256K X 36, 512K X 18
IDT71V67703
3.3V Synchronous SRAMs
IDT71V67903
3.3V I/O, Burst Counter
Flow-Through Outputs, Single Cycle Deselect
Features
◆
◆
◆
◆
256K x 36, 512K x 18 memory configurations
Supports fast access times:
– 7.5ns up to 117MHz clock frequency
– 8.0ns up to 100MHz clock frequency
– 8.5ns up to 87MHz clock frequency
LBO
input selects interleaved or linear burst mode
Self-timed write cycle with global write control (GW), byte write
enable (BWE), and byte writes (BWx)
◆
◆
◆
◆
◆
3.3V core power supply
Power down controlled by ZZ input
3.3V I/O supply (V
DDQ
)
Packaged in a JEDEC Standard 100-pin thin plastic quad
flatpack (TQFP), 119 ball grid array (BGA) and 165 fine pitch ball
grid array (fBGA)
Green parts available see ordering information
Functional Block Diagram
LBO
ADV
CEN
Burst
Sequence
INTERNAL
ADDRESS
CLK
ADSC
ADSP
CLK EN
ADDRESS
REGISTER
Byte 1
Write Register
Binary
Counter
CLR
2
Burst
Logic
18/19
A0*
A1*
Q0
Q1
256K x 36/
512K x 18-
BIT
MEMORY
ARRAY
2
A
0
,A
1
18/19
A
2 -
A
18
36/18
36/18
A
0–
A
17/18
GW
BWE
BW
1
Byte 1
Write Driver
9
Byte 2
Write Register
Byte 2
Write Driver
BW
2
Byte 3
Write Register
9
Byte 3
Write Driver
BW
3
Byte 4
Write Register
9
Byte 4
Write Driver
BW
4
9
CE
CS
0
CS
1
D
Q
Enable
Register
DATA INPUT
REGISTER
CLK EN
ZZ
Powerdown
OE
OE
I/O
0
–I/O
31
I/O
P1–
I/O
P4
36/18
OUTPUT
BUFFER
,
5309 drw 01
DECEMBER 2014
1
©2014 Integrated Device Technology, Inc.
DSC-5309/06
IDT71V67703, IDT71V67903, 256K x 36, 512K x 18, 3.3V Synchronous SRAMS with
3.3V I/O, Flow-Through Outputs, Single Cycle Deselect
Commercial and Industrial Temperature Ranges
Description
The IDT71V67703/7903 are high-speed SRAMs organized as 256K
x 36/512K x 18. The IDT71V67703/7903 SRAMs contain write, data,
address and control registers. There are no registers in the data output
path (flow-through architecture). Internal logic allows the SRAM to
generate a self-timed write based upon a decision which can be left until
the end of the write cycle.
The burst mode feature offers the highest level of performance to the
system designer, as the IDT71V67703/7903 can provide four cycles of
data for a single address presented to the SRAM. An internal burst
address counter accepts the first cycle address from the processor,
initiating the access sequence. The first cycle of output data will flow-
through from the array after a clock-to-data access time delay from the
rising clock edge of the same cycle. If burst mode operation is selected
(ADV=LOW), the subsequent three cycles of output data will be available
to the user on the next three rising clock edges. The order of these three
addresses are defined by the internal burst counter and the
LBO
input pin.
The IDT71V67703/7903 SRAMs utilize IDT’s latest high-performance
CMOS process and are packaged in a JEDEC standard 14mm x 20mm
100-pin thin plastic quad flatpack (TQFP) as well as a 119 ball grid array
(BGA) and a 165 fine pitch ball grid array (fBGA).
Pin Description Summary
A
0
-A
18
CE
CS
0
,
CS
1
OE
GW
BWE
BW
1
,
BW
2
,
BW
3
,
BW
4
(1)
CLK
ADV
ADSC
ADSP
LBO
ZZ
I/O
0
-I/O
31
, I/O
P1
-I/O
P4
V
DD
, V
DDQ
V
SS
Address Inputs
Chip Enable
Chip Selects
Output Enable
Global Write Enable
Byte Write Enable
Individual Byte Write Selects
Clock
Burst Address Advance
Address Status (Cache Controller)
Address Status (Processor)
Linear / Interleaved Burst Order
Sleep Mode
Data Input / Output
Core Power, I/O Power
Ground
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
I/O
Supply
Supply
Synchronous
Synchronous
Synchronous
Asynchronous
Synchronous
Synchronous
Synchronous
N/A
Synchronous
Synchronous
Synchronous
DC
Asynchronous
Synchronous
N/A
N/A
5309 tbl 01
NOTE:
1.
BW
3
and
BW
4
are not applicable for the IDT71V67903.
6.42
2
IDT71V67703, IDT71V67903, 256K x 36, 512K x 18, 3.3V Synchronous SRAMS with
3.3V I/O, Flow-Through Outputs, Single Cycle Deselect
Commercial and Industrial Temperature Ranges
Pin Definitions
(1)
Symbol
A
0
-A
18
ADSC
ADSP
ADV
Pin Function
Address Inputs
Address Status
(Cache Controller)
Address Status
(Processor)
Burst Address
Advance
Byte Write Enable
I/O
I
I
I
I
Active
N/A
LOW
LOW
LOW
Description
Synchronous Address inputs. The address register is trigge red by a combi-nation of the
rising e dge of CLK and
ADSC
Low or
ADSP
Low and
CE
Low.
Synchronous Address Status from Cache Controller.
ADSC
is an active LOW input that is
used to load the address registers with new addresses.
Synchronous Address Status from Processor.
ADSP
is an active LOW inp ut that is used to
load the address registers with new addresses.
ADSP
is gated by
CE.
Synchronous Address Advance.
ADV
is an active LOW input that is used to advance the
internal burst counter, controlling burst access after the initial address is loaded. When the
inp ut is HIGH the burst counter is not incremented; that is, there is no address advance.
Synchronous byte write enable gates the byte write inputs
BW
1
-BW
4
. If
BWE
is LOW at the
rising ed ge of CLK then
BWx
inputs are passed to the next stage in the circuit. If
BWE
is
HIGH then the byte write inputs are blocked and only
GW
can initiate a write cycle.
Synchronous byte write enables.
BW
1
controls I/O
0-7
, I/O
P1
,
BW
2
controls I/O
8-15
, I/O
P2
, etc.
Any active byte write cause s all outputs to be disabled.
Synchronous chip enable.
CE
is used with CS
0
and
CS
1
to enable the IDT71V67703/7903.
CE
also gates
ADSP.
This is the clock input. All timing references for the device are made with respect to this
input.
Synchronous active HIGH chip select. CS
0
is used with
CE
and
CS
1
to enable the chip.
Synchrono us active LOW chip select.
CS
1
is used with
CE
and CS
0
to enable the chip.
Synchronous global write enable. This input will write all four 9-bit data bytes when LOW
on the rising edge of CLK.
GW
supersedes individual byte write enables.
Synchronous data input/output (I/O) pins. The data input path is registered, triggered by
the rising edge of CLK. The data output path is flow-through (no output register).
Asynchro nous burst order selection input. When
LBO
is HIGH, the inter-leaved burst
sequence is selected. When
LBO
is LOW the Linear burst sequence is selected.
LBO
is a
static input and must not change state while the device is operating.
Asynchronous output enable. When
OE
is LOW the data output drivers are enabled on the
I/O pins if the chip is also selected. When
OE
is HIGH the I/O p ins are in a high-
impedance state.
3.3V core power supply.
3.3V I/O Supply.
Ground.
NC pins are not electrically connected to the device.
Asynchronous sleep mode input. ZZ HIGH will g ate the CLK internally and power down
the IDT71V67703/7903 to its lowest power consump tion level. Data retention is guaranteed
in Sleep Mode.
5309 tbl 02
BWE
I
LOW
BW
1
-BW
4
CE
CLK
CS
0
CS
1
GW
I/O
0
-I/O
31
I/O
P1
-I/O
P4
LBO
Individual Byte
Write Enables
Chip Enable
Clock
Chip Select 0
Chip Select 1
Global Write
Enable
Data Input/Output
Linear Burst Order
I
I
I
I
I
I
I/O
I
LOW
LOW
N/A
HIGH
LOW
LOW
N/A
LOW
OE
Output Enable
I
LOW
V
DD
V
DDQ
V
SS
NC
ZZ
Power Supply
Power Supply
Ground
No Connect
Sleep Mode
N/A
N/A
N/A
N/A
1
N/A
N/A
N/A
N/A
HIGH
NOTE:
1. All synchronous inputs must meet specified setup and hold times with respect to CLK.
6.42
3
IDT71V67703, IDT71V67903, 256K x 36, 512K x 18, 3.3V Synchronous SRAMS with
3.3V I/O, Flow-Through Outputs, Single Cycle Deselect
Commercial and Industrial Temperature Ranges
Absolute Maximum Ratings
(1)
Symbol
V
TERM
(2)
V
TERM
(3,6)
Rating
Terminal Voltage with
Respect to GND
Terminal Voltage with
Respect to GND
Terminal Voltage with
Respect to GND
Terminal Voltage with
Respect to GND
Operating Temperature
Temperature
Under Bias
Storage
Temperature
Power Dissipation
DC Output Current
Commercial
-0.5 to +4.6
-0.5 to V
DD
-0.5 to V
DD
+0.5
-0.5 to V
DDQ
+0.5
-0 to +70
-55 to +125
-55 to +125
2.0
50
Unit
V
V
V
V
o
Recommended Operating
Temperature Supply Voltage
Grade
Commercial
Industrial
Temperature
(1)
0°C to +70°C
-40°C to +85°C
V
SS
0V
0V
V
DD
3.3V±5%
3.3V±5%
V
DDQ
3.3V±5%
3.3V±5%
5309 tbl 04
V
TERM
(4,6)
V
TERM
(5,6)
T
A
(7)
T
BIAS
T
STG
P
T
I
OUT
NOTE:
1. T
A
is the "instant on" case temperature.
C
C
C
Recommended DC Operating
Conditions
Symbol
Parameter
Core Supply Voltage
I/O Supply Voltage
Supply Voltage
Input High Voltage - Inputs
Input High Voltage - I/O
Input Low Voltage
Min.
3.135
3.135
0
2.0
2.0
-0.3
(1)
Typ.
3.3
3.3
0
____
____
____
Max.
3.465
3.465
0
V
DD
+0.3
V
DDQ
+0.3
0.8
Unit
V
V
V
V
V
V
5309 tbl 05
o
V
DD
V
DDQ
V
SS
o
W
mA
5309 tbl 03
V
IH
V
IH
V
IL
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated
in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
2. V
DD
terminals only.
3. V
DDQ
terminals only.
4. Input terminals only.
5. I/O terminals only.
6. This is a steady-state DC parameter that applies after the power supplies have
ramped up. Power supply sequencing is not necessary; however, the voltage
on any input or I/O pin cannot exceed V
DDQ
during power supply ramp up.
7. T
A
is the "instant on" case temperature.
NOTE:
1. V
IL
(min) = -1.0V for pulse width less than t
CYC/2
, once per cycle.
100-Pin TQFP Capacitance
(T
A
= +25° C, f = 1.0MHz)
Symbol
C
IN
C
I/O
Parameter
(1)
Input Capacitance
I/O Capacitance
Conditions
V
IN
= 3dV
V
OUT
= 3dV
Max.
5
7
Unit
pF
pF
5309 tbl 07
165 fBGA Capacitance
(T
A
= +25° C, f = 1.0MHz)
Symbol
C
IN
C
I/O
Parameter
(1)
Input Capacitance
I/O Capacitance
Conditions
V
IN
= 3dV
V
OUT
= 3dV
Max.
7
7
Unit
pF
pF
5309 tbl 07b
119 BGA Capacitance
(T
A
= +25° C, f = 1.0MHz)
Symbol
C
IN
C
I/O
Parameter
(1)
Input Capacitance
I/O Capacitance
Conditions
V
IN
= 3dV
V
OUT
= 3dV
Max.
7
7
Unit
pF
pF
5309 tbl 07a
NOTE:
1. This parameter is guaranteed by device characterization, but not production tested.
6.42
4
IDT71V67703, IDT71V67903, 256K x 36, 512K x 18, 3.3V Synchronous SRAMS with
3.3V I/O, Flow-Through Outputs, Single Cycle Deselect
Commercial and Industrial Temperature Ranges
Pin Configuration – 256K x 36, 100-Pin TQFP
CLK
GW
BWE
OE
ADSC
ADSP
ADV
A
8
A
9
A
6
A
7
CE
CS
0
BW
4
BW
3
BW
2
BW
1
CS
1
V
DD
V
SS
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
I/O
P3
I/O
16
I/O
17
V
DDQ
V
SS
I/O
18
I/O
19
I/O
20
I/O
21
V
SS
V
DDQ
I/O
22
I/O
23
V
SS
(1)
V
DD
NC
V
SS
I/O
24
I/O
25
V
DDQ
V
SS
I/O
26
I/O
27
I/O
28
I/O
29
V
SS
V
DDQ
I/O
30
I/O
31
I/O
P4
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
I/O
P2
I/O
15
I/O
14
V
DDQ
V
SS
I/O
13
I/O
12
I/O
11
I/O
10
V
SS
V
DDQ
I/O
9
I/O
8
V
SS
NC
V
DD
ZZ
(2)
I/O
7
I/O
6
V
DDQ
V
SS
I/O
5
I/O
4
I/O
3
I/O
2
V
SS
V
DDQ
I/O
1
I/O
0
I/O
P1
5309 drw 02a
,
LBO
A
5
A
4
A
3
A
2
A
1
A
0
NC
NC
V
SS
V
DD
NOTES:
1. Pin 14 does not have to be directly connected to V
SS
as long as the input voltage is < V
IL
.
2. Pin 64 can be left unconnected and the device will always remain in active mode.
Top View
6.42
5
NC
A
17
A
10
A
11
A
12
A
13
A
14
A
15
A
16
Microchip MCU
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