74HC1G00; 74HCT1G00
2-input NAND gate
Rev. 5 — 25 September 2013
Product data sheet
1. General description
The 74HC1G00; 74HCT1G00 is a single 2-input NAND gate. Inputs include clamp diodes
that enable the use of current limiting resistors to interface inputs to voltages in excess of
V
CC
.
2. Features and benefits
Wide supply voltage range from 2.0 V to 6.0 V
Input levels:
For 74HC1G00: CMOS level
For 74HCT1G00: TTL level
Symmetrical output impedance
High noise immunity
Low power dissipation
Balanced propagation delays
ESD protection:
HBM JESD22-A114E exceeds 2000 V
MM JESD22-A115-A exceeds 200 V
Multiple package options
Specified from
40 C
to +85
C
and
40 C
to +125
C
3. Ordering information
Table 1.
Ordering information
Package
Temperature range
74HC1G00GW
74HCT1G00GW
74HC1G00GV
74HCT1G00GV
40 C
to +125
C
40 C
to +125
C
Name
Description
Version
SOT353-1
SOT753
TSSOP5 plastic thin shrink small outline package; 5 leads;
body width 1.25 mm
SC-74A
plastic surface-mounted package; 5 leads
Type number
NXP Semiconductors
74HC1G00; 74HCT1G00
2-input NAND gate
4. Marking
Table 2.
Marking codes
Marking
[1]
HA
TA
H00
T00
Type number
74HC1G00GW
74HCT1G00GW
74HC1G00GV
74HCT1G00GV
[1]
The pin 1 indicator is located on the lower left corner of the device, below the marking code.
5. Functional diagram
B
1
2
B
A
1
Y
4
2
mna097
mna098
&
4
A
Y
mna099
Fig 1.
Logic symbol
Fig 2.
IEC logic symbol
Fig 3.
Logic diagram
6. Pinning information
6.1 Pinning
74HC1G00
74HCT1G00
B
A
1
2
5
V
CC
GND
3
001aaf086
4
Y
Fig 4.
Pin configuration
6.2 Pin description
Table 3.
Symbol
B
A
GND
Y
V
CC
Pin description
Pin
1
2
3
4
5
Description
data input
data input
ground (0 V)
data output
supply voltage
74HC_HCT1G00
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Product data sheet
Rev. 5 — 25 September 2013
2 of 12
NXP Semiconductors
74HC1G00; 74HCT1G00
2-input NAND gate
7. Functional description
Table 4.
Function table
H = HIGH voltage level; L = LOW voltage level
Input
A
L
L
H
H
B
L
H
L
H
Output
Y
H
H
H
L
8. Limiting values
Table 5.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to GND (ground = 0 V).
[1]
Symbol
V
CC
I
IK
I
OK
I
O
I
CC
I
GND
T
stg
P
tot
[1]
[2]
Parameter
supply voltage
input clamping current
output clamping current
output current
supply current
ground current
storage temperature
total power dissipation
Conditions
V
I
<
0.5
V or V
I
> V
CC
+ 0.5 V
V
O
<
0.5
V or V
O
> V
CC
+ 0.5 V
0.5
V < V
O
< V
CC
+ 0.5 V
Min
0.5
-
-
-
-
25
65
Max
+7.0
20
20
12.5
25
-
+150
200
Unit
V
mA
mA
mA
mA
mA
C
mW
T
amb
=
40 C
to +125
C
[2]
-
The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
Above 55
C,
the value of P
tot
derates linearly with 2.5 mW/K.
9. Recommended operating conditions
Table 6.
Recommended operating conditions
Voltages are referenced to GND (ground = 0 V).
Symbol Parameter
V
CC
V
I
V
O
T
amb
t/V
supply voltage
input voltage
output voltage
ambient temperature
input transition rise
and fall rate
V
CC
= 2.0 V
V
CC
= 4.5 V
V
CC
= 6.0 V
Conditions
74HC1G00
Min
2.0
0
0
40
-
-
-
Typ
5.0
-
-
+25
-
-
-
Max
6.0
V
CC
V
CC
+125
625
139
83
74HCT1G00
Min
4.5
0
0
40
-
-
-
Typ
5.0
-
-
+25
-
-
-
Max
5.5
V
CC
V
CC
+125
-
139
-
V
V
V
C
ns/V
ns/V
ns/V
Unit
74HC_HCT1G00
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Product data sheet
Rev. 5 — 25 September 2013
3 of 12
NXP Semiconductors
74HC1G00; 74HCT1G00
2-input NAND gate
10. Static characteristics
Table 7.
Static characteristics
Voltages are referenced to GND (ground = 0 V). All typical values are measured at T
amb
= 25
C.
Symbol
Parameter
Conditions
40 C
to +85
C
Min
For type 74HC1G00
V
IH
HIGH-level input
voltage
V
CC
= 2.0 V
V
CC
= 4.5 V
V
CC
= 6.0 V
V
IL
LOW-level input
voltage
V
CC
= 2.0 V
V
CC
= 4.5 V
V
CC
= 6.0 V
V
OH
HIGH-level output
voltage
V
I
= V
IH
or V
IL
I
O
=
20 A;
V
CC
= 2.0 V
I
O
=
20 A;
V
CC
= 4.5 V
I
O
=
20 A;
V
CC
= 6.0 V
I
O
=
2.0
mA; V
CC
= 4.5 V
I
O
=
2.6
mA; V
CC
= 6.0 V
V
OL
LOW-level output
voltage
V
I
= V
IH
or V
IL
I
O
= 20
A;
V
CC
= 2.0 V
I
O
= 20
A;
V
CC
= 4.5 V
I
O
= 20
A;
V
CC
= 6.0 V
I
O
= 2.0 mA; V
CC
= 4.5 V
I
O
= 2.6 mA; V
CC
= 6.0 V
I
I
I
CC
C
I
V
IH
V
IL
V
OH
input leakage current
supply current
input capacitance
HIGH-level input
voltage
LOW-level input
voltage
HIGH-level output
voltage
V
CC
= 4.5 V to 5.5 V
V
CC
= 4.5 V to 5.5 V
V
I
= V
IH
or V
IL
I
O
=
20 A;
V
CC
= 4.5 V
I
O
=
2.0
mA; V
CC
= 4.5 V
V
OL
LOW-level output
voltage
V
I
= V
IH
or V
IL
I
O
= 20
A;
V
CC
= 4.5 V
I
O
= 2.0 mA; V
CC
= 4.5 V
I
I
input leakage current
V
I
= V
CC
or GND; V
CC
= 5.5 V
-
-
-
0
0.15
-
0.1
0.33
1.0
-
-
-
0.1
0.4
1.0
V
V
A
4.4
4.13
4.5
4.32
-
-
4.4
3.7
-
-
V
V
2.0
-
V
I
= V
CC
or GND; V
CC
= 6.0 V
V
I
= V
CC
or GND; I
O
= 0 A;
V
CC
= 6.0 V
-
-
-
-
-
-
-
0
0
0
0.15
0.16
-
-
- 1.5
1.6
1.2
0.1
0.1
0.1
0.33
0.33
1.0
10
-
-
0.8
-
-
-
-
-
-
-
-
2.0
-
0.1
0.1
0.1
0.4
0.4
1.0
20
-
-
0.8
V
V
V
V
V
A
A
pF
V
V
1.9
4.4
5.9
4.13
5.63
2.0
4.5
6.0
4.32
5.81
-
-
-
-
-
1.9
4.4
5.9
3.7
5.2
-
-
-
-
-
V
V
V
V
V
1.5
3.15
4.2
-
-
-
1.2
2.4
3.2
0.8
2.1
2.8
-
-
-
0.5
1.35
1.8
1.5
3.15
4.2
-
-
-
-
-
-
0.5
1.35
1.8
V
V
V
V
V
V
Typ
Max
40 C
to +125
C
Min
Max
Unit
For type 74HCT1G00
74HC_HCT1G00
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Product data sheet
Rev. 5 — 25 September 2013
4 of 12
NXP Semiconductors
74HC1G00; 74HCT1G00
2-input NAND gate
Table 7.
Static characteristics
…continued
Voltages are referenced to GND (ground = 0 V). All typical values are measured at T
amb
= 25
C.
Symbol
I
CC
I
CC
C
I
Parameter
supply current
additional supply
current
input capacitance
Conditions
V
I
= V
CC
or GND; I
O
= 0 A;
V
CC
= 5.5 V
per input; V
CC
= 4.5 V to 5.5 V;
V
I
= V
CC
2.1 V; I
O
= 0 A
-
-
40 C
to +85
C
Min
-
-
- 1.5
Typ
Max
10
500
-
-
-
-
40 C
to +125
C
Min
20
850
-
Max
A
A
pF
Unit
11. Dynamic characteristics
Table 8.
Dynamic characteristics
GND = 0 V; t
r
= t
f
6.0 ns; All typical values are measured at T
amb
= 25
C. For test circuit, see
Figure 6
Symbol Parameter
For type 74HC1G00
t
pd
propagation delay A and B to Y; see
Figure 5
V
CC
= 2.0 V; C
L
= 50 pF
V
CC
= 4.5 V; C
L
= 50 pF
V
CC
= 5.0 V; C
L
= 15 pF
V
CC
= 6.0 V; C
L
= 50 pF
C
PD
power dissipation V
I
= GND to V
CC
capacitance
propagation delay A and B to Y; see
Figure 5
V
CC
= 4.5 V; C
L
= 50 pF
V
CC
= 5.0 V; C
L
= 15 pF
C
PD
power dissipation V
I
= GND to V
CC
1.5 V
capacitance
t
pd
is the same as t
PLH
and t
PHL
.
C
PD
is used to determine the dynamic power dissipation P
D
(W).
P
D
= C
PD
V
CC2
f
i
+
(C
L
V
CC2
f
o
) where:
f
i
= input frequency in MHz; f
o
= output frequency in MHz
C
L
= output load capacitance in pF
V
CC
= supply voltage in Volts
(C
L
V
CC2
f
o
) = sum of outputs
[2]
[2]
[1]
Conditions
40 C
to +85
C
Min
Typ
Max
40 C
to +125
C
Unit
Min
Max
-
-
-
-
-
25
9
7
8
19
115
23
-
20
-
-
-
-
-
-
135
27
-
23
-
ns
ns
ns
ns
pF
For type 74HCT1G00
t
pd
[1]
-
-
-
12
10
21
24
-
-
-
-
-
27
-
-
ns
ns
pF
[1]
[2]
74HC_HCT1G00
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Product data sheet
Rev. 5 — 25 September 2013
5 of 12
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