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NDS8433

产品描述Single P-Channel Enhancement Mode Field Effect Transistor
产品类别分立半导体    晶体管   
文件大小284KB,共10页
制造商Fairchild
官网地址http://www.fairchildsemi.com/
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NDS8433概述

Single P-Channel Enhancement Mode Field Effect Transistor

NDS8433规格参数

参数名称属性值
是否Rohs认证不符合
厂商名称Fairchild
零件包装代码SOT
包装说明SO-8
针数8
Reach Compliance Codeunknow
ECCN代码EAR99
Is SamacsysN
配置SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压20 V
最大漏极电流 (ID)5.2 A
最大漏源导通电阻0.055 Ω
FET 技术METAL-OXIDE SEMICONDUCTOR
JESD-30 代码R-PDSO-G8
JESD-609代码e0
元件数量1
端子数量8
工作模式ENHANCEMENT MODE
最高工作温度150 °C
封装主体材料PLASTIC/EPOXY
封装形状RECTANGULAR
封装形式SMALL OUTLINE
峰值回流温度(摄氏度)NOT SPECIFIED
极性/信道类型P-CHANNEL
最大功率耗散 (Abs)1 W
认证状态Not Qualified
表面贴装YES
端子面层Tin/Lead (Sn/Pb)
端子形式GULL WING
端子位置DUAL
处于峰值回流温度下的最长时间NOT SPECIFIED
晶体管应用SWITCHING
晶体管元件材料SILICON
Base Number Matches1

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June 1996
NDS8433
Single P-Channel Enhancement Mode Field Effect Transistor
General Description
These P-Channel enhancement mode power field effect
transistors are produced using Fairchild's proprietary, high cell
density, DMOS technology. This very high density process is
especially tailored to minimize on-state resistance and provide
superior switching performance. These devices are particularly
suited for low voltage applications such as notebook computer
power management and other battery powered circuits where
fast switching, low in-line power loss, and resistance to
transients are needed.
Features
-5.2A, -20V. R
DS(ON)
= 0.055
@ V
GS
= -4.5V
R
DS(ON)
= 0.075
@ V
GS
= -2.7V.
High density cell design for extremely low R
DS(ON).
High power and current handling capability in a widely used
surface mount package.
____________________________________________________________________________________________
5
6
7
4
3
2
1
8
Absolute Maximum Ratings
Symbol
V
DSS
V
GSS
I
D
P
D
Parameter
Drain-Source Voltage
Gate-Source Voltage
Drain Current - Continuous
- Pulsed
T
A
= 25°C unless otherwise noted
NDS8433
-20
-8
(Note 1a)
Units
V
V
A
-5.2
-20
Maximum Power Dissipation
(Note 1a)
(Note 1b)
(Note 1c)
2.5
1.2
1
-55 to 150
W
T
J
,T
STG
Operating and Storage Temperature Range
°C
THERMAL CHARACTERISTICS
R
θ
JA
R
θ
JC
Thermal Resistance, Junction-to-Ambient
Thermal Resistance, Junction-to-Case
(Note 1a)
(Note 1)
50
25
°C/W
°C/W
© 1997 Fairchild Semiconductor Corporation
NDS8433 Rev. B1

 
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