For latest revision, visit our website at www.te.com /docum ents.
For Regional Custom er Service, visit our website at www.te.com
1 of 7
LOC B
* Tradem ark TE Connectivity, TE connectivity (logo), and TE (logo) are tradem arks. Other logos, product and/or Com pany nam es m ay be tradem arks of their respective owners.
108-1285
3.2.
Material
!
!
!
!
3.3.
Contact: Brass and tin plated brass
Housing: 6/6 Nylon, UL94V-2 or UL94V-0
Tabs (for test purposes): Brass, tem per 2 CDA 26000 com plies with UL 310 Para 5.2
W ire (for test purposes): Com plies with UL 310 Para 7.3., 600 volt rating
Ratings
!
!
!
Voltage: 600 volts AC
Operating Tem perature: -40 to 105°C
UL/CSA 150°C
|
|
3.4.
Perform ance and Test Description
Product is designed to m eet the electrical, m echanical and environm ental perform ance requirem ents
specified in Figure 1. Unless otherwise specified, all tests are perform ed at am bient tem perature.
3.5.
Test Requirem ents and Procedures Sum m ary
Test Description
Requirem ent
Meets requirem ents of product
drawing and Application
Specification 114-2124.
ELECTRICAL
Procedure
Visual, dim ensional and functional
per applicable quality inspection
plan.
Exam ination of product.
|
|
Term ination resistance, dry circuit.
1 m illiohm m axim um initial.
5 m illiohm s m axim um final.
TE Spec 109-6-1.
Subject m ated contacts assem bled
in housing to 50 m illivolt open circuit
at 100 m illiam pere m axim um .
|
Dielectric withstanding, Condition A. One m inute hold with no breakdown TE Spec 109-29-1 and UL 310, 600
or flashover.
volt rating.
3400 volts AC at sea level.
Test wired term inals in num ber 12
lead shot after coating end with
insulating m aterial.
Dielectric withstanding, Condition C. One m inute hold with no breakdown TE Spec 109-29-1 and UL 310, 600
or flashover.
volt rating.
3000 volts AC at sea level.
Test on a flat m etal plate.
See Figure 3.
Dielectric withstanding, receptacle,
tab entry portion.
Applied Voltage
(volts AC)
250
1000
187
1000
110
600
One m inute hold with no breakdown
or flashover.
Maxim um tem perature rise at
specified current: 30°C initial, 45°C
m axim um final.
See Figure 5.
Figure 1 (continued)
Term inal Size
TE Spec 109-29-1.
Test wired term inals on a flat m etal
plate.
See Figure 4.
|
|
|
Tem perature rise vs current.
TE Spec 109-45-1.
Measure tem perature rise vs
current.
Rev D
2 of 7
108-1285
Test Description
|
Current cycling.
Requirem ent
Tem perature rise, ∆ tem perature
rise, and voltage drop.
See Figure 5.
24 and 500 cycles.
MECHANICAL
|
Crim p tensile.
W ire Size
(AW G)
22
20
18
16
14
12
10
See Note.
Crim p Tensile
(Lbs m inim um )
8
13
20
30
50
70
80
TE Spec 109-16.
Determ ine crim p tensile at a
m axim um rate of 1 inch per m inute.
Procedure
TE Spec 109-51, Condition F,
Test Method 4.
Subject m ated contacts to 500
cycles for 45 m inutes ON and 15
m inutes OFF.
|
Durability.
TE Spec 109-27.
Mate and unm ate connector
assem blies for 6 cycles at a
m axim um rate of 600 cycles per
hour.
|
Contact retention, Condition A.
Contacts shall not dislodge from its TE Spec 109-30.
insulator at a force of less than 10
Measure force necessary to pull a
pounds m inim um for 187 and 250
fully seated contact out of housing.
product, and 8 pounds m inim um for
110 product.
Contacts shall not dislodge from its
insulator.
See Figure 6.
UL-310.
Apply a 5 pound force to a fully
seated contact for 1 m inute.
TE Spec 109-42.
Engage and disengage term inals
and tabs 6 tim es.
|
|
|
|
Contact retention, Condition B.
Engagem ent/disengagem ent force.
ENVIRONMENTAL
|
Hum idity/tem perature cycling.
See Note.
TE Spec 109-23-3, Condition B.
Subject m ated connectors to 10
hum idity/tem perature cycles
between 25 and 65°C and 95% RH.
TE Spec 109-43, Test level 9,
Test duration I.
Subject m ated connectors to 118 ±
2°C for 33 days.
Subject wired term inals to 136°C for
7 days.
Subject wired term inals to 180°C for
7 days.
|
|
|
|
|
|
Tem perature life.
See Note.
Heat age, Condition A.
Heat age, Condition B.
See Note.
See Note.
NOTE
Shall meet visual requirements, show no physical damage, and shall meet requirements of
additional tests as specified in the test sequence in Figure 2.