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1N746 THRU 1N759
ZENER DIODES
FEATURES
DO-35
♦
Silicon Planar Power Zener Diodes
♦
Standard Zener voltage tolerance is ±5% for
“A” suffix. Other tolerances are available upon
request.
min. 1.083 (27.5)
max. .150 (3.8)
max.
∅
.079 (2.0)
Cathode
Mark
min. 1.083 (27.5)
max.
∅
.020 (0.52)
MECHANICAL DATA
Case:
DO-35 Glass Case
Weight:
approx. 0.13 g
Dimensions are in inches and (millimeters)
MAXIMUM RATINGS
Ratings at 25°C ambient temperature unless otherwise specified.
SYMBOL
VALUE
UNIT
Zener Current (see Table “Characteristics”)
Power Dissipation at T
L
= 75°C
Maximum Junction Temperature
Storage Temperature Range
NOTES:
P
tot
T
j
T
S
500
(1)
175
– 65 to +175
mW
°C
°C
(1) T
L
is measured 3/8” from body.
SYMBOL
MIN.
TYP.
MAX.
UNIT
Thermal Resistance
Junction to Ambient Air
Forward Voltage
at I
F
= 200 mA
NOTES:
R
thJA
–
–
300
(1)
°C/W
V
F
–
–
1.5
Volts
(1) Valid provided that leads at a distance of 3/8” from case are kept at ambient temperature.
1/6/98
1N746 THRU 1N759
ELECTRICAL CHARACTERISTICS
Ratings at 25°C ambient temperature unless otherwise specified.
Type
Number
Nominal
Zener Voltage
V
Z
@ I
ZT
(3)
(Volts)
Test
Current
I
ZT
(mA)
Maximum Zener Impedance
Z
ZT
@ I
ZT
(1)
(Ω)
Maximum
Regulator Current
I
ZM
(2)
(mA)
Maximum Reverse Leakage Current
T
A
= 25°C
I
R
@ V
R
= 1V
(µA)
T
A
= 150°C
I
R
@ V
R
= 1V
(µA)
1N746A
1N747A
1N748A
1N749A
1N750A
1N751A
1N752A
1N753A
1N754A
1N755A
1N756A
1N757A
1N758A
1N759A
3.3
3.6
3.9
4.3
4.7
5.1
5.6
6.2
6.8
7.5
8.2
9.1
10
12
20
20
20
20
20
20
20
20
20
20
20
20
20
20
28
24
23
22
19
17
11
7
5
6
8
10
17
30
110
100
95
85
75
70
65
60
55
50
45
40
35
30
10
10
10
2
2
1
1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
30
30
30
30
30
20
20
20
20
20
20
20
20
20
NOTES:
(1) The Zener Impedance is derived from the 1 KH
Z
AC voltage which results when an AC current having an RMS value equal to 10% of the Zener current (I
ZT
) is
superimposed on I
ZT
. Zener Impedance is measured at two points to insure a sharp knee on the breakdown curve and to eliminate unstable units.
(2) Valid provided that leads at a distance of 3/8” from case are kept at ambient temperature.
(3) Measured with device junction in thermal equilibrium.
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