EQTD34E3G-28.800M
REGULATORY COMPLIANCE
2011/65 +
2015/863
(Data Sheet downloaded on Sep 23, 2020)
191 SVHC
ITEM DESCRIPTION
Temperature Compensated Quartz Crystal Clock Oscillators TCXO Clipped Sinewave 2.8Vdc 4 Pad 2.5mm x 3.2mm Ceramic
Surface Mount (SMD) 28.800MHz 0°C to +70°C
ELECTRICAL SPECIFICATIONS
Nominal Frequency
Frequency Stability
Frequency Stability vs. Frequency
Tolerance
Frequency Stability vs. Input Voltage
Frequency Stability vs. Load
Frequency Stability vs. Reflow
Frequency Stability vs. Aging
Operating Temperature Range
Supply Voltage
Input Current
Output Voltage
Load Drive Capability
Output Logic Type
Phase Noise
28.800MHz
±2.0ppm Maximum (Inclusive of Operating Temperature Range, at Vdd=2.8Vdc)
±1.0ppm Maximum (at 25°C ±2°C, at Vdd=2.8Vdc, Pre-Reflow)
±0.2ppm Maximum (±5%)
±0.2ppm Maximum (±1kOhm//±1pF)
±1ppm Maximum (at 25°C, 24 hours after reflow, 1 time)
±1ppm/Year Maximum (at 25°C)
0°C to +70°C
2.8Vdc ±5%
2.5mA Maximum
0.8Vp-p Clipped Sinewave Minimum (External DC-Cut capacitor required, 1000pF recommended)
10kOhms//10pF
Clipped Sinewave
All Values are Typical
-89dBc/Hz at 10Hz Offset
-115dBc/Hz at 100Hz Offset
-138dBc/Hz at 1kHz Offset
-150dBc/Hz at 10kHz Offset
0.7pSec Typical, 1pSec Maximum (Fj = 12kHz to 20MHz (Random))
2mSec Maximum
-40°C to +85°C
RMS Phase Jitter
Start Up Time
Storage Temperature Range
ENVIRONMENTAL & MECHANICAL SPECIFICATIONS
ESD Susceptibility
Fine Leak Test
Flammability
Gross Leak Test
Mechanical Shock
Moisture Resistance
Moisture Sensitivity
Resistance to Soldering Heat
Resistance to Solvents
Solderability
Temperature Cycling
Vibration
MIL-STD-883, Method 3015, Class 1, HBM: 1500V
MIL-STD-883, Method 1014, Condition A
UL94-V0
MIL-STD-883, Method 1014, Condition C
MIL-STD-883, Method 2002, Condition B
MIL-STD-883, Method 1004
J-STD-020, MSL 1
MIL-STD-202, Method 210, Condition K
MIL-STD-202, Method 215
MIL-STD-883, Method 2003
MIL-STD-883, Method 1010, Condition B
MIL-STD-883, Method 2007, Condition A
www.ecliptek.com | Specification Subject to Change Without Notice | Revision A 06/23/2015 | Page 1 of 6
Ecliptek, LLC
5458 Louie Lane, Reno, NV 89511
1-800-ECLIPTEK or 714.433.1200
EQTD34E3G-28.800M
Test Circuit for Clipped Sinewave Output
Oscilloscope
Frequency
Counter
Current
Meter
Power
Supply
Voltage
Meter
0.01µF
(Note 1)
Supply
Voltage
(V
DD
)
Probe
(Note 2)
Output
1000pF
0.1µF
(Note 1)
Ground
Ground
R
L
= 10kOhms
C
L
= 10pF
(Note 3)
Note 1: An external 0.01µF bypass capacitor in parallel with a 0.1µF high frequency ceramic bypass
capacitor close (less than 2mm) to the package ground and supply voltage pin is required.
Note 2: A low input capacitance (<12pF), 10X attenuation factor, high impedance (>10Mohms), and
high bandwidth (>300MHz) passive probe is recommended.
Note 3: Capacitance value C
L
includes sum of all probe and fixture capacitance.
www.ecliptek.com | Specification Subject to Change Without Notice | Revision A 06/23/2015 | Page 4 of 6
Ecliptek, LLC
5458 Louie Lane, Reno, NV 89511
1-800-ECLIPTEK or 714.433.1200
EQTD34E3G-28.800M
Recommended Solder Reflow Methods
High Temperature Infrared/Convection
T
S
MAX to T
L
(Ramp-up Rate)
Preheat
- Temperature Minimum (T
S
MIN)
- Temperature Typical (T
S
TYP)
- Temperature Maximum (T
S
MAX)
- Time (t
S
MIN)
Ramp-up Rate (T
L
to T
P
)
Time Maintained Above:
- Temperature (T
L
)
- Time (t
L
)
Peak Temperature (T
P
)
Target Peak Temperature (T
P
Target)
Time within 5°C of actual peak (t
p
)
Ramp-down Rate
Time 25°C to Peak Temperature (t)
Moisture Sensitivity Level
Additional Notes
3°C/Second Maximum
150°C
175°C
200°C
60 - 180 Seconds
3°C/Second Maximum
217°C
60 - 150 Seconds
260°C Maximum for 10 Seconds Maximum
250°C +0/-5°C
20 - 40 Seconds
6°C/Second Maximum
8 Minutes Maximum
Level 1
Temperatures shown are applied to body of device.
www.ecliptek.com | Specification Subject to Change Without Notice | Revision A 06/23/2015 | Page 5 of 6
Ecliptek, LLC
5458 Louie Lane, Reno, NV 89511
1-800-ECLIPTEK or 714.433.1200
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