Index
General Performance Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . .. . . . . . .3-6
HIGH TEMPERATURE CERAMIC CAPACITORS
HT/HP - Standard Series - (+200°C) Ceramic Capacitors C0G (NP0), X7R Dielectric . . . . . . . . . . . .. . . . . . . . . . . . . . .7-9
HV-High Voltage Series - (+200°C) Ceramic Capacitors C0G (NP0), X7R Dielectric . . . . . . . . . . . . . . . . . . . . . . . . .10-12
Ceramic Cased Capacitors C3 General Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ..13
SCR/SCA Standard Axial & Radial Ceramic Capacitors - C0G (NP0) Dielectric . . . . . . . . . . . . . . . . . . . . . . . .. . . . . . .14-16
SRR/SRA Standard Axial & Radial Ceramic Capacitors - X7R Dielectric . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . .14-16
ACR/ACA High Temperature (+200°C) Axial & Radial Ceramic Capacitors - C0G (NP0) Dielectric . . . . . . . . . . . . .. . .17-19
ARR/ARA High Temperature (+200°C) Axial & Radial Ceramic Capacitors - X7R Dielectric . . . . . . . . . . . . . . . . . . . .17-19
TCR/TCA High Temperature (+260°C) Axial & Radial Ceramic Capacitors - C0G (NP0) Dielectric . . . . . . . . . . . . . . .20-22
TRR/TRA High Temperature (+260°C) Axial & Radial Ceramic Capacitors - X7R Dielectric . . . . . . . . . . . . . . . . . . . .20-22
VCR - C3 High Temperature/High Voltage (+260°C) Axial & Radial Ceramic Capacitors - C0G (NP0) Dielectric .
. . .23-25
VRR - C3 High Temperature/High Voltage (+260°C) Axial & Radial Ceramic Capacitors - X7R Dielectric . . . . . . . . . .23-25
HIGH VOLTAGE CERAMIC CAPACITORS
HV Series, High Voltage, Radial Conformally Coated, C0G (NP0), X7R Dielectric . . . . . . . . . . . . . . . . . . . . . . . . . . ..26-30
HV Series, High Voltage, Radial Conformally Coated, C0G (NP0) & X7R Dielectric (MIL-PRF-49467 Equivalent) . . . .31-33
HS Series, High Voltage, Radial Conformally Coated, Space Quality, C0G (NP0) & X7R Dielectric . . . . . . . . . . . . . ..34-38
High Voltage, Ceramic Chip Military Equivalent Tested - C0G (NP0), X7R Dielectric . . . . . . . . . . . . . . . . . . . . . . . . . . .39-43
SM Series, High Voltage Surface Mount Ceramic Chip - C0G (NP0), X7R Dielectric . . . . . . . . . . . . . . . . . . . . . . . . .44-48
D Series, High Voltage Surface Mount Ceramic Disc - C0G (NP0), X7R, X5U Dielectric . . . . . . . . . . . . . . . . .. . . . . .49-50
2
© KEMET Electronics Corporation • PO Box 5928 • Greenville, SC 29606 • www.kemet.com
High Temperature, High Voltage
Performance Characteristics
GENERAL SPECIFICATIONS
Working Voltage:
C0G
50, 100, 200, 500, 1k, 2k, 3k, 4k, 5k, 7.5k, 10k,
15k, 20k
X7R
50, 100, 200, 500, 1k, 2k, 3k, 4k, 5k, 7.5k, 10k, 15k,
20k, 30k, 40k, 50k
X5U
3k, 4k, 5k, 7.5k, 10k, 15k, 20k
Temperature Characteristics:
C0G
0 + 30 PPM / °C from - 55°C to + 125°C (1)
X7R
+ 15% from - 55°C to + 125°C
X5U
+ 22%, -56% from -55°C to + 85°C
Capacitance Tolerance:
C0G
+0.5pF, +1%, +2%, +5%, +10%
X7R
±5%, ±10%, ±20%, +80% / -20%, +100% / -0%
X5U
±5%, ±10%, ±20%, +80% / -20%, +100% / -0%
Construction:
Epoxy encapsulated - meets flame test requirements
of UL Standard 94V-0.
High-temperature solder - meets EIA RS-198, Method 302,
Condition B (260°C for 10 seconds)
Termination Material:
Check individual Series: Part Number and Ordering Information
for Termination Materials offered in each series.
Solderability:
MIL-STD 202, Method 208
(Test Method: ANSI/J-STD-002)
Test A for through-hole mount and surface mount leaded.
Test B for surface mount leadless components.
Terminal Strength:
MIL-STD 202, Method 208, Condition A (2.3kg or 5 lbs)
Resistance to Solvents:
MIL-STD 202, Method 215
Resistance to Soldering Heat:
MIL-STD 202, Method 210, Test Condition C
ENVIRONMENTAL
Vibration:
MIL-STD 202, Method 204, Condition D (20g)
Shock:
MIL-STD 202, Method 213, Condition I (100g)
Life Test:
MIL-STD 202, Method 108
<200V
C0G - 200% rated voltage @ +125°C
X7R - 200% rated voltage @ +125°C
>500V
C0G - rated voltage @ +125°C
X7R - rated voltage @ +125°C
X5U - rated voltage @ +85°C
Post Test Limits @ 25°C are:
Capacitance Change:
C0G (< 200V) - +3% or 0.25pF, whichever is greater.
C0G (> 500V) - +3% or 0.50pF, whichever is greater.
X7R - + 20% of initial value (2)
Dissipation Factor:
C0G - 0.25% maximum
X7R & X5U - 3.0% maximum
Insulation Resistance:
C0G & X7R:
100 gigohm or 1 gigohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
X5U:
10 gigohm or 100 megohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
Moisture Resistance:
MIL-STD 202, Method 106
Post Test Limits @ 25°C are:
Capacitance Change:
C0G (< 200V) - +3% or 0.25pF, whichever is greater.
C0G (> 500V) - +3% or 0.50pF, whichever is greater.
X7R - + 20% of initial value (2)
Dissipation Factor:
C0G - 0.25% maximum
X7R & X5U - 3.0% maximum
Insulation Resistance:
C0G & X7R:
100 gigohm or 1 gigohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
X5U:
10 gigohm or 100 megohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
Thermal Shock:
MIL-STD 202, Method 107, Condition A
C0G & X7R: -55°C to 125°C
X5U: -55°C to 85°C
(1)
(2)
+53 PPM -30 PPM/ °C from +25°C to -55°C, + 60 PPM
below 10pF.
X7R & X5U dielectrics exhibit aging characteristics;
therefore, it is highly recommended that capacitors be
deaged for 2 hours at 150°C and stabilized at room tem-
perature for 48 hours before capacitance measurements
are made.
ELECTRICAL
Capacitance @ 25°C:
Within specified tolerance and following test conditions per MIL-
STD 202, Method 305.
C0G, X7R & X5U
> 100pF with 1.0 vrms @ 1 kHz with 1.0 vrms
< 100pF with 1.0 vrms @ 1 MHz with 1.0 vrms
Dissipation Factor @ 25°C:
Same test conditions as capacitance.
C0G - 0.15% maximum
X7R - 2.5% maximum
X5U - 2.5% maximum
Insulation Resistance @25°C:
MIL-STD 202, Method 302
C0G & X7R:
100 gigohm or 1 gigohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
X5U:
10 gigohm or 100 megohm x uF, whichever is less.
<500V test @ rated voltage, >1kV test @ 500V.
Dielectric Withstanding Voltage:
MIL-STD 202, Method 301
<200V test @ 250% of rated voltage
500V to 1250V test @ 150% of rated voltage
>1251V test @ 120% of rated voltage
© KEMET Electronics Corporation • PO Box 5928 • Greenville, SC 29606 • www.kemet.com
3
Microchip MCU
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
