Obsolete Device
27LV256
256K (32K x 8) Low-Voltage CMOS EPROM
FEATURES
• Wide voltage range 3.0V to 5.5V
• High speed performance
- 200 ns access time available at 3.0V
• CMOS Technology for low power consumption
- 8 mA Active current at 3.0V
- 20 mA Active current at 5.5V
- 100
µA
Standby current
• Factory programming available
• Auto-insertion-compatible plastic packages
• Auto ID aids automated programming
• Separate chip enable and output enable controls
• High speed “Express” programming algorithm
• Organized 32K x 8: JEDEC standard pinouts
- 28-pin Dual-in-line package
- 32-pin PLCC package
- 28-pin SOIC package
- Tape and reel
• Data Retention > 200 years
• Available for the following temperature ranges:
- Commercial:
0°C to +70°C
- Industrial:
-40°C to +85°C
PACKAGE TYPES
PDIP
V
PP
A12
A7
A6
A5
A4
A3
A2
A1
A0
O0
O1
O2
V
SS
•1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
V
CC
A14
A13
A8
A9
A11
OE
A10
CE
O7
O6
O5
O4
O3
27LV256
32
31
30
4
3
2
1
A7
A12
V
PP
NU
Vcc
A14
A13
PLCC
A6
A5
A4
A3
A2
A1
A0
NC
O0
5
6
7
8
9
10
11
12
13
29
28
27
26
25
24
23
22
21
A8
A9
A11
NC
OE
A10
CE
O7
O6
27LV256
14
15
16
17
18
19
SOIC
V
PP
A12
A7
A6
A5
A4
A3
A2
A1
A0
O0
O1
O2
V
SS
O1
O2
V
SS
NU
O3
O4
O5
1
2
3
4
5
6
7
8
9
10
11
12
13
14
DESCRIPTION
The Microchip Technology Inc. 27LV256 is a low volt-
age (3.0 volt) CMOS EPROM designed for battery
powered applications. The device is organized as a
32K x 8 (32K-Byte) non-volatile memory product. The
27LV256 consumes only 8 mA maximum of active cur-
rent during a 3.0 volt read operation therefore improv-
ing battery performance. This device is designed for
very low voltage applications where conventional 5.0
volt only EPROMS can not be used. Accessing individ-
ual bytes from an address transition or from power-up
(chip enable pin going low) is accomplished in less than
200 ns at 3.0V. This device allows systems designers
the ability to use low voltage non-volatile memory with
today’s' low voltage microprocessors and peripherals in
battery powered applications.
A complete family of packages is offered to provide the
most flexibility in applications. For surface mount appli-
cations, PLCC or SOIC packaging is available. Tape
and reel packaging is also available for PLCC or SOIC
packages.
28
27
26
25
24
23
22
21
20
19
18
17
16
15
20
V
CC
A14
A13
A8
A9
A11
OE
A10
CE
O7
O6
O5
O4
O3
27LV256
2004 Microchip Technology Inc.
DS11020H-page 1
27LV256
1.0
1.1
ELECTRICAL
CHARACTERISTICS
Maximum Ratings*
TABLE 1-1:
Name
A0-A14
CE
OE
V
PP
O0 - O7
V
CC
V
SS
NC
NU
PIN FUNCTION TABLE
Function
Address Inputs
Chip Enable
Output Enable
Programming Voltage
Data Output
+5V or +3V Power Supply
Ground
No Connection; No Internal
Connection
Not Used; No External Connection Is
Allowed
V
CC
and input voltages w.r.t. V
SS
........ -0.6V to +7.25V
V
PP
voltage w.r.t. V
SS
during
programming ......................................... -0.6V to +14V
Voltage on A9 w.r.t. V
SS
...................... -0.6V to +13.5V
Output voltage w.r.t. V
SS
................-0.6V to V
CC
+1.0V
Storage temperature ..........................-65°C to +150°C
Ambient temp. with power applied .....-65°C to +125°C
*Notice: Stresses above those listed under “Maximum Ratings”
may cause permanent damage to the device. This is a stress rat-
ing only and functional operation of the device at those or any
other conditions above those indicated in the operation listings of
this specification is not implied. Exposure to maximum rating con-
ditions for extended periods may affect device reliability.
TABLE 1-2:
READ OPERATION DC CHARACTERISTICS
V
CC
= +5V
±10%
or 3.0V where indicated
Commercial:
Tamb = 0°C to +70°C
Industrial:
Tamb = -40°C to +85°C
Parameter
Input Voltages
Input Leakage
Output Voltages
Output Leakage
Input Capacitance
Output Capacitance
Power Supply Current,
Active
Part*
all
all
all
all
all
all
C
I
Status
Logic "1"
Logic "0"
Logic "1"
Logic "0"
—
—
—
TTL input
TTL input
Symbol
V
IH
V
IL
I
LI
V
OH
V
OL
I
LO
C
IN
C
OUT
I
CC1
I
CC2
Min.
2.0
-0.5
-10
2.4
Max.
V
CC
+1
0.8
10
0.45
Units
V
V
µA
V
V
µA
pF
pF
mA
mA
mA
mA
Conditions
V
IN
= 0 to V
CC
I
OH
= -400
µA
I
OL
= 2.1 mA
V
OUT
= 0V to V
CC
V
IN
= 0V; Tamb = 25°C;
f = 1 MHz
V
OUT
= 0V; Tamb = 25°C;
f = 1 MHz
V
CC
= 5.5V; V
PP
= V
CC
f = 1 MHz;
OE = CE = V
IL
;
I
OUT
= 0 mA;
V
IL
= -0.1 to 0.8V;
V
IH
= 2.0 to V
CC
;
Note 1
-10
—
—
—
—
10
6
12
20 @ 5.0V
8 @ 3.0V
25 @ 5.0V
10 @ 3.0V
Power Supply Current,
Standby
C
I
all
TTL input
TTL input
CMOS input
I
CC
(
S
)
—
1 @ 3.0V
2 @ 3.0V
100 @ 3.0V
mA
mA
µA
CE=V
CC
±
0.2V
* Parts: C=Commercial Temperature Range
I =Industrial Temperature Ranges
Note 1: Typical active current increases .75 mA per MHz up to operating frequency for all temperature ranges.
DS11020H-page 2
2004 Microchip Technology Inc.
27LV256
TABLE 1-3:
READ OPERATION AC CHARACTERISTICS
AC Testing Waveform:
Output Load:
Input Rise and Fall Times:
Ambient Temperature:
27HC256-20
Parameter
Address to Output Delay
CE to Output Delay
OE to Output Delay
CE or OE to O/P High
Impedance
Output Hold from
Address CE or OE,
whichever goes first
Sym
Min
t
ACC
t
CE
t
OE
t
OFF
t
OH
—
—
—
0
0
Max
200
200
100
50
—
Min
—
—
—
0
0
Max
250
250
125
50
—
Min
—
—
—
0
0
Max
300
300
125
50
—
ns
ns
ns
ns
ns
CE = OE = V
IL
OE = V
IL
CE = V
IL
V
IH
= 2.4V and V
IL
= 0.45V; V
OH
= 2.0V V
OL
= 0.8V
1 TTL Load + 100 pF
10 ns
Commercial:
Tamb = 0°C to +70°C
Industrial:
Tamb = -40°C to +85°C
27HC256-30
Units
Conditions
27HC256-25
FIGURE 1-1:
V
IH
Address
V
IL
V
IH
CE
V
IL
READ WAVEFORMS
Address valid
t
CE(2)
V
IH
OE
V
IL
V
OH
V
OL
t
ACC
t
OE(2)
High Z
t
OFF(1,3)
t
OH
Valid Output
High Z
Outputs
O0 - O7
Notes: (1) t
OFF
is specified for OE or CE, whichever occurs first
(2) OE may be delayed up to t
CE
- t
OE
after the falling edge of CE without impact on t
(3) This parameter is sampled and is not 100% tested.
CE
2004 Microchip Technology Inc.
DS11020H-page 3
27LV256
TABLE 1-4:
PROGRAMMING DC CHARACTERISTICS
Ambient Temperature: Tamb = 25°C
±
5°C
V
CC
= 6.5V
±
0.25V, V
PP
= 13.0V
±
0.25V
Parameter
Input Voltages
Input Leakage
Output Voltages
V
CC
Current, program & verify
V
PP
Current, program
A9 Product Identification
Status
Logic”1”
Logic”0”
—
Logic”1”
Logic”0”
—
—
—
Symbol
V
IH
V
IL
I
LI
V
OH
V
OL
I
CC2
I
PP2
V
H
Min
2.0
-0.1
-10
2.4
0.45
—
—
11.5
20
25
12.5
Max.
V
CC
+1
0.8
10
Units
V
V
µA
V
V
mA
mA
V
V
IN
= 0V to V
CC
I
OH
= -400
µA
I
OL
= 2.1 mA
Note 1
Note 1
Conditions
Note 1: V
CC
must be applied simultaneously or before V
PP
and removed simultaneously or after V
PP
.
TABLE 1-5:
PROGRAMMING AC CHARACTERISTICS
AC Testing Waveform: V
IH
=2.4V and V
IL
=0.45V; V
OH
=2.0V; V
OL
=0.8V
Output Load:
1 TLL Load + 100pF
Ambient Temperature: Tamb=25°C±5°C
V
CC
= 6.5V
±
0.25V, V
PP
=13.0V
±
0.25V
Symbol
t
AS
t
DS
t
DH
t
AH
t
DF
t
VCS
t
PW
t
CES
t
OES
t
VPS
t
OE
Min.
2
2
2
0
0
2
95
2
2
2
—
Max.
—
—
—
—
130
—
105
—
—
—
100
Units
µs
µs
µs
µs
ns
µs
µs
µs
µs
µs
ns
100
µs
typical
Remarks
for Program, Program Verify
and Program Inhibit Modes
Parameter
Address Set-Up Time
Data Set-Up Time
Data Hold Time
Address Hold Time
Float Delay (2)
V
CC
Set-Up Time
Program Pulse Width (1)
CE Set-Up Time
OE Set-Up Time
V
PP
Set-Up Time
Data Valid from OE
Note 1: For express algorithm, initial programming width tolerance is 100
µs ±5%.
2: This parameter is only sampled and not 100% tested. Output float is defined as the point where data is no
longer driven (see timing diagram).
DS11020H-page 4
2004 Microchip Technology Inc.
27LV256
FIGURE 1-2:
PROGRAMMING WAVEFORMS
Program
V
IH
Address
V
IL
t
AS
V
IH
Data
V
IL
t
DS
13.0V(2)
V
PP
5.0V
6.5V(2)
V
CC
5.0V
V
IH
CE
V
IL
V
IH
OE
V
IL
Notes:
(1) t
DF
and t
OE
are characteristics of the device but must be accommodated by the programmer
(2) V
CC
= 6.5V ±0.25V, V
PP
= V
H
= 13.0V ±0.25V for express algorithm
t
PW
t
OPW
t
OES
t
OE
(1)
t
VCS
t
VPS
Data Stable
t
DH
High Z
Data Out Valid
t
DF
(1)
t
AH
Address Stable
Verify
TABLE 1-6:
MODES
CE
V
IL
V
IL
V
IH
V
IH
V
IH
V
IL
V
IL
OE
V
IL
V
IH
V
IL
V
IH
X
V
IH
V
IL
V
PP
V
CC
V
H
V
H
V
H
V
CC
V
CC
V
CC
A9
X
X
X
X
X
X
V
H
O0 - O7
D
OUT
D
IN
D
OUT
High Z
High Z
High Z
Identity Code
Operation Mode
Read
Program
Program Verify
Program Inhibit
Standby
Output Disable
Identity
X = Don’t Care
1.2
Read Mode
(See Timing Diagrams and AC Characteristics)
Read Mode is accessed when:
a)
b)
the CE pin is low to power up (enable) the chip
the OE pin is low to gate the data to the output
pins
For Read operations, if the addresses are stable, the
address access time (t
ACC
) is equal to the delay from
CE to output (t
CE
). Data is transferred to the output
after a delay from the falling edge of OE (t
OE
).
2004 Microchip Technology Inc.
DS11020H-page 5