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NST489AMT1-D

产品描述High Current Surface Mount NPN Silicon Low VCE(sat) Switching Transistor for Load Management in Portable Applications
文件大小132KB,共4页
制造商ON Semiconductor(安森美)
官网地址http://www.onsemi.cn
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NST489AMT1-D概述

High Current Surface Mount NPN Silicon Low VCE(sat) Switching Transistor for Load Management in Portable Applications

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NST489AMT1,
NSVT489AMT1G
High Current Surface Mount
NPN Silicon Low V
CE(sat)
Switching Transistor for
Load Management in
Portable Applications
Features
http://onsemi.com
30 VOLTS, 3.0 AMPS
NPN TRANSISTOR
AEC−Q101 Qualified and PPAP Capable
NSV Prefix for Automotive and Other Applications Requiring
Unique Site and Control Change Requirements
Pb−Free Packages are Available*
MAXIMUM RATINGS
(T
A
= 25C)
Rating
Collector-Emitter Voltage
Collector-Base Voltage
Emitter-Base Voltage
Collector Current
Continuous
Collector Current
Peak
Symbol
V
CEO
V
CBO
V
EBO
I
C
I
CM
Max
30
50
5.0
2.0
3.0
Unit
V
V
V
A
A
TSOP−6
CASE 318G
STYLE 6
COLLECTOR
1, 2, 5, 6
3
BASE
4
EMITTER
THERMAL CHARACTERISTICS
Characteristic
Total Device Dissipation
T
A
= 25C
Derate above 25C
Thermal Resistance,
Junction−to−Ambient
Total Device Dissipation
T
A
= 25C
Derate above 25C
Thermal Resistance,
Junction−to−Ambient
Thermal Resistance,
Junction−to−Lead #1
Total Device Dissipation
(Single Pulse < 10 s)
Junction and Storage
Temperature Range
Symbol
P
D
(Note 1)
Max
535
4.3
234
1.180
9.4
106
110
50
1.75
−55
to +150
Unit
mW
mW/C
C/W
N2
M
G
DEVICE MARKING
N2 M
G
G
R
qJA
(Note 1)
P
D
(Note 2)
W
mW/C
C/W
C/W
C/W
W
C
= Specific Device Code
= Date Code*
= Pb−Free Package
(Note: Microdot may be in either location)
*Date Code orientation may vary depending upon
manufacturing location.
R
qJA
(Note 2)
R
qJL
(Note 1)
R
qJL
(Note 2)
P
Dsingle
(Notes 2 and 3)
T
J
, T
stg
ORDERING INFORMATION
Device
NST489AMT1
NST489AMT1G
NSVT489AMT1G
Package
TSSOP−6
TSSOP−6
(Pb−Free)
TSSOP−6
(Pb−Free)
Shipping
3,000 /
Tape & Reel
3,000 /
Tape & Reel
3,000 /
Tape & Reel
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. FR−4 with 1 oz and 3.9 mm
2
of copper area.
2. FR−4 with 1 oz and 645 mm
2
of copper area.
3. Refer to Figure 8.
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
Semiconductor Components Industries, LLC, 2011
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
November, 2011
Rev. 8
1
Publication Order Number:
NST489AMT1/D

 
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