74F37 Quad Two-Input NAND Buffer
April 1988
Revised March 1999
74F37
Quad Two-Input NAND Buffer
General Description
This device contains four independent gates, each of which
performs the logic NAND function.
Ordering Code:
Order Number
74F37SC
74F37SJ
74F37PC
Package Number
M14A
M14D
N14A
Package Description
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Logic Symbol
IEEE/IEC
Connection Diagram
Unit Loading/Fan Out
U.L.
Pin Names Description
HIGH/LOW
A
n
, B
n
O
n
Inputs
Outputs
1.0/2.0
Input I
IH
/I
IL
Output I
OH
/I
OL
20
µA/−1.2
mA
Function Table
Inputs
A
L
L
H
H
H
=
HIGH Voltage Level
L
=
LOW Voltage Level
Output
B
L
H
L
H
O
H
H
H
L
600/106.6 (80)
−12
mA/64 mA
(48 mA)
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74F37
Absolute Maximum Ratings
(Note 1)
Storage Temperature
Ambient Temperature under Bias
Junction Temperature under Bias
V
CC
Pin Potential to Ground Pin
Input Voltage (Note 2)
Input Current (Note 2)
Voltage Applied to Output
in HIGH State (with V
CC
=
0V)
Standard Output
3-STATE Output
Current Applied to Output
in LOW State (Max)
twice the rated I
OL
(mA)
−0.5V
to V
CC
−0.5V
to
+5.5V
−65°C
to
+150°C
−55°C
to
+125°C
−55°C
to
+150°C
−0.5V
to
+7.0V
−0.5V
to
+7.0V
−30
mA to
+5.0
mA
Recommended Operating
Conditions
Free Air Ambient Temperature
Supply Voltage
0°C to
+70°C
+4.5V
to
+5.5V
Note 1:
Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2:
Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Symbol
V
IH
V
IL
V
CD
V
OH
Parameter
Input HIGH Voltage
Input LOW Voltage
Input Clamp Diode Voltage
Output HIGH
Voltage
V
OL
I
IH
I
BVI
I
CEX
V
ID
I
OD
I
IL
I
OS
I
CCH
I
CCL
Output LOW
Voltage
Input HIGH
Current
Input HIGH Current
Breakdown Test
Output HIGH
Leakage Current
Input Leakage
Test
Output Leakage
Circuit Current
Input LOW Current
Output Short-Circuit Current
Power Supply Current
Power Supply Current
−100
3.7
28.0
−1.2
−225
6.0
33.0
mA
mA
mA
mA
Max
Max
Max
Max
3.75
µA
0.0
4.75
V
0.0
I
ID
=
1.9
µA
All Other Pins Grounded
V
IOD
=
150 mV
All Other Pins Grounded
V
IN
=
0.5V
V
OUT
=
0V
V
O
=
HIGH
V
O
=
LOW
50
µA
Max
V
OUT
=
V
CC
7.0
µA
Max
V
IN
=
7.0V
5.0
µA
Max
V
IN
=
2.7V
10% V
CC
10% V
CC
5% V
CC
10% V
CC
2.4
2.0
2.7
0.55
V
Min
V
Min
Min
2.0
0.8
−1.2
Typ
Max
Units
V
V
V
Min
V
CC
Conditions
Recognized as a HIGH Signal
Recognized as a LOW Signal
I
IN
= −18
mA
I
OH
= −3
mA
I
OH
= −15
mA
I
OH
= −3
mA
I
OL
=
64 mA
AC Electrical Characteristics
T
A
= +25°C
Symbol
Parameter
Min
t
PLH
t
PHL
Propagation Delay
A
n
, B
n
to O
n
2.0
1.5
V
CC
= +5.0V
C
L
=
50 pF
Typ
3.2
2.4
Max
5.5
4.5
Min
1.5
1.0
Max
6.5
5.0
ns
T
A
=
0°C to
+70°C
C
L
=
50 pF
Units
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2
74F37
Physical Dimensions
inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow
Package Number M14A
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M14D
3
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74F37 Quad Two-Input NAND Buffer
Physical Dimensions
inches (millimeters) unless otherwise noted (Continued)
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N14A
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