128K x 36, 256K x 18
3.3V Synchronous SRAMs
3.3V I/O, Pipelined Outputs
Burst Counter, Single Cycle Deselect
◆
◆
IDT71V3576S/YS
IDT71V3578S/YS
Features
◆
◆
◆
◆
◆
◆
◆
128K x 36, 256K x 18 memory configurations
Supports high system speed:
Commercial and Industrial:
– 150MHz 3.8ns clock access time
– 133MHz 4.2ns clock access time
LBO
input selects interleaved or linear burst mode
Self-timed write cycle with global write control (GW), byte write
enable (BWE), and byte writes (BWx)
3.3V core power supply
Power down controlled by ZZ input
3.3V I/O
Optional - Boundary Scan JTAG Interface (IEEE 1149.1
compliant)
Packaged in a JEDEC Standard 100-pin plastic thin quad
flatpack (TQFP)
Description
The IDT71V3576/78 are high-speed SRAMs organized as
128K x 36/256K x 18. The IDT71V3576/78 SRAMs contain write, data,
address and control registers. Internal logic allows the SRAM to generate
a self-timed write based upon a decision which can be left until the end of
the write cycle.
The burst mode feature offers the highest level of performance to the
system designer, as the IDT71V3576/78 can provide four cycles of data
for a single address presented to the SRAM. An internal burst address
counter accepts the first cycle address from the processor, initiating the
access sequence. The first cycle of output data will be pipelined for one
cycle before it is available on the next rising clock edge. If burst mode
operation is selected (ADV=LOW), the subsequent three cycles of output
data will be available to the user on the next three rising clock edges. The
order of these three addresses are defined by the internal burst counter
and the
LBO
input pin.
The IDT71V3576/78 SRAMs utilize IDT’s latest high-performance
CMOS process and are packaged in a JEDEC standard 14mm x 20mm
100-pin thin plastic quad flatpack (TQFP).
Pin Description Summary
A
0
-A
17
CE
CS
0
,
CS
1
OE
GW
BWE
BW
1
,
BW
2
,
BW
3
,
BW
4
(1)
CLK
ADV
ADSC
ADSP
LBO
TMS
TDI
TCK
TDO
ZZ
I/O
0
-I/O
31
, I/O
P1
-I/O
P4
V
DD
, V
DDQ
V
SS
Address Inputs
Chip Enable
Chip Selects
Output Enable
Global Write Enable
Byte Write Enable
Individual Byte Write Selects
Clock
Burst Address Advance
Address Status (Cache Controller)
Address Status (Processor)
Linear / Interleaved Burst Order
Test Mode Select
Test Data Input
Test Clock
Test Data Output
Sleep Mode
Data Input / Output
Core Power, I/O Power
Ground
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Output
Input
I/O
Supply
Supply
Synchronous
Synchronous
Synchronous
Asynchronous
Synchronous
Synchronous
Synchronous
N/A
Synchronous
Synchronous
Synchronous
DC
Synchronous
Synchronous
N/A
Synchronous
Asynchronous
Synchronous
N/A
N/A
5279 tbl 01
NOTE:
1.
BW
3
and
BW
4
are not applicable for the IDT71V3578.
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
JANUARY 2010
1
DSC-5279/05
©2010 Integrated Device Technology, Inc.
IDT71V3576, IDT71V3578, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
3.3V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect
Commercial and Industrial Temperature Ranges
Pin Definitions
(1)
Symbol
A
0
-A
17
ADSC
ADSP
Pin Function
Address Inputs
Address Status
(Cache Controller)
Address Status
(Processor)
Burst Address
Advance
I/O
I
I
I
Active
N/A
LOW
LOW
Description
Synchronous Address inputs. The address register is triggered by a combination of the rising edge
of CLK and
ADSC
Low or
ADSP
Low and
CE
Low.
Synchronous Address Status from Cache Controller.
ADSC
is an active LOW input that is used to load
the address registers with new addresses.
Synchronous Address Status from Processor.
ADSP
is an active LOW input that is used to load the
address registers with new addresses.
ADSP
is gated by
CE.
Synchronous Address Advance.
ADV
is an active LOW input that is used to advance the internal
burst counter, controlling burst access after the initial address is loaded. When the input is HIGH the
burst counter is not incremented; that is, there is no address advance.
Synchronous byte write enable gates the byte write inputs
BW
1
-BW
4
. If
BWE
is LOW at the rising
edge of CLK then
BWx
inputs are passed to the next stage in the circuit. If
BWE
is HIGH then the
byte write inputs are blocked and only
GW
can initiate a write cycle.
Synchronous byte write enables.
BW
1
controls I/O
0-7
, I/O
P1
,
BW
2
controls I/O
8-15
, I/O
P2
, etc. Any
active byte write causes all outputs to be disabled.
Synchronous chip enable.
CE
is used with CS
0
and
CS
1
to enable the IDT71V3576/78.
CE
also gates
ADSP.
This is the clock input. All timing references for the device are made with respect to this input.
Synchronous active HIGH chip select. CS
0
is used with
CE
and
CS
1
to enable the chip.
Synchronous active LOW chip select.
CS
1
is used with
CE
and CS
0
to enable the chip.
Synchronous global write enable. This input will write all four 9-bit data bytes when LOW on the rising
edge of CLK.
GW
supersedes individual byte write enables.
Synchronous data input/output (I/O) pins. Both the data input path and data output path are registered
and triggered by the rising edge of CLK.
Asynchronous burst order selection input. When
LBO
is HIGH, the interleaved burst sequence is
selected. When
LBO
is LOW the Linear burst sequence is selected.
LBO
is a static input and must
not change state while the device is operating.
Asynchronous output enable. When
OE
is LOW the data output drivers are enabled on the I/O pins if
the chip is also selected. When
OE
is HIGH the I/O pins are in a high-impedance state.
Gives input command for TAP controller. Sampled on rising edge of TDK. This pin has an internal
pullup.
Serial input of registers placed between TDI and TDO. Sampled on rising edge of TCK. This pin has
an internal pullup.
Clock input of TAP controller. Each TAP event is clocked. Test inputs are captured on rising edge of
TCK, while test outputs are driven from the falling edge of TCK. This pin has an internal pullup.
Serial output of registers placed between TDI and TDO. This output is active depending on the state
of the TAP controller.
Asynchronous sleep mode input. ZZ HIGH will gate the CLK internally and power down the
IDT71V3576/78 to its lowest power consumption level. Data retention is guaranteed in Sleep
Mode.This pin has an internal pull down.
3.3V core power supply.
3.3V I/O Supply.
Ground.
NC pins are not electrically connected to the device.
5279 tbl 02
ADV
I
LOW
BWE
Byte Write Enable
Individual Byte
Write Enables
Chip Enable
Clock
Chip Select 0
Chip Select 1
Global Write
Enable
Data Input/Output
I
LOW
BW
1
-BW
4
CE
CLK
CS
0
CS
1
GW
I/O
0
-I/O
31
I/O
P1
-I/O
P4
LBO
I
I
I
I
I
I
I/O
LOW
LOW
N/A
HIGH
LOW
LOW
N/A
Linear Burst Order
I
LOW
OE
TMS
TDI
TCK
TDO
Output Enable
Test ModeSelect
Test Data Input
Test Clock
Test DataOutput
I
I
I
I
O
LOW
N/A
N/A
N/A
N/A
ZZ
V
DD
V
DDQ
V
SS
NC
Sleep Mode
Power Supply
Power Supply
Ground
No Connect
I
N/A
N/A
N/A
N/A
HIGH
N/A
N/A
N/A
N/A
NOTE:
1. All synchronous inputs must meet specified setup and hold times with respect to CLK.
6.42
2
IDT71V3576, IDT71V3578, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
3.3V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect
Commercial and Industrial Temperature Ranges
Functional Block Diagram
LBO
ADV
CEN
Burst
Sequence
INTERNAL
ADDRESS
CLK
ADSC
ADSP
CLK EN
ADDRESS
REGISTER
Byte 1
Write Register
Binary
Counter
CLR
2
Burst
Logic
17/18
A0*
A1*
Q0
Q1
128K x 36/
256K x 18-
BIT
MEMORY
ARRAY
2
A
0
,A
1
17/18
A
2
–A
17
36/18
36/18
A
0 -
A
16/17
GW
BWE
BW
1
Byte 1
Write Driver
9
Byte 2
Write Register
Byte 2
Write Driver
BW
2
Byte 3
Write Register
9
Byte 3
Write Driver
BW
3
Byte 4
Write Register
9
Byte 4
Write Driver
BW
4
9
OUTPUT
REGISTER
CE
CS
0
CS
1
D
Q
Enable
Register
DATA INPUT
REGISTER
CLK EN
ZZ
Powerdown
D
Q
Enable
Delay
Register
OE
OUTPUT
BUFFER
OE
I/O
0
— I/O
31
I/O
P1
— I/O
P4
36/18
,
5279 drw 01
TMS
TDI
TCK
TRST
(Optional)
JTAG
(SA Version)
TDO
6.42
3
IDT71V3576, IDT71V3578, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
3.3V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect
Commercial and Industrial Temperature Ranges
Absolute Maximum Ratings
(1)
Symbol
V
TERM
(2)
V
TERM
(3,6)
V
TERM
(4,6)
V
TERM
(5,6)
Rating
Terminal Voltage with
Respect to GND
Terminal Voltage with
Respect to GND
Terminal Voltage with
Respect to GND
Terminal Voltage with
Respect to GND
Commercial
Operating Temperature
Industrial
Operating Temperature
T
BIAS
T
STG
P
T
I
OUT
Temperature
Under Bias
Storage
Temperature
Power Dissipation
DC Output Current
Commercial &
Industrial
-0.5 to +4.6
-0.5 to V
DD
-0.5 to V
DD
+0.5
-0.5 to V
DDQ
+0.5
-0 to +70
-40 to +85
-55 to +125
-55 to +125
2.0
50
Unit
V
V
V
V
o
Recommended Operating
Temperature and Supply Voltage
Grade
Commercial
Industrial
Temperature
(1)
0°C to +70°C
-40°C to +85°C
V
SS
0V
0V
V
DD
3.3V±5%
3.3V±5%
V
DDQ
3.3V±5%
3.3V±5%
5279 tbl 04
NOTES:
1. T
A
is the "instant on" case temperature.
Recommended DC Operating
Conditions
Symbol
V
DD
Parameter
Core Supply Voltage
I/O Supply Voltage
Supply Voltage
Input High Voltage - Inputs
Input High Voltage - I/O
Input Low Voltage
Min.
3.135
3.135
0
2.0
2.0
-0.3
(2)
Typ.
3.3
3.3
0
____
____
____
C
C
C
C
Max.
3.465
3.465
0
V
DD
+0.3
V
DDQ
+0.3
(1)
0.8
Unit
V
V
V
V
V
V
5279 tbl 06
T
A
(7)
o
V
DDQ
V
SS
V
IH
V
IH
V
IL
o
o
W
mA
NOTES:
1. V
IH
(max) = V
DDQ
+ 1.0V for pulse width less than t
CYC/2
, once per cycle.
2. V
IL
(min) = -1.0V for pulse width less than t
CYC/2
, once per cycle.
5279 tbl 03
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated
in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
2. V
DD
terminals only.
3. V
DDQ
terminals only.
4. Input terminals only.
5. I/O terminals only.
6. This is a steady-state DC parameter that applies after the power supplies have
ramped up. Power supply sequencing is not necessary; however, the voltage
on any input or I/O pin cannot exceed V
DDQ
during power supply ramp up.
7. T
A
is the "instant on" case temperature.
100 Pin TQFP Capacitance
(T
A
= +25°C, f = 1.0MHz)
Symbol
C
IN
C
I/O
Parameter
(1)
Input Capacitance
I/O Capacitance
Conditions
V
IN
= 3dV
V
OUT
= 3dV
Max.
5
7
Unit
pF
pF
5279 tbl 07
NOTE:
1. This parameter is guaranteed by device characterization, but not production tested.
6.42
4
IDT71V3576, IDT71V3578, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
3.3V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect
Commercial and Industrial Temperature Ranges
Pin Configuration – 128K x 36
A
6
A
7
CE
CS
0
BW
4
BW
3
BW
2
BW
1
CS
1
V
DD
V
SS
CLK
GW
BWE
OE
ADSC
ADSP
ADV
A
8
A
9
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
I/O
P3
I/O
16
I/O
17
V
DDQ
V
SS
I/O
18
I/O
19
I/O
20
I/O
21
V
SS
V
DDQ
I/O
22
I/O
23
V
DD
/ NC
(1)
V
DD
NC
V
SS
I/O
24
I/O
25
V
DDQ
V
SS
I/O
26
I/O
27
I/O
28
I/O
29
V
SS
V
DDQ
I/O
30
I/O
31
I/O
P4
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
I/O
P2
I/O
15
I/O
14
V
DDQ
V
SS
I/O
13
I/O
12
I/O
11
I/O
10
V
SS
V
DDQ
I/O
9
I/O
8
V
SS
NC
V
DD
ZZ
(2)
I/O
7
I/O
6
V
DDQ
V
SS
I/O
5
I/O
4
I/O
3
I/O
2
V
SS
V
DDQ
I/O
1
I/O
0
I/O
P1
5279 drw 02
,
LBO
A
5
A
4
A
3
A
2
A
1
A
0
NOTES:
1. Pin 14 can either be directly connected to V
DD
, or connected to an input voltage
≥
V
IH
, or left unconnected.
2. Pin 64 can be left unconnected and the device will always remain in active mode.
NC
NC
V
SS
V
DD
NC
NC
A
10
A
11
A
12
A
13
A
14
A
15
A
16
TQFP
Top View
6.42
5
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