电子工程世界电子工程世界电子工程世界

关键词

搜索

型号

搜索

C1210A430G2GAH7800

产品描述Ceramic Capacitor, Multilayer, Ceramic, 200V, 2% +Tol, 2% -Tol, BP, -/+30ppm/Cel TC, 0.000043uF, 1210,
产品类别无源元件    电容器   
文件大小160KB,共8页
制造商KEMET(基美)
官网地址http://www.kemet.com
下载文档 详细参数 全文预览

C1210A430G2GAH7800概述

Ceramic Capacitor, Multilayer, Ceramic, 200V, 2% +Tol, 2% -Tol, BP, -/+30ppm/Cel TC, 0.000043uF, 1210,

C1210A430G2GAH7800规格参数

参数名称属性值
是否Rohs认证不符合
Objectid926596323
包装说明, 1210
Reach Compliance Codenot_compliant
ECCN代码EAR99
YTEOL7.8
电容0.000043 µF
电容器类型CERAMIC CAPACITOR
介电材料CERAMIC
高度1.6 mm
JESD-609代码e0
长度3.07 mm
多层Yes
负容差2%
端子数量2
最高工作温度125 °C
最低工作温度-55 °C
封装形式SMT
包装方法TR, Plastic, 7 Inch
正容差2%
额定(直流)电压(URdc)200 V
系列C1210(BP,200V)
尺寸代码1210
温度特性代码BP
温度系数30ppm/Cel ppm/°C
端子面层Tin/Lead (Sn/Pb) - with Nickel (Ni) barrier
宽度2.56 mm

文档预览

下载PDF文档
CERAMIC HIGH RELIABILITY
GENERAL INFORMATION GR900 SERIES
HIGH RELIABILITY — GR900
GR900 capacitors are intended for use in any application where
the chance of failure must be reduced to the lowest possible
level. While any well-made multilayer ceramic capacitor is an
inherently reliable device, GR900 capacitors receive special
attention in all phases of manufacture including:
— Raw Materials Selection
— Special Designs
— Clean Room Production
— Individual Batch Testing
— C-SAM (when applicable)
— Singular Batch Identity is Maintained
— Destructive Physical Analysis
These parts are well worth the added investment in comparison
to the cost of a device or system failure.
Typical applications include:
Medical, Aerospace, Communication Satellites, Radar, Guidance
Systems.
SCREENING AND SAMPLE TESTS
Each batch receives the following testing/inspections:
Preliminary:
1. Destructive Physical Analysis: (DPA) - A sample is pulled from
each lot and examined per EIA-469 and KEMET’s strict internal
void and delamination criteria. Sampling plan is per MIL-PRF-123.
2. C-SAM - May be performed on batches failing to meet the
DPA criteria for removal of marginal product. Not required on
each lot.
Group A
1. Thermal Shock
— Materials used in the construction of mul-
tilayer ceramic capacitors possess various thermal coefficients of
expansion. To assure maximum uniformity, each part is temper-
ature cycled in accordance to MIL-STD-202, Method 107,
Condition A with Step 3 being 125°C. Number of cycles shall be
20 (100% of lot).
2. Voltage Conditioning
— One of the most strenuous environ-
ments for any capacitor is the high temperature/high voltage test.
All units are subject to twice-rated voltage to the units at the max-
imum rated temperature of 125°C for a minimum of 168 hours
and a maximum of 264 hours. The voltage conditioning may be
terminated at any time during 168 hours to 264 hours time inter-
val that confirmed failures meet the requirements of the PDA dur-
ing the last 48 hours of 1 unit or .4% (100% of lot).
Optional Voltage Conditioning (Accelerated Voltage
Conditioning)
— All conditions of the standard voltage condi-
tioning apply with the exception of increased voltage and
decreased test time. Refer to MIL-PRF-123 for the proper formula.
*Step 5 is performed on chips at this point (100% of lot).
3. Dielectric Withstanding Voltage
— 250% of the dc rated volt-
age at 25°C (100% of lot).
4. Insulation Resistance
— The 25°C measurement with rated
voltage applied shall be the lesser of 100 GΩ or 1000 megohm-
microfarads (100% of lot).
*5. Insulation Resistance
— The 125°C measurement with
rated voltage applied shall be the lesser of 10 GΩ or 100
megohm-microfarads (100% of lot). For chips, 125°C IR is per-
formed prior to Step 3 above.
6. Storage
at 150°C for 2 hours minimum without voltage applied
followed by a 12-hour minimum stabilization period (temperature
characteristic BX only).
7. Capacitance
— Shall be within specified tolerance at 25°C
(100% of lot). (Aging phenomenon is taken into account for BX
dielectric to obtain capacitance.)
8. Dissipation Factor
— Shall not exceed 2.5% for X7R (BX)
dielectric, 0.15% for C0G (BP) dielectric at 25°C. (100% of lot.)
9. Percent Defective Allowable (PDA)
— The overall PDA is 8%
for parts outside the MIL-PRF-123 values. The PDA is per MIL-
PRF-123 for all parts that are valid MIL-PRF-123 values. The PD
includes steps 1 through 8 above with the following exceptions.
Capacitance exclusion - capacitance values no more than 5% or
.5pF, whichever is greater for BX characteristic or 1% or .3pF,
whichever is greater for BP characteristic beyond specified toler-
ance limit, shall be removed from the lot but shall not be consid-
ered defective for determination of the PD.
Insulation Resistance at 25°C — Product which is not acceptable
for twice the military limit but is acceptable per the military limit,
is removed from the lot but shall not be considered defective for
determination of the PD.
10. Visual and Mechanical Examination
— Performed per MIL-
PRF-123 criteria.
11. Radiographic Examination (Leaded Devices Only)
Radial devices receive a one-plane X-ray.
12. Destructive Physical Analysis (DPA)
— A sample is exam-
ined on each lot per EIA-469. Sampling Plan is per MIL-PRF-123.
STANDARD PACKAGING
All products are packaged in trays except C512 capacitors which
are packaged 1 piece per bag.
DATA PACKAGE
A data package is sent with each shipment which contains:
1.
Final Destructive Physical Analysis (DPA) report.
2.
Certificate of Compliance stating that the parts meet all applic-
able requirements of the appropriate military specification to the
best failure level to which KEMET is approved.
3.
Summary of Group A Testing.
12
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com
通过功耗计算实用程序实现电源故障的状态复原
CTPL是用于超低功耗 MSP430FRxx FRAM 微控制器的软件实用程序,它能让应用程序在系统断电或进入类似 LPMx.5 的深度睡眠模式之前将 CPU 和外设状态保存到非易失性 FRAM 中。CTPL 随后在应用 ......
Jacktang 微控制器 MCU
转载:搜寻电子图书的一些小窍门
平时会收到很多询问是否可以提供某本电子书下载的要求,除了少数情况下会回复几句,大多数时间都不会回复,已经在Blog上总结了电子书的寻找方法,各位读者能不能在询问之前先花些时间去找一下, ......
tiankai001 下载中心专版
st7RC时钟加PLL后不准!
我使用ST7 RC振荡器,用自动装载定时器定时。PLL 禁止时,频率很准,设定为4ms。5V 下使能乘8锁相环,时钟就差了很多,不是500us了。不知道问题出在哪里了?难道内部时钟不能用PLL。...
zhangq stm32/stm8
多级、高增益电路设计时需要考虑的问题
在设计多级高增益电路时,它的稳定指标、噪声指标、带宽指标等等, 都与单级有所不同,对多级放大器,特别是高增益,会比单级带来更多的麻烦, 这篇文章讲得很好: 118557...
dontium 模拟与混合信号
大伙讨论下ce下影响系统运行速度的主要原因是什么~~
小的是用200M的ep9315,隔壁室用的是2440。把应用程序试了对比一下,切换界面速度真是差太远了。单单在系统下操作窗口都感觉不一样。虽说频率差一半,但至少ep9315还有所谓的2d硬件加速显示,我 ......
andyye1630 嵌入式系统
AD835乘法器输出不能倍频
本帖最后由 xpfshawn 于 2017-8-16 10:39 编辑 最近搞了AD835,焊好板子之后却发现不能倍频,电路按照手册搭建。OP847增益20倍,可以正常工作。 317453 317454 X通道直接接函数发生器 ......
xpfshawn 模拟电子

 
EEWorld订阅号

 
EEWorld服务号

 
汽车开发圈

 
机器人开发圈

About Us 关于我们 客户服务 联系方式 器件索引 网站地图 最新更新 手机版

站点相关: 大学堂 TI培训 Datasheet 电子工程 索引文件: 1529  2733  2547  269  1096  31  56  52  6  23 

器件索引   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

北京市海淀区中关村大街18号B座15层1530室 电话:(010)82350740 邮编:100190

电子工程世界版权所有 京B2-20211791 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号 Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved