CAT25128
EEPROM Serial 128-Kb SPI
Description
The CAT25128 is a 128−Kb Serial CMOS EEPROM device
internally organized as 16Kx8 bits. This features a 64−byte page write
buffer and supports the Serial Peripheral Interface (SPI) protocol. The
device is enabled through a Chip Select (CS) input. In addition, the
required bus signals are clock input (SCK), data input (SI) and data
output (SO) lines. The HOLD input may be used to pause any serial
communication with the CAT25128 device. The device features
software and hardware write protection, including partial as well as
full array protection.
On−Chip ECC (Error Correction Code) makes the device suitable
for high reliability applications.*
Features
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SOIC−8
V SUFFIX
CASE 751BD
UDFN−8
HU4 SUFFIX
CASE 517AZ
•
•
•
•
•
•
•
•
•
•
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•
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20 MHz SPI Compatible
1.8 V to 5.5 V Supply Voltage Range
SPI Modes (0,0) & (1,1)
64−byte Page Write Buffer
Additional Identification Page with Permanent Write Protection
Self−timed Write Cycle
Hardware and Software Protection
Block Write Protection
−
Protect 1/4, 1/2 or Entire EEPROM Array
Low Power CMOS Technology
1,000,000 Program/Erase Cycles
100 Year Data Retention
Industrial and Extended Temperature Range
8−lead SOIC, TSSOP and 8−pad, UDFN Packages
This Device is Pb−Free, Halogen Free/BFR Free, and RoHS
Compliant
V
CC
TSSOP−8
Y SUFFIX
CASE 948AL
SOIC−8 WIDE
X SUFFIX
CASE 751BE
PIN CONFIGURATION
CS
SO
WP
V
SS
1
V
CC
HOLD
SCK
SI
SOIC (X, V), TSSOP (Y), UDFN (HU4)
PIN FUNCTION
Pin Name
†
CS
SO
Function
Chip Select
Serial Data Output
Write Protect
Ground
Serial Data Input
Serial Clock
Hold Transmission Input
Power Supply
SI
CS
WP
HOLD
SCK
V
SS
CAT25128
SO
WP
V
SS
SI
SCK
HOLD
V
CC
Figure 1. Functional Symbol
†The exposed pad for the TDFN/UDFN packages can
be left floating or connected to Ground.
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 13 of this data sheet.
©
Semiconductor Components Industries, LLC, 2014
June, 2018
−
Rev. 9
1
Publication Order Number:
CAT25128/D
CAT25128
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameters
Operating Temperature
Storage Temperature
Voltage on any Pin with Respect to Ground (Note 1)
Ratings
−45
to +130
−65
to +150
−0.5
to +6.5
Units
°C
°C
V
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. The DC input voltage on any pin should not be lower than
−0.5
V or higher than V
CC
+ 0.5 V. During transitions, the voltage on any pin may
undershoot to no less than
−1.5
V or overshoot to no more than V
CC
+ 1.5 V, for periods of less than 20 ns.
Table 2. RELIABILITY CHARACTERISTICS
(Note 2)
Symbol
N
END
(Notes 3, 4)
T
DR
Endurance
Data Retention
Parameter
Min
1,000,000
100
Units
Program / Erase Cycles
Years
2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
and JEDEC test methods.
3. Page Mode, V
CC
= 5 V, 25°C.
4. The new product revision (E) uses ECC (Error Correction Code) logic with 6 ECC bits to correct one bit error in 4 data bytes. Therefore, when
a single byte has to be written, 4 bytes (including the ECC bits) are re−programmed. It is recommended to write by multiple of 4 bytes in order
to benefit from the maximum number of write cycles.
Table 3. D.C. OPERATING CHARACTERISTICS
−
MATURE PRODUCT
Symbol
I
CCR
I
CCW
I
SB1
Parameter
Supply Current
(Read Mode)
Supply Current
(Write Mode)
Standby Current
Read, V
CC
= 5.5 V,
SO open
Write, V
CC
= 5.5 V,
SO open
V
IN
= GND or V
CC
, CS = V
CC
,
WP = V
CC
, HOLD = V
CC
,
V
CC
= 5.5 V
V
IN
= GND or V
CC
, CS = V
CC
,
WP = GND, HOLD = GND,
V
CC
= 5.5 V
V
IN
= GND or V
CC
CS = V
CC
,
V
OUT
= GND or V
CC
Test Conditions
(
V
CC
= 1.8 V to 5.5 V, T
A
=
−40°C
to +85°C and V
CC
= 2.5 V to 5.5 V, T
A
=
−40°C
to +125°C, unless otherwise specified.)
Min
Max
2
2
4
4
1
3
4
5
−2
T
A
=
−40°C
to +85°C
T
A
=
−40°C
to +125°C
−1
−1
−0.5
0.7 V
CC
V
CC
> 2.5 V, I
OL
= 3.0 mA
V
CC
> 2.5 V, I
OH
=
−1.6
mA
V
CC
> 1.8 V, I
OL
= 150
mA
V
CC
> 1.8 V, I
OH
=
−100
mA
V
CC
−
0.2 V
V
CC
−
0.8 V
0.2
2
1
2
0.3 V
CC
V
CC
+ 0.5
0.4
Units
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
V
V
V
V
V
V
10 MHz /
−40°C
to 85°C
5 MHz /
−40°C
to 125°C
10 MHz /
−40°C
to 85°C
5 MHz /
−40°C
to 125°C
T
A
=
−40°C
to +85°C
T
A
=
−40°C
to +125°C
T
A
=
−40°C
to +85°C
T
A
=
−40°C
to +125°C
I
SB2
Standby Current
I
L
I
LO
V
IL
V
IH
V
OL1
V
OH1
V
OL2
V
OH2
Input Leakage Current
Output Leakage
Current
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
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CAT25128
Table 4. D.C. OPERATING CHARACTERISTICS
−
NEW PRODUCT (Rev E)
Symbol
I
CCR
Parameter
Supply Current
(Read Mode)
Read, SO open /
−40°C
to +85°C
Test Conditions
V
CC
= 1.8 V, f
SCK
= 5 MHz
V
CC
= 2.5 V, f
SCK
=10 MHz
V
CC
= 5.5 V, f
SCK
= 20 MHz
Read, SO open /
−40°C
to +125°C
I
CCW
Supply Current
(Write Mode)
Write, CS = V
CC
/
−40°C
to +85°C
2.5 V< V
CC
< 5.5 V,
f
SCK
= 10 MHz
V
CC
= 1.8 V
V
CC
= 2.5 V
V
CC
= 5.5 V
Write, CS = V
CC
/
−40°C
to +125°C
I
SB1
Standby Current
V
IN
= GND or V
CC
,
CS = V
CC
, WP = V
CC
,
V
CC
= 5.5 V
V
IN
= GND or V
CC
,
CS = V
CC
, WP = GND,
V
CC
= 5.5 V
V
IN
= GND or V
CC
CS = V
CC
V
OUT
= GND or V
CC
V
CC
≥
2.5 V
V
CC
≥
2.5 V
V
CC
< 2.5 V
V
CC
< 2.5 V
V
CC
≥
2.5 V, I
OL
= 3.0 mA
V
CC
≥
2.5 V, I
OH
=
−1.6
mA
V
CC
< 2.5 V, I
OL
= 150
mA
V
CC
< 2.5 V, I
OH
=
−100
mA
V
CC
−
0.2 V
V
CC
−
0.8 V
0.2
T
A
=
−40°C
to +85°C
T
A
=
−40°C
to +125°C
2.5 V< V
CC
< 5.5 V
T
A
=
−40°C
to +85°C
T
A
=
−40°C
to +125°C
T
A
=
−40°C
to +85°C
T
A
=
−40°C
to +125°C
−2
−1
−1
−0.5
0.7 V
CC
−0.5
0.75 V
CC
(
V
CC
= 1.8 V to 5.5 V, T
A
=
−40°C
to +85°C and V
CC
= 2.5 V to 5.5 V, T
A
=
−40°C
to +125°C, unless otherwise specified.)
Min
Max
0.8
1.2
3.0
2.0
1.5
2
2
2
1
3
3
5
2
1
2
0.3 V
CC
V
CC
+ 0.5
0.25 V
CC
V
CC
+ 0.5
0.4
V
V
V
V
V
V
V
V
mA
mA
mA
mA
mA
Units
mA
I
SB2
Standby Current
I
L
I
LO
V
IL1
V
IH1
V
IL2
V
IH2
V
OL1
V
OH1
V
OL2
V
OH2
Input Leakage Current
Output Leakage
Current
Input Low Voltage
Input High Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
Table 5. PIN CAPACITANCE
(Note 5) (T
A
= 25°C, f = 1.0 MHz, V
CC
= +5.0 V)
Symbol
C
OUT
C
IN
Output Capacitance (SO)
Input Capacitance (CS, SCK, SI, WP, HOLD)
Test
Conditions
V
OUT
= 0 V
V
IN
= 0 V
Min
Typ
Max
8
8
Units
pF
pF
5. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
and JEDEC test methods.
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CAT25128
Table 6. A.C. CHARACTERISTICS
−
MATURE PRODUCT
(T
A
=
−40°C
to +85°C (Industrial) and T
A
=
−40°C
to +125°C (Extended).) (Notes 6, 9)
V
CC
= 1.8 V
−
5.5 V /
−405C
to +855C
V
CC
= 2.5 V
−
5.5 V /
−405C
to +1255C
Symbol
f
SCK
t
SU
t
H
t
WH
t
WL
t
LZ
t
RI
(Note 7)
t
FI
(Note 7)
t
HD
t
CD
t
V
t
HO
t
DIS
t
HZ
t
CS
t
CSS
t
CSH
t
CNS
t
CNH
t
WPS
t
WPH
t
WC
(Note 8)
Parameter
Clock Frequency
Data Setup Time
Data Hold Time
SCK High Time
SCK Low Time
HOLD to Output Low Z
Input Rise Time
Input Fall Time
HOLD Setup Time
HOLD Hold Time
Output Valid from Clock Low
Output Hold Time
Output Disable Time
HOLD to Output High Z
CS High Time
CS Setup Time
CS Hold Time
CS Inactive Setup Time
CS Inactive Hold Time
WP Setup Time
WP Hold Time
Write Cycle Time
140
30
30
20
20
10
100
5
0
50
100
70
15
15
15
15
10
60
5
0
10
75
0
20
25
Min
DC
40
40
75
75
50
2
2
0
10
40
Max
5
V
CC
= 2.5 V
−
5.5 V
−405C
to +855C
Min
DC
20
20
40
40
25
2
2
Max
10
Units
MHz
ns
ns
ns
ns
ns
ms
ms
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
6. AC Test Conditions:
Input Pulse Voltages: 0.3 V
CC
to 0.7 V
CC
Input rise and fall times:
≤
10 ns
Input and output reference voltages: 0.5 V
CC
Output load: current source I
OL max
/I
OH max
; C
L
= 50 pF
7. This parameter is tested initially and after a design or process change that affects the parameter.
8. t
WC
is the time from the rising edge of CS after a valid write sequence to the end of the internal write cycle.
9.
All Chip Select (CS) timing parameters are defined relative to the positive clock edge (Figure 2). t
CSH
timing specification is valid
for die revision D and higher. The die revision D is identified by letter “D” or a dedicated marking code on top of the package. For
previous product revision (Rev.C) the t
CSH
is defined relative to the negative clock edge.
Table 7. POWER−UP TIMING
(Notes 7, 10)
Symbol
t
PUR
t
PUW
Power−up to Read Operation
Power−up to Write Operation
Parameter
Max
1
1
Units
ms
ms
10. t
PUR
and t
PUW
are the delays required from the time V
CC
is stable until the specified operation can be initiated.
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CAT25128
Table 8. A.C. CHARACTERISTICS – NEW PRODUCT (Rev E)
(V
CC
= 1.8 V to 5.5 V, T
A
=
−40°C
to +85°C (Industrial) and
V
CC
= 2.5 V to 5.5 V, T
A
=
−40°C
to +125°C, unless otherwise specified.) (Note 11)
V
CC
= 1.8 V
−
5.5 V
−405C
to +855C
Symbol
f
SCK
t
SU
t
H
t
WH
t
WL
t
LZ
t
RI
(Note 12)
t
FI
(Note 12)
t
HD
t
CD
t
V
t
HO
t
DIS
t
HZ
t
CS
t
CSS
t
CSH
t
CNS
t
CNH
t
WPS
t
WPH
t
WC
(Note 13)
Parameter
Clock Frequency
Data Setup Time
Data Hold Time
SCK High Time
SCK Low Time
HOLD to Output Low Z
Input Rise Time
Input Fall Time
HOLD Setup Time
HOLD Hold Time
Output Valid from Clock Low
Output Hold Time
Output Disable Time
HOLD to Output High Z
CS High Time
CS Setup Time
CS Hold Time
CS Inactive Setup Time
CS Inactive Hold Time
WP Setup Time
WP Hold Time
Write Cycle Time
80
30
30
20
20
10
10
5
0
50
100
40
30
30
20
20
10
10
5
0
10
75
0
20
25
20
15
20
15
15
10
10
5
Min
DC
20
20
75
75
50
2
2
0
10
40
0
20
25
Max
5
V
CC
= 2.5 V
−
5.5 V
−405C
to +1255C
Min
DC
10
10
40
40
25
2
2
0
5
20
Max
10
V
CC
= 4.5 V
−
5.5 V
−405C
to +855C
Min
DC
5
5
20
20
25
2
2
Max
20
Units
MHz
ns
ns
ns
ns
ns
ms
ms
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
11. AC Test Conditions:
Input Pulse Voltages: 0.3 V
CC
to 0.7 V
CC
Input rise and fall times:
≤
10 ns
Input and output reference voltages: 0.5 V
CC
Output load: current source I
OL max
/I
OH max
; C
L
= 30 pF
12. This parameter is tested initially and after a design or process change that affects the parameter.
13. t
WC
is the time from the rising edge of CS after a valid write sequence to the end of the internal write cycle.
Table 9. POWER−UP TIMING
(Notes 12, 14)
Symbol
t
PUR
t
PUW
Parameter
Power−up to Read Operation
Power−up to Write Operation
Min
0.1
0.1
Max
1
1
Units
ms
ms
14. t
PUR
and t
PUW
are the delays required from the time V
CC
is stable until the specified operation can be initiated.
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