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NDS8926

产品描述Dual N-Channel Enhancement Mode Field Effect Transistor
产品类别分立半导体    晶体管   
文件大小283KB,共10页
制造商Fairchild
官网地址http://www.fairchildsemi.com/
下载文档 详细参数 全文预览

NDS8926概述

Dual N-Channel Enhancement Mode Field Effect Transistor

NDS8926规格参数

参数名称属性值
是否无铅含铅
是否Rohs认证不符合
厂商名称Fairchild
零件包装代码SOT
包装说明SMALL OUTLINE, R-PDSO-G8
针数8
Reach Compliance Codeunknow
ECCN代码EAR99
配置SEPARATE, 2 ELEMENTS WITH BUILT-IN DIODE
最小漏源击穿电压20 V
最大漏极电流 (Abs) (ID)5.5 A
最大漏极电流 (ID)5.5 A
最大漏源导通电阻0.035 Ω
FET 技术METAL-OXIDE SEMICONDUCTOR
JESD-30 代码R-PDSO-G8
JESD-609代码e0
元件数量2
端子数量8
工作模式ENHANCEMENT MODE
最高工作温度150 °C
封装主体材料PLASTIC/EPOXY
封装形状RECTANGULAR
封装形式SMALL OUTLINE
峰值回流温度(摄氏度)NOT SPECIFIED
极性/信道类型N-CHANNEL
最大功率耗散 (Abs)2 W
最大脉冲漏极电流 (IDM)20 A
认证状态Not Qualified
表面贴装YES
端子面层Tin/Lead (Sn/Pb)
端子形式GULL WING
端子位置DUAL
处于峰值回流温度下的最长时间NOT SPECIFIED
晶体管应用SWITCHING
晶体管元件材料SILICON

文档预览

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July 1996
NDS8926
Dual N-Channel Enhancement Mode Field Effect Transistor
General Description
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild's proprietary, high cell
density, DMOS technology. This very high density process is
especially tailored to minimize on-state resistance and provide
superior switching performance. These devices are particularly
suited for low voltage applications such as DC motor control
and DC/DC conversion where fast switching, low in-line power
loss, and resistance to transients are needed.
Features
5.5 A, 20 V. R
DS(ON)
= 0.035
@ V
GS
= 4.5 V
R
DS(ON)
= 0.045
@ V
GS
= 2.7 V.
High density cell design for extremely low R
DS(ON)
.
High power and current handling capability in a widely used
surface mount package.
Dual MOSFET in surface mount package.
___________________________________________________________________________________________
5
4
3
2
1
6
7
8
Absolute Maximum Ratings
T
A
= 25°C unless otherwise note
Symbol
V
DSS
V
GSS
I
D
P
D
Parameter
Drain-Source Voltage
Gate-Source Voltage
Drain Current - Continuous
- Pulsed
Power Dissipation for Dual Operation
Power Dissipation for Single Operation
(Note 1a)
(Note1b)
(Note1c)
(Note 1a)
NDS8926
20
8
5.5
20
2
1.6
1
0.9
-55 to 150
Units
V
V
A
W
T
J
,T
STG
Operating and Storage Temperature Range
°C
THERMAL CHARACTERISTICS
R
θ
JA
R
θ
JC
Thermal Resistance, Junction-to-Ambient
Thermal Resistance, Junction-to-Case
(Note 1a)
78
40
°C/W
°C/W
(Note 1)
© 1997 Fairchild Semiconductor Corporation
NDS8926 Rev. D2

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