SCOPE:
VOLTAGE-OUTPUT, 12-BIT MULTIPLYING DACs
Generic Number
MAX502A(x)/883B
MAX502B(x)/883B
Device Type
01
02
12-Bit, 4 Quadrant, Voltage-Output
Multiplying Digital to Analog Converter
Case Outline(s).
The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter
MAXIM SMD
RG
L
Mil-Std-1835
GDIP1-T24 or CDIP2-T24
Case Outline
24 LEAD CERDIP
Package Code
J24
Absolute Maximum Ratings
V
DD
to DGND ..........................................................................................…………... -0.3V, +17V
V
SS
to DGND.............................................................................................………….. +0.3V, -17V
V
DD
to AGND ............................................................................................…………. -0.3V, +17V
V
OUT
to AGND 1/ ..........................................................................………....V
DD
+0.3V, V
SS
-0.3V
AGND to DGND .....................................................................................………….. -0.3V to V
DD
Digital Input Voltage to DGND ................................................................……….... -0.3V to V
DD
V
REF
to AGND .....................................................................................................…………..
±25V
RFBF to AGND ....................................................................................................………….
±25V
RA to AGND .......................................................................................................…………..
±25V
RB to AGND ........................................................................................................………….
±25V
RC to AGND ........................................................................................................………….
±25V
Lead Temperature (soldering, 10 seconds) ........................................................................…. +300°C
Storage Temperature ..........................................................................................….. -65°C to +150°C
Continuous Power Dissipation ..........................................................................……….... T
A
=+70°C
24 pin CERDIP(derate 12.5mW/°C above +70°C) ................................................……….. 1000mW
Junction Temperature T
J
.....................................................................................…………. +150°C
Thermal Resistance, Junction to Case,
ΘJC
24 pin CERDIP................................................................................................…………. 40°C/W
Thermal Resistance, Junction to Ambient,
ΘJA:
24 pin CERDIP................................................................................................…………. 80°C/W
Recommended Operating Conditions
Ambient Operating Range (T
A
) ...........................................................…………. -55°C to
+125°C
Positive Supply Voltage, (V
DD
) .........................................................………..... +11.4V to +15.75V
Negative Supply Voltage (V
SS
)...........................................................………….. -11.4V to -15.75V
NOTE 1: V
OUT
may be shorted to AGND, V
DD
, or V
SS
if the power dissipation of this package is not exceeded.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
----------------------------
Electrical Characteristics of MAX502/883B
for /883B and SMD 5962-88767
19-0278
Page 2 of
Rev. E
6
TABLE 1. ELECTRICAL TESTS:
CONDITIONS
-55
°C
<=T
A
<= +125°C
2/, 3/, 5/
Unless otherwise specified
Group A
Subgroup
TEST
Resolution
Relative Accuracy
Symbol
RES
INL
Device
type
All
01
02
01
02
All
All
Limits
Min
12
Limits
Max
Units
1,2,3
1
Bits
±0.5
±0.75
LSB
±0.75
±1.0
±1.0
±2.0
±3.0
±3.0
±4.5
±6.0
16
0.5
±1.0
±10
2,3
Differential Nonlinearity
Zero Code Offset Error
Gain Error
DNL
VOE
AE
RFB, V
OUT
connected
RC or RB connected to V
OUT
,
V
REF
=2.5V
RA, V
OUT
connected, V
REF
=2.5V
1,2,3
1
2,3
LSB
mV
1,2,3
All
LSB
Reference Input
Resistance
Application resistor ratio
matching
Input Current
Input High Level Voltage
Input Low Level Voltage
Supply Current
R
IN
R
MATCH
I
IN
V
IH
V
IL
I
DD
V
OUT
unloaded
I
SS
V
REF
=-10V, -8.9V, V
DD
=+15V
±5%,
+12V
±5%
RA to RB to RC match
V
IN
=0V and V
DD
1,2,3
1,2,3
1
2,3
1,2,3
1,2,3
1,2,3
All
All
All
All
All
All
8
kΩ
%
µA
V
V
mA
2.4
0.8
10
4
Power Supply Rejection
PSR
V
REF
=+10V, +8.9V, V
SS
=-15V
±5%,
-12V
±5%
V
OUT
=
±10V,
R
L
=2kΩ, RFB not
connected
NOTE 4
See Figure 2, Verify truth table
To
±0.01%
of full scale, NOTE 4
See Figure 1b
See Figure 1b
1,2,3
All
±0.02
%/%
Open Loop Gain
Functional test
Output-Voltage settling
time
Chip select to write-setup
time
Write Pulse Width
AVO
FT
t
S
t
CS
t
WR
4,5,6
7,8
9
10,11
9,10,11
All
90
dB
All
All
5
0
µs
ns
ns
ns
ns
All
9
40
10,11
60
All
Data-setup time
t
DS
See Figure 1b
9,10,11
60
All
Data-hold time
t
DH
See Figure 1b
9,10,11
10
NOTE 2: Dual supply: V
DD
=+11.4V to +15.75V, V
SS
=-11.4V to -15.75V, V
REF
=+10V, AGND=DGND=0V,
R
L
=2kΩ, C
L
=100pF.
NOTE 3: V
OUT
must be less than V
DD
-2.5V and greater than V
SS
+2.5V to ensure correct operation.
NOTE 4: Parameter is guaranteed to the limit specified but is not tested.
NOTE 5: Unused feedback resistors should be shorted to analog ground.
Figure 1b: See Commercial Datasheet.
----------------------------
Electrical Characteristics of MAX502/883B
for /883B and SMD 5962-88767
19-0278
Page 3 of
Rev. E
7
01
02
FIGURE 1:
Package
24 pin CERDIP
24 pin CERDIP
ORDERING INFORMATION:
MAX502AMRG/883B
MAX502BMRG/883B
SMD Number
5962-8876701LA
5962-8876702LA
TERMINAL CONNECTIONS
24 PIN
CERDIP
1
V
OUT
13
D1
2
D11
14
D0
3
D10
15
___
WR
4
D9
16
__
CS
5
D8
17
V
REF
6
D7
18
AGND
7
D6
19
V
SS
8
D5
20
V
DD
9
D4
21
RA
10
D3
22
RB
11
D2
23
RC
12
DGND
24
RFB
TRUTH TABLE
___
WR
H
X
L
L
R
___
CS
X
H
L
R
L
H=High state L=Low state
R=Rising edge X=don’t care
OPERATION
No Operation
No Operation
Input register is transparent
Input register is latched
Input register is latched
FIGURE 2:
----------------------------
Electrical Characteristics of MAX502/883B
for /883B and SMD 5962-88767
19-0278
Page 4 of
Rev. E
6
QUALITY ASSURANCE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2.
ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements
Subgroups
per Method 5005, Table 1
1
1*, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11
1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11
1
Interim Electric Parameters
Method 5004
Final Electrical Parameters
Method 5005
Group A Test Requirements
Method 5005
Group C and D End-Point Electrical Parameters
Method 5005
*
PDA applies to Subgroup 1 only.
----------------------------
Electrical Characteristics of MAX502/883B
for /883B and SMD 5962-88767
19-0278
Page 5 of
Rev. E
6
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