The SmartRack 45U Standard-Depth 4-Post Premium Open Frame Rack has NO doors and NO side panels.
The 'EXP' version is an expansion model used when several cabinets are bayed together. Its integrated baying
tabs make it easy to combine multiple enclosures in rows for data center applications. This enclosure is also
compatible with hot-aisle/cold-aisle configurations.
Package Includes
SmartRack 45U Standard-Depth
4-Post Premium Open Frame
Rack
Owner's manual
The SR45UBEXPND houses 3000 lb of standard 19-inch rack equipment in 45U. Its front and rear pairs of vertical rails have square mounting holes that are
adjustable in quarter-inch increments from 4 to 37 inches. Adjustment is quick and an easy-view depth index ensures consistent rail placement without
requiring time-consuming measurements. Each rack space within the enclosure is numbered for ready reference.
Two of the adjustable vertical mounting rails support toolless button-mount 0U installation of up to four compatible PDUs and cable managers. This feature
makes it easier to route cabling to rack equipment and reduces cord clutter.
All components of the SR45UBEXPND are grounded to the enclosure frame. Front and rear threaded grounding points are provided for connection to the
facility earth ground.
To simplify deployment, the SR45UBEXPND comes with preinstalled casters that enable it to be easily maneuvered into the desired location, where it can be
secured by adjusting the preinstalled levelers. Note: the casters are intended for minor position adjustments and are not designed for moving the enclosure
over long distances.
The SR45UBEXPND comes with a 5-year product warranty. As part of the SmartRack family, the SR45UBEXPND is compatible with Tripp Lite’s extensive
range of rackmount accessories, enabling you to customize your solution to meet any requirement.
Features
Ships fully assembled for rapid deployment and roll into place on heavy-duty pre-installed casters (casters are removable)
Front and rear sets of equipment mounting rails adjust in 1/4" increments. Adjustment is quick and convenient. The easy-view depth index ensures
consistent rail placement without requiring time-consuming measurements.
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consistent rail placement without requiring time-consuming measurements.
Toolless accessory mounting rails (2 rails per enclosure) include slots for quick installation of compatible PDUs and vertical cable managers. Mounting
slots are arranged in an industry-standard pattern compatible with a wide variety of accessories. Each rail can accommodate two vertical PDUs or cable
managers side-by-side (four items per enclosure).
Mounting hardware of 50 pieces of M6 cage nuts and 50 pieces of M6 screws included
Textured powder coat finish for tough resistance to environmental concerns such as deployment in warehouses
Maximum usable internal depth of 37 inches/94 cm (front to rear rail).
Weight ratings of 3000 lb stationary and 2250 lb rolling.
Built in baying tabs allow premium open frame racks to be combined securely in rows. Center-to-center width can be set at 600mm or 24" to match
standard data center floor tiles.
Leveling feet extend to allow premium open frame racks to be positioned on uneven floors. Levelers are removable.
Convenient grounding system. All components are grounded to the premium open frame rack structure which includes multiple connections for facility
ground.
Open bottom for cable access.
Included stabilizing brackets are used for shipment and can be reattached at the bottom of the premium open frame rack on the inside or outside of the
rack.
Compatibility with all cable management accessories.
not imply any affiliation with or endorsement by them. Tripp Lite has a policy of continuous improvement. Specifications are subject to change without notice.
Tripp Lite uses primary and third-party agencies to test its products for compliance with standards. See a list of Tripp Lite's testing agencies:
许多MEMS器件,像加速度计、机械共振器件等,都需要在真空环境下才能实现设计功能。然而检验封装腔体是否达到了所要求的真空程度一直一来都是个棘手的问题。密歇根大学Khalil Najafi教授研究小组的研究人员最近开发出一种用微机械制造方法实现,可以在封装的封帽上完成皮拉尼真空测量的方案。使用这种方法可以完成封装的氦气检漏测试,该成果已发表在IEEE Transactions on Advan...[详细]