Philips Semiconductors
Product specification
Look-ahead carry generator
74F182
FEATURES
•
Provides carry look-ahead across a group of four ALUs
•
Multi-level look-ahead for high speed arithmetic operation over
long word lengths
PIN CONFIGURATION
G1
P1
G0
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
V
CC
P2
G2
Cn
Cn+x
Cn+y
G
Cn+z
DESCRIPTION
The 74F182 is a high speed carry look-ahead generator. It accepts
up to four pairs of active-Low Carry Propagate (P0, P1, P2, P3) and
Carry Generate (G0, G1, G2, G3) signals and an active-High Carry
input (Cn) and provides anticipated active-High carries (Cn+x, Cn+y,
Cn+z) across four groups of binary adders. The 74F182 also has
active-Low Carry Propagate (P) Carry Generate (G) outputs which
may be used for further levels of look-ahead.
The logic equations provided at the outputs are:
Cn+x = G0+P0Cn
Cn+y = G1+P1G0+P1P0Cn
Cn+z = G2+P2G1+P2P1G0+P2P1P0Cn
G = G3+P3G2+P3P2G1+P3P2P1G0
P = P3P2P1P0
The 74F182 can also be used with binary ALUs in an active-Low or
active-High input operand mode. The connections to and from the
ALU to the carry look-ahead generator are identical in both cases.
P0
G3
P3
P
GND
SF00725
TYPE
74F182
TYPICAL
PROPAGATION
DELAY
5.0ns
TYPICAL
SUPPLY CURRENT
(TOTAL)
21mA
ORDERING INFORMATION
ORDER CODE
DESCRIPTION
16-pin plastic DIP
16-pin plastic SO
COMMERCIAL RANGE
V
CC
= 5V
±10%,
T
amb
= 0°C to +70°C
N74F182N
N74F182D
INPUT AND OUTPUT LOADING AND FAN-OUT TABLE
PINS
Cn
G0, G2
G1
G3
P0, P1
P2
P3
Cn+x–Cn+z
G
P
Carry input
Carry generate inputs (active-Low)
Carry generate input (active-Low)
Carry generate input (active-Low)
Carry propagate inputs (active-Low)
Carry propagate input (active-Low)
Carry propagate input (active-Low)
Carry outputs
Carry generate output (active-Low)
Carry propagate output (active-Low)
DESCRIPTION
74FAST (U.L.) HIGH/LOW
2.5/2.0
2.5/14.0
2.5/16.0
2.5/8.0
2.5/8.0
2.5/6.0
2.5/4.0
50/33
50/33
50/33
LOAD VALUE HIGH/LOW
50µA/1.2mA
50µA/8.4mA
50µA/9.6mA
50µA/4.8mA
50µA/4.8mA
50µA/3.6mA
50µA/2.4mA
1.0mA/20mA
1.0mA/20mA
1.0mA/20mA
NOTE:
One (1.0) FAST unit load is defined as: 20µA in the High state and 0.6mA in the Low state.
1991 Apr 15
2
853–1161 02162
Philips Semiconductors
Product specification
Look-ahead carry generator
74F182
LOGIC SYMBOL
4
3
2
1
15
14
6
5
IEC/IEEE SYMBOL
CPG
CI
CP0
C00
CG0
CP1
CG1
C02
CP2
CG2
CP3
CG3
CP
CG
7
10
C01
11
9
12
13
4
3
P0 G0
13
Cn
P1
G1
P2 G2
P3 G3
G
P
10
7
2
1
15
14
6
Cn+x
Cn+y
Cn+z
12
V
CC
= Pin 16
GND = Pin 8
11
9
5
SF00726
SF00727
LOGIC DIAGRAM
G0
P0
Cn
3
4
13
12
Cn+x
G1
P1
1
2
11
Cn+y
G2
P2
14
15
9
Cn+z
G3
P3
5
6
10
G
7
P
V
CC
= Pin 16
GND = Pin 8
SF00724
1991 Apr 15
3
Philips Semiconductors
Product specification
Look-ahead carry generator
74F182
FUNCTION TABLE
INPUTS
Cn
X
L
X
H
X
X
L
X
X
H
X
X
X
L
X
X
X
H
G0
H
H
L
X
X
H
H
X
L
X
X
X
H
H
X
X
L
X
X
X
X
H
X
X
X
L
H
X
X
X
L
NOTES:
H = High voltage level
L = Low voltage level
X = Don’t care
P0
H
X
X
L
X
H
X
X
X
L
X
X
H
X
X
X
X
L
H
H
H
L
X
X
X
H
H
H
X
L
X
X
X
X
H
H
X
X
L
X
H
X
X
X
L
L
X
H
X
X
X
X
L
L
X
X
H
X
X
X
X
L
X
H
X
X
L
H
H
H
H
L
X
X
X
X
H
H
H
X
L
X
X
H
X
X
X
X
L
L
L
X
H
X
X
X
X
L
L
X
X
H
X
L
H
H
H
H
L
X
X
X
H
X
X
X
X
L
L
L
X
X
X
H
L
G1
P1
G2
P2
G3
P3
Cn+x
L
L
H
H
L
L
L
H
H
H
L
L
L
L
H
H
H
H
H
H
H
H
L
L
L
L
H
H
H
H
L
Cn+y
OUTPUTS
Cn+z
G
P
1991 Apr 15
4
Philips Semiconductors
Product specification
Look-ahead carry generator
74F182
APPLICATION
Cn
ALU* G
P
A, B
C18
Cn
Cn+4
ALU* G
P
Cn
ALU* G
P
Cn
Cn+4
ALU* G
P
Cn
ALU* G
P
Cn
ALU* G
P
Cn
Cn+4
ALU*
Cn
Cn+4
ALU*
COUT
(C32)
F
P0 G0 P1 G1 P2 G2 P3 G3
G
C
IN
Cn
74F182
P
Cn+z
Cn
74F182
P0 G0 P1 G1 P2 G2 P3 G3
G
P
Cn+z
Cn+x
Cn+y
Cn+x
Cn+y
SF00728
Figure 1. 32-Bit ALU with Ripple Carry Between 16-Bit Look-Ahead ALUs (*ALUs may be either 74F181 or 74F381)
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free air temperature range.)
SYMBOL
V
CC
V
IN
I
IN
V
OUT
I
OUT
T
amb
T
stg
Supply voltage
Input voltage
Input current
Voltage applied to output in High output state
Current applied to output in Low output state
Operating free-air temperature range
Storage temperature range
PARAMETER
RATING
–0.5 to +7.0
–0.5 to +7.0
–30 to +5
–0.5 to V
CC
40
0 to +70
–65 to +150
UNIT
V
V
mA
V
mA
°C
°C
RECOMMENDED OPERATING CONDITIONS
LIMITS
SYMBOL
V
CC
V
IH
V
IL
I
IK
I
OH
I
OL
T
amb
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Operating free-air temperature range
0
PARAMETER
MIN
4.5
2.0
0.8
–18
–1
20
70
NOM
5.0
MAX
5.5
UNIT
V
V
V
mA
mA
mA
°C
1991 Apr 15
5
Philips Semiconductors
Product specification
Look-ahead carry generator
74F182
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
V
CC
= MIN, V
IL
= MAX,
V
IH
= MIN
V
CC
= MIN, V
IL
= MAX,
V
IH
= MIN
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= MAX, V
I
= 2.7V
Cn
G0, G2
G1
I
IL
Low-level input current
G3, P0, P1
P2
P3
I
OS
I
CC
Short-circuit output current
3
Supply current (total)
I
CCH
I
CCL
V
CC
= MAX
V
CC
= MAX
–60
18
24
V
CC
= MAX, V
I
= 0.5V
LIMITS
MIN
TYP
2
MAX
UNIT
V
3.4
0.30
0.30
–0.73
0.50
0.50
–1.2
250
250
–1.2
–8.4
–9.6
–4.8
–3.6
–2.4
–150
28
36
V
V
V
V
µA
µA
mA
mA
mA
mA
mA
mA
mA
mA
mA
V
OH
High-level output voltage
I
OH
= MAX
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.5
2.7
V
OL
V
IK
I
I
I
IH
Low-level output voltage
Input clamp voltage
Input current at maximum input voltage
High-level input current
I
OL
= MAX
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25°C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
TEST
CONDITION
V
CC
= +5.0V
T
amb
= +25°C
C
L
= 50pF
R
L
= 500Ω
MIN
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
Propagation delay
Cn to Cn+x, Cn+y, Cn+z
Propagation delay
P0, P1, or P2 to Cn+x, Cn+y, Cn+z
Propagation delay
G0, G1, or G2 to Cn+x, Cn+y, Cn+z
Propagation delay
P1, P2, or P3 to G
Propagation delay
Gn to G
Propagation delay
Pn to P
Waveform 2
Waveform 1
Waveform 1
Waveform 2
Waveform 2
Waveform 2
2.5
2.5
2.0
1.5
1.5
1.5
2.0
3.0
1.5
3.0
1.5
2.5
TYP
5.0
5.0
5.0
3.5
4.0
3.0
7.0
5.0
5.0
5.0
3.5
4.0
MAX
8.0
7.5
7.0
5.0
7.5
5.0
10.0
7.0
7.0
7.0
6.0
6.0
V
CC
= +5.0V
±
10%
T
amb
= 0°C to +70°C
C
L
= 50pF
R
L
= 500Ω
MIN
2.5
2.5
1.5
1.5
1.5
1.5
1.5
2.5
1.5
2.5
1.5
2.5
MAX
8.5
8.5
8.0
6.0
8.5
5.5
11.0
8.0
7.5
8.0
7.5
6.5
ns
ns
ns
ns
ns
ns
SYMBOL
PARAMETER
UNIT
1991 Apr 15
6
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