Philips Semiconductors Products
Product specification
13–input NAND Gate
FAST 74F133
FAST Products
PRODUCT SPECIFICATION
TYPE
74F133
TYPICAL PROPAGATION
DELAY
4.0ns
TYPICAL SUPPLY CURRENT
(TOTAL)
2.0 mA
ORDERING INFORMATION
ORDER CODE
COMMERCIAL RANGE
DESCRIPTION
T
amb
= 0
°
C to +70
°
C
16–pin plastic DIP
16–pin plastic SO
N74F133N
N74F133D
V
CC
= 5V
±
10%,
INDUSTRIAL RANGE
T
amb
= –40
°
C to +85
°
C
I74F133N
I74F133D
V
CC
= 5V
±
10%,
INPUT AND OUTPUT LOADNG AND FAN OUT TABLE
PINS
D
O
- D
12
Data inputs
DESCRIPTION
74F (U.L.)
HIGH/LOW
1.0/1.0
50/33
LOAD VALUE
HIGH/LOW
20µA/0.6mA
1.0mA/20mA
Q
Data output
Note to input and output loading and fan out table
1. One (1.0) FAST unit load is defined as: 20µA in the high state and 0.6mA in the low state.
PIN CONFIGURATION
LOGIC SYMBOL
LOGIC SYMBOL (IEEE/IEC)
1
2
D
0
D
1
D
2
D
3
D
4
D
5
D
6
GND
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
1
2
3
4
5
6
7
10
11
12
13
14
15
&
V
CC
D
12
D
11
D
10
D
9
D
8
D
7
Q
3
4
5
6
7
10
11
12
13
14
15
9
V
CC
= Pin 16
GND = Pin 8
July 2, 1993
1
853-10219
Philips Semiconductors Products
Product specification
13–input NAND Gate
FAST 74F133
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the
operating free air temperature range.)
SYMBOL
PARAMETER
RATING
UNIT
V
CC
V
IN
I
IN
V
OUT
I
OUT
T
amb
Supply voltage
Input voltage
Input current
Voltage applied to output in high output state
Current applied to output in low output state
Operating free air temperature range
Commercial range
Industrial range
T
stg
Storage temperature range
–0.5 to +7.0
–0.5 to +7.0
–30 to +5
–0.5 to V
CC
40
0 to +70
–40 to +85
–65 to +150
V
V
mA
V
mA
°
C
°
C
°
C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
MIN
V
CC
V
IH
V
IL
I
Ik
I
OH
I
OL
T
amb
Supply voltage
High–level input voltage
Low–level input voltage
Input clamp current
High–level output current
Low–level output current
Operating free air temperature range
Commercial range
Industrial range
0
–40
4.5
2.0
0.8
–18
–1
20
+70
+85
LIMITS
NOM
5.0
MAX
5.5
V
V
V
mA
mA
mA
UNIT
°
C
°
C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
MIN
V
OH
High-level output voltage
V
CC
= MIN, V
IL
= MAX
V
IH
= MIN, I
OH
= MAX
V
OL
Low-level output voltage
V
CC
= MIN, V
IL
= MAX
V
IH
= MIN, I
Ol
= MAX
V
IK
I
I
I
IH
I
IL
I
OS
I
CC
Input clamp voltage
Input current at maximum input voltage
High–level input current
Low–level input current
Short-circuit output current
3
Supply current (total)
I
CCH
I
CCL
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
V
CC
= MAX
V
CC
= MAX
V
CC
= MAX
-60
1.0
2.5
LIMITS
TYP
2
MAX
V
3.4
0.35
0.35
-0.73
0.50
0.50
-1.2
100
20
-0.6
-150
2.0
4.0
V
V
V
V
µA
µA
mA
mA
mA
mA
UNIT
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.5
2.7
NOTES:
1.. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25°C.
3.. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
July 2, 1993
3
Philips Semiconductors Products
Product specification
13–input NAND Gate
FAST 74F133
AC ELECTRICAL CHARACTERISTICS
LIMITS
T
amb
= +25
°
C
SYMBOL
PARAMETER
TEST
CONDITION
V
CC
= +5.0V
C
L
= 50pF,
R
L
= 500
Ω
MIN
t
PLH
t
PHL
Propagation delay
Dn to Qn
Waveform 1
2.0
2.5
TYP
4.0
4.5
MAX
7.0
7.5
T
amb
= 0
°
C to
+70
°
C
T
amb
= –40
°
C to +85
°
C
V
CC
= +5.0V
±
10%
C
L
= 50pF,
R
L
= 500
Ω
MIN
1.5
2.0
MAX
7.5
8.0
ns
UNIT
V
CC
= +5.0V
±
10%
C
L
= 50pF,
R
L
= 500
Ω
MIN
1.5
2.0
MAX
7.5
8.0
AC WAVEFORMS
Dn
V
M
t
PHL
V
M
t
PLH
Q
V
M
V
M
Waveform 1. Propagation delay for data to output
Note to AC Waveforms
1. For all waveforms, V
M
= 1.5V.
TEST CIRCUIT AND WAVEFORMS
V
CC
90%
V
IN
PULSE
GENERATOR
R
T
D.U.T.
V
OUT
NEGATIVE
PULSE
V
M
10%
t
THL (
t
f
)
C
L
R
L
t
TLH (
t
r
)
90%
POSITIVE
PULSE
10%
t
THL (
t
f
)
AMP (V)
90%
V
M
t
w
10%
0V
t
w
V
M
10%
t
TLH (
t
r
)
0V
90%
AMP (V)
Test circuit for totem-pole outputs
V
M
DEFINITIONS:
R
L
= Load resistor;
see AC electrical characteristics for value.
C
L
= Load capacitance includes jig and probe capacitance;
see AC electrical characteristics for value.
R
T
= Termination resistance should be equal to Z
OUT
of
pulse generators.
Input pulse definition
INPUT PULSE REQUIREMENTS
family
amplitude v
M
74F
3.0V
1.5V
rep. rate
1MHz
t
w
t
TLH
t
THL
2.5ns
500ns 2.5ns
July 2, 1993
4
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