MCC
Features
omponents
20736 Marilla
Street Chatsworth
!"#
$
% !"#
1N5221
THRU
1N5281
500 mW
Zener Diode
2.4 to 200 Volts
DO-35
•
•
•
Wide Voltage Range Available
Glass Package
High Temp Soldering: 250°C for 10 Seconds At Terminals
•
•
•
•
•
Maximum Ratings
Operating Temperature: -55°C to +150°C
Storage Temperature: -55°C to +150°C
500 mWatt DC Power Dissipation
Power Derating: 4.0mW/°C above 50°C
Forward Voltage @ 200mA: 1.1 Volts
Figure 1 - Typical Capacitance
100
D
A
Cathode
Mark
pf
10
At zero volts
At –2 Volts V
R
D
B
1
0
100
V
Z
Typical Capacitance (pf) –
versus
– Zener voltage (V
Z
)
Figure 2 - Derating Curve
200
C
400
DIMENSIONS
mW
200
DIM
A
B
C
D
INCHES
MIN
---
---
---
1.000
MAX
.166
.079
.020
---
MM
MIN
---
---
---
25.40
MAX
4.2
2.00
.52
---
NOTE
50
100
150
Temperature
°C
Power Dissipation (mW) -
Versus
- Temperature
°C
0
Revision: 3
www.mccsemi.com
2002/12/31
1N5221 thru 1N5281
ELECTRICAL CHARACTERISTICS @25°C
MCC
PART
NUMBER
1N5221
1N5222
1N5223
1N5224
1N5225
1N5226
1N5227
1N5228
1N5229
1N5230
1N5231
1N5232
1N5233
1N5234
1N5235
1N5236
1N5237
1N5238
1N5239
1N5240
1N5241
1N5242
1N5243
1N5244
1N5245
1N5246
1N5247
1N5248
1N5249
1N5250
1N5251
1N5252
1N5253
1N5254
1N5255
1N5256
1N5257
1N5258
1N5259
1N5260
1N5261
1N5262
1N5263
1N5264
1N5265
1N5266
1N5267
1N5268
1N5269
1N5270
1N5271
1N5272
1N5273
1N5274
1N5275
1N5276
1N5277
1N5278
1N5279
1N5280
1N5281
NOMINAL ZENER
VOLTAGE V
Z
@ I
ZT
VOLTS
2.4
2.5
2.7
2.8
3.0
3.3
3.6
3.9
4.3
4.7
5.1
5.6
6.0
6.2
6.8
7.5
8.2
8.7
9.1
10
11
12
13
14
15
16
17
18
19
20
22
24
25
27
28
30
33
36
39
43
47
51
56
60
62
68
75
82
87
91
100
110
120
130
140
150
160
170
180
190
200
TEST
CURRENT I
ZT
mA
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
9.5
9.0
8.5
7.8
7.4
7.0
6.6
6.2
5.6
5.2
5.0
4.6
4.5
4.2
3.8
3.4
3.2
3.0
2.7
2.5
2.2
2.1
2.0
1.8
1.7
1.5
1.4
1.4
1.3
1.1
1.0
0.95
0.90
0.85
0.80
0.74
0.68
0.66
0.65
MAXIMUM ZENER IMPEDANCE
‘B’ SUFFIX ONLY
Z
ZT
@ I
ZT
Z
ZK
@I
ZK
= 0.25mA
OHMS
OHMS
30
30
30
30
29
28
24
23
22
19
17
11
7.0
7.0
5.0
6.0
8.0
8.0
10
17
22
30
13
15
16
17
19
21
23
25
29
33
35
41
44
49
58
70
80
93
105
125
150
170
185
230
270
330
370
400
500
750
900
1100
1300
1500
1700
1900
2200
2400
2500
1200
1250
1300
1400
1600
1600
1700
1900
2000
1900
1600
1600
1600
1000
750
500
500
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
700
700
800
900
1000
1100
1300
1400
1400
1600
1700
2000
2200
2300
2600
3000
4000
4500
4500
5000
5500
5500
6000
6500
7000
MCC
MAXIMUM REVERSE
LEAKAGE CURRENT
I
R
@
V
R
µA
VOLTS
100
100
75
75
50
25
15
10
5.0
5.0
5.0
5.0
5.0
5.0
3.0
3.0
3.0
3.0
3.0
3.0
2.0
1.0
0.5
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
2.0
2.0
3.0
3.5
4.0
5.0
6.0
6.5
6.5
7.0
8.0
8.4
9.1
9.9
10
11
12
13
14
14
15
17
18
19
21
21
23
25
27
30
33
36
39
43
46
47
52
56
62
68
69
76
84
91
99
106
114
122
129
137
144
152
MAX. ZENER VOLTAGE
TEMP COEFFICIENT ‘B’
SUFFIX ONLY
% /
°C
-0.085
-0.085
-0.080
-0.080
-0.075
-0.070
-0.065
-0.060
±0.055
±0.030
±0.030
+0.038
+0.038
+0.045
+0.050
+0.058
+0.062
+0.065
+0.068
+0.075
+0.076
+0.077
+0.079
+0.082
+0.082
+0.083
+0.084
+0.085
+0.086
+0.086
+0.087
+0.088
+0.089
+0.090
+0.091
+0.091
+0.092
+0.093
+0.094
+0.095
+0.095
+0.096
+0.096
+0.097
+0.097
+0.097
+0.098
+0.098
+0.099
+0.099
+0.110
+0.110
+0.110
+0.110
+0.110
+0.110
+0.110
+0.110
+0.110
+0.110
+0.110
NOTE 1: Table as shown lists type numbers, which indicate a tolerance of ±20% with guaranteed limits on only Vz, I
R
, and V
F
. Devices with
guaranteed limits on all six parameters are indicated by suffix “A” for ±10%, “B” for ±5%, “C” for ±2%, and “D” for ±1% tolerance
NOTE 2: The electrical characteristics are measured after allowing the device to stabilize for 20 seconds.
NOTE 3: Temperature coefficient (á
VZ
). Test conditions for temperature coefficient are as follows:
a.
I
ZT
= 7.5mA, T
I
= 25
o
C T
2
= 125
o
C (1N5221 thru 1N5242)
b.
I
ZT
= Rated I
ZT
, T
I
= 25
o
C, T
2
= 125
o
C (1N5243 thru 1N5281)
Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient temperature.
Revision: 3
www.mccsemi.com
2002/12/31
FPGA/CPLD
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