Si5020-EVB
Functional Description
The evaluation board simplifies characterization of the
Si5020 Clock and Data Recovery (CDR) device by
providing access to all of the Si5020 I/Os. Device
performance can be evaluated by following the Test
Configuration section below. Specific performance
metrics include jitter tolerance, jitter generation, and
jitter transfer.
Power Supply
The evaluation board requires one 2.5 V supply. Supply
filtering is placed on the board to filter typical system
noise components, however, initial performance testing
should use a linear supply capable of supplying 2.5 V
±5% dc.
CAUTION:
The evaluation board is designed so that the
body of the SMA jacks and GND are shorted. Care must
be taken when powering the PCB at potentials other
than GND at 0.0 V and VDD at 2.5 V relative to chassis
GND.
Self-Calibration
The Si5020 device provides an internal self-calibration
function that optimizes the loop gain parameters within
the internal DSPLL
TM
. Self-calibration is initiated by a
high-to-low transition of the PWRDN/CAL signal while a
valid reference clock is supplied to the REFCLK input.
On the Si5020-EVB board, a voltage detector IC is
utilized to initiate self-calibration. The voltage detector
drives the PWRDN/CAL signal low after the supply
voltage has reached a specific voltage level. This circuit
is described in Silicon Laboratories application note
AN42. On the Si5020-EVB, the PWRDN/CAL signal is
also accessible via a jumper located in the lower left-
hand corner of the evaluation board. PWRDN/CAL is
wired to the signal post adjacent to the 2.5 V post.
Device Powerdown
The CDR can be powered down via the PWRDN/CAL
signal. When asserted the evaluation board will draw
minimal current. PWRDN/CAL is controlled via one
jumper located in the lower left-hand corner of the
evaluation board. PWRDN/CAL is wired to the signal
post adjacent to the 2.5 V post.
CLKOUT, DATAOUT, DATAIN
These high-speed I/Os are wired to the board perimeter
on 30 mil (0.030 inch) 50
microstrip lines to the end-
launch SMA jacks as labeled on the PCB. These I/Os
are AC coupled to simplify direct connection to a wide
array of standard test hardware. Because each of these
signals are differential both the positive (+) and negative
(–) terminals must be terminated to 50
.
Terminating
only one side will adversely degrade the performance of
the CDR. The inputs are terminated on the die with 50
resistors.
2
To improve the DATAOUT eye-diagram, short 100
transmission line segments precede the 50
high-
speed traces. These segments increase the interface
bandwidth from the chip to the 50
traces and reduce
data inter-symbol-interference. Please refer to Silicon
Laboratories application note AN43 for more details.
Note:
The 50
termination is for each terminal/side of a dif-
ferential signal, thus the differential termination is actu-
ally 50
+ 50
= 100
.
REFCLK
REFCLK is used to center the frequency of the
DSPLL™ so that the device can lock to the data. Ideally
the REFCLK frequency should be 1/128th, 1/32nd, or
1/16th the VCO frequency and must have a frequency
accuracy of ±100 PPM. Internally, the CDR
automatically recognizes the REFCLK frequency within
one of these three frequency ranges. Typical REFCLK
frequencies are given in Table 1. REFCLK is AC
coupled to the SMA jacks located on the top side of the
evaluation board.
Table 1. Typical REFCLK Frequencies
Gigabit
Ethernet
19.53 MHz
78.125 MHz
156.25 MHz
SONET/SDH
19.44 MHz
77.76 MHz
155.52 MHz
SONET/
SDH with
15/14 FEC
20.83 MHz
83.31 MHz
166.63 MHz
Ratio of
VCO to
REFCLK
128
32
16
RATESEL
RATESEL is used to configure the CDR to recover clock
and data at different data rates. RATESEL is a two bit
binary input that is controlled via two jumpers located in
the lower left-hand corner of the evaluation board.
RATESEL0/1 are wired to the center posts (signal post)
between 2.5 V and GND. For example, the OC-48 data
rate is selected by jumping RATESEL0 to 0.0 V and
RATESEL1 to 0.0 V.
The table given on the evaluation board lists
approximate data rates for the jumper configurations
shown in Figure 1. Applications with data rates within
±7% of the given data rate are also accommodated.
Rev. 1.0
Si5020-EVB
Jitter Generation:
Referring to Figure 2, this test
requires a pattern generator, a clock source
(synthesizer signal source), a jitter analyzer, and a
pulse generator (all unconnected high-speed outputs
must be terminated to 50
).
During this test, there is no
modulation of the Data Clock, so the data that is sent to
the CDR is jitter free. The Jitter Analyzer measures the
RMS and peak-to-peak jitter on the CDR CLKOUT.
Thus, any jitter measured is jitter generated by the
CDR.
Jitter Transfer:
Referring to Figure 2, this test requires
a pattern generator, a clock source (synthesizer signal
source), a modulation source, a jitter analyzer, and a
pulse generator (all unconnected high-speed outputs
must be terminated to 50
).
During this test the Jitter
Analyzer modulates the data pattern and data clock
reference. The modulated data clock reference is
compared with the CLKOUT of the CDR. Jitter on
CLKOUT relative to the jitter on the data clock reference
is plotted versus modulation frequency at predefined
jitter amplitudes.
2.5 V
GND
2.5 V
RATESEL1
RATESEL0
PWRDN/
CAL
RATESEL1
RATESEL0
PWRDN/
CAL
2488 Mbps
2.5 V
GND
1244 Mbps
2.5 V
RATESEL1
RATESEL0
PWRDN/
CAL
RATESEL1
RATESEL0
PWRDN/
CAL
622 Mbps
Figure 1. RATESEL Jumper Configurations
Loss-of-Lock (LOL)
LOL is an indicator of the relative frequency between
the data and the REFCLK. LOL will assert when the
frequency difference is greater than ±600 PPM. In order
to prevent LOL from de-asserting prematurely, there is
hysterisis in returning from the out-of-lock condition.
LOL will be de-asserted when the frequency difference
is less than ±300 PPM.
LOL is wired to a test point which is located on the
upper right-hand side of the evaluation board.
Test Configuration
The three critical tests that are typically performed on a
CDR device are jitter transfer, jitter tolerance, and jitter
generation. By connecting the Si5020 Evaluation Board
as shown in Figure 2, all three measurements can be
easily made.
REFCLK should be within ±100 PPM of the frequency
selected from Table 1. RATESEL must be configured to
match the desired data rate, and PWRDN/CAL must be
unjumpered.
Jitter Tolerance:
Referring to Figure 2, this test
requires a pattern generator, a clock source
(synthesizer signal source), a modulation source, a jitter
analyzer, a pattern analyzer, and a pulse generator (all
unconnected high-speed outputs must be terminated to
50
).
During this test the Jitter Analyzer causes a
modulation on the data pattern which drives the DATAIN
ports of the CDR. The Bit-Error-Rate (BER) is monitored
on the Pattern Analyzer. The modulation (jitter)
frequency and amplitude is recorded when the BER
approaches a specified threshold.
GND
GND
155 Mbps
Rev. 1.0
3
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
