CY7C1516V18, CY7C1527V18
CY7C1518V18, CY7C1520V18
72-Mbit DDR II SRAM 2-Word
Burst Architecture
Features
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Functional Description
The CY7C1516V18, CY7C1527V18, CY7C1518V18, and
CY7C1520V18 are 1.8V Synchronous Pipelined SRAM
equipped with DDR-II architecture. The DDR-II consists of an
SRAM core with advanced synchronous peripheral circuitry and
a 1-bit burst counter. Addresses for read and write are latched
on alternate rising edges of the input (K) clock. Write data is
registered on the rising edges of both K and K. Read data is
driven on the rising edges of C and C if provided, or on the rising
edge of K and K if C/C are not provided. Each address location
is associated with two 8-bit words in the case of CY7C1516V18
and two 9-bit words in the case of CY7C1527V18 that burst
sequentially into or out of the device. The burst counter always
starts with a “0” internally in the case of CY7C1516V18 and
CY7C1527V18. On CY7C1518V18 and CY7C1520V18, the
burst counter takes in the least significant bit of the external
address and bursts two 18-bit words in the case of
CY7C1518V18 and two 36-bit words in the case of
CY7C1520V18 sequentially into or out of the device.
Asynchronous inputs include an output impedance matching
input (ZQ). Synchronous data outputs (Q, sharing the same
physical pins as the data inputs D) are tightly matched to the two
output echo clocks CQ/CQ, eliminating the need for separately
capturing data from each individual DDR SRAM in the system
design. Output data clocks (C/C) enable maximum system
clocking and data synchronization flexibility.
All synchronous inputs pass through input registers controlled by
the K or K input clocks. All data outputs pass through output
registers controlled by the C or C (or K or K in a single clock
domain) input clocks. Writes are conducted with on-chip
synchronous self-timed write circuitry.
72-Mbit density (8M x 8, 8M x 9, 4M x 18, 2M x 36)
300 MHz clock for high bandwidth
2-word burst for reducing address bus frequency
Double Data Rate (DDR) interfaces
(data transferred at 600 MHz) at 300 MHz
Two input clocks (K and K) for precise DDR timing
❐
SRAM uses rising edges only
Two input clocks for output data (C and C) to minimize clock
skew and flight time mismatches
Echo clocks (CQ and CQ) simplify data capture in high-speed
systems
Synchronous internally self-timed writes
1.8V core power supply with HSTL inputs and outputs
Variable drive HSTL output buffers
Expanded HSTL output voltage (1.4V–V
DD
)
Available in 165-Ball FBGA package (15 x 17 x 1.4 mm)
Offered in both Pb-free and non Pb-free packages
JTAG 1149.1 compatible test access port
Delay Lock Loop (DLL) for accurate data placement
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Configurations
CY7C1516V18 – 8M x 8
CY7C1527V18 – 8M x 9
CY7C1518V18 – 4M x 18
CY7C1520V18 – 2M x 36
Selection Guide
Description
Maximum Operating Frequency
Maximum Operating Current
x8
x9
x18
x36
300 MHz
300
900
900
940
1080
278 MHz
278
860
860
860
985
250 MHz
250
800
800
800
900
200 MHz
200
700
700
700
735
167 MHz
167
650
650
650
650
Unit
MHz
mA
Cypress Semiconductor Corporation
Document Number: 38-05563 Rev. *G
•
198 Champion Court
•
San Jose
,
CA 95134-1709
•
408-943-2600
Revised November 16, 2010
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CY7C1516V18, CY7C1527V18
CY7C1518V18, CY7C1520V18
Contents
Features ............................................................................ 1
Configurations .................................................................. 1
Functional Description..................................................... 1
Selection Guide ................................................................ 1
Logic Block Diagram (CY7C1516V18) ............................ 2
Logic Block Diagram (CY7C1527V18) ............................ 2
Logic Block Diagram (CY7C1518V18) ............................ 3
Logic Block Diagram (CY7C1520V18) ............................ 3
Contents ............................................................................ 4
Pin Configuration ............................................................. 5
165-Ball FBGA (15 x 17 x 1.4 mm) Pinout .................. 5
Pin Definitions .................................................................. 7
Functional Overview ........................................................ 9
Read Operations ......................................................... 9
Write Operations ......................................................... 9
Byte Write Operations ................................................. 9
Single Clock Mode ...................................................... 9
DDR Operation............................................................ 9
Depth Expansion ....................................................... 10
Programmable Impedance ........................................ 10
Echo Clocks .............................................................. 10
DLL............................................................................ 10
Application Example ...................................................... 10
Truth Table ...................................................................... 11
Burst Address Table
(CY7C1518V18, CY7C1520V18) ..................................... 11
Write Cycle Descriptions ............................................... 11
Write Cycle Descriptions ............................................... 12
Write Cycle Descriptions ............................................... 12
IEEE 1149.1 Serial Boundary Scan (JTAG) .................. 13
Disabling the JTAG Feature ...................................... 13
Test Access Port—Test Clock................................... 13
Test Mode Select (TMS) ........................................... 13
Test Data-In (TDI) ..................................................... 13
Test Data-Out (TDO).................................................
Performing a TAP Reset ...........................................
TAP Registers ...........................................................
TAP Instruction Set ...................................................
TAP Controller State Diagram.......................................
TAP Controller Block Diagram......................................
TAP Electrical Characteristics ......................................
TAP AC Switching Characteristics ...............................
TAP Timing and Test Conditions ..................................
Identification Register Definitions ................................
Scan Register Sizes .......................................................
Instruction Codes...........................................................
Boundary Scan Order ....................................................
Power Up Sequence in DDR-II SRAM ...........................
Power Up Sequence .................................................
DLL Constraints ........................................................
Maximum Ratings...........................................................
Operating Range ............................................................
Electrical Characteristics ..............................................
DC Electrical Characteristics.....................................
AC Electrical Characteristics.....................................
Capacitance ....................................................................
Thermal Resistance .......................................................
Switching Characteristics .............................................
Switching Waveforms ....................................................
Ordering Information .....................................................
Package Diagram ...........................................................
Document History Page.................................................
Sales, Solutions, and Legal Information ......................
Worldwide Sales and Design Support.......................
Products ....................................................................
PSoC Solutions .........................................................
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Document Number: 38-05563 Rev. *G
Page 4 of 29
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