, 1,000 cycles
DF
DCL
ESR
+25°C
Extreme temperature exposure at a
succession of continuous steps at +25°C,
−55°C, +25°C, +85°C, +125°C, +25°C
Δ C/C
DF
DCL
25°C and 85°C, 1.32 x rated voltage 1,000 cycles
(125°C, 1.2 x rated voltage)
IL*
IL
IL
Δ C/C
DF
DCL
ESR
Δ C/C
DF
DCL
Characteristics
Within ±10% of initial value
Within initial limits
Within 1.25 x initial limit
Within initial limits
Within ±10% of initial value
Within initial limits
Within 1.25 x initial limit
Within initial limits
Within ±5% of initial value
Within initial limits
Within 1.25 x initial limit
Within initial limits
−55°C
±10%
IL
N/A
+85°C
±10%
1.5 x IL
10 x IL
+125°C
±15%
1.5 x IL
12 x IL
Storage Life
125°C at 0 volts, 2,000 hours
Thermal Shock
Temperature Stability
Within ±5% of initial value
Within initial limits
Within initial limits
Within initial limits
Within ±10% of initial value
Within initial limits
Within initial limits
Surge Voltage
Mechanical Shock/
Vibration
*IL = Initial limit
MIL–STD–202, Method 213, Condition I, 100 G peak
MIL–STD–202, Method 204, Condition D, 10 Hz to
2,000 Hz, 20 G peak
Certification
MIL–PRF–55365/8
DLA Drawing 07016
© KEMET Electronics Corporation • KEMET Tower • One East Broward Boulevard
Fort Lauderdale, FL 33301 USA • 954-766-2800 • www.kemet.com
T2007_T493 • 2/14/2020
4
Tantalum Surface Mount Capacitors – High Reliability
T493 High Reliability Alternative MnO
2
(CWR11 Style)
Electrical Characteristics
ESR vs. Frequency
1,000
100
Impedance, ESR (Ohms)
10
T493B106/020_IMP
T493E476/035_IMP
T493X226/035_IMP
T493B106/020_ESR
T493E476/035_ESR
T493X226/035_ESR
1
0.1
0.01
100
1,000
10,000
Frequency (Hz)
100,000
1,000,000
10,000,000
Capacitance vs. Frequency
100
Capacitance (µF)
10
1
T493B106/020
T493E476/035
T493X226/035
0.1
100
1,000
10,000
Frequency (Hz)
100,000
1,000,000
10,000,000
© KEMET Electronics Corporation • KEMET Tower • One East Broward Boulevard
Fort Lauderdale, FL 33301 USA • 954-766-2800 • www.kemet.com
T2007_T493 • 2/14/2020
5
NXP MCU
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