This product complies with the RoHS Directive (EU 2002/95/EC).
PNJ4K01F
Bipolar Integrated Circuit with Photodetection Function
For brightness control systems
Features
Peak sensitivity wavelength: 560 nm
Output ratio of incandescent light and
fluorescent
light: 1.1 (typ.)
Small, thin type package: 1.55 mm
×
1.5 mm
×
0.53 mm
Surface-mouting type for reflow soldering
Absolute Maximum Ratings
T
a
= 25°C
Parameter
Operating supply voltage
Power dissipation
Operating ambient temperature
Storage temperature
Symbol
V
CC
P
D
T
opr
T
stg
Rating
– 0.5 to +7.0
35
–30 to +85
–40 to +100
Unit
V
mW
°C
°C
Electro-Optical Characteristics
T
a
= 25°C±3°C, V
CC
= 3 V
Parameter
Operating supply voltage
Saturation voltage
*3
Supply current
*1
Output current 1
*1, *3
Output current 2
*2, *3
Output current 3
*2, *3
Output current ratio
Drain current
Peak sensitivity wavelength
Rise time
*4
Fall time
*4
Delay time
*4
Storage time
*4
Symbol
V
CC
V
O(sat)
I
CC
I
O1
I
O2
I
O3
I
O1
/ I
O3
I
D
λ
PD
t
r
t
f
t
d
t
s
R
L
= 5.1 kW
E
V
= 0 lx
E
V
= 100 lx, R
L
= 100 kW
E
V
= 1 000 lx, R
L
= 1 kW
E
V
= 100 lx
E
V
= 10 lx
E
V
= 100 lx
29.0
2.5
25.0
Conditions
Min
1.4
2.60
2.94
480
48.0
4.3
43.0
1.1
10
560
100
300
50
5
1 000
1 000
Typ
Max
5.5
3.00
920
90.0
7.9
79.0
1.65
100
Unit
V
V
mA
mA
mA
mA
nA
nm
ms
ms
ms
ms
Note) *1: Light source is CIE standard A light source. (Incandescent lamp)
*2: Light source is
fluorescence
light.
*3: Output current measurement circuit
V
CC
Light source
PNJ4K01F
A
I
OUT
*4: Switching time measurement method
V
CC
White LED
PNJ4K01F
I
OUT
R
L
t
d
Publication date: October 2010
Ver. AEK
t
r
t
f
t
s
LED pulse
90%
10%
1
Request for your special attention and precautions in using the technical information and
semiconductors described in this book
(1)
If any of the products or technical information described in this book is to be exported or provided to non-residents, the laws and
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Consult our sales staff in advance for information on the following applications:
–
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Standards in advance to make sure that the latest specifications satisfy your requirements.
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defect which may arise later in your equipment.
Even when the products are used within the guaranteed values, take into the consideration of incidence of break down and failure
mode, possible to occur to semiconductor products. Measures on the systems such as redundant design, arresting the spread of fire
or preventing glitch are recommended in order to prevent physical injury, fire, social damages, for example, by using the products.
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