R&E International
A Subsidiary of Microchip Technology Inc.
RE46C143
CMOS Photoelectric Smoke Detector ASIC with Interconnect
Product Specification
General Description
The RE46C143 is low power CMOS photoelectric type
smoke detector IC. With minimal external components
this circuit will provide all the required features for a
photoelectric type smoke detector.
The design incorporates a gain selectable photo
amplifier for use with an infrared emitter/detector pair.
An internal oscillator strobes power to the smoke
detection circuitry for 100us every 8.1 seconds to keep
standby current to a minimum. If smoke is sensed the
detection rate is increased to verify an alarm condition.
A high gain mode is available for push button chamber
testing.
A check for a low battery condition and chamber
integrity is performed every 40 seconds when in
standby. The alarm horn pattern utilizes a 75% duty
cycle.
An interconnect pin allows multiple detectors to be
connected such that when one units alarms, all units
will sound.
The RE46C143 is recognized by Underwriters
Laboratories for use in smoke detectors that comply
with specification UL217 and UL268.
Features
•
•
•
•
•
•
•
•
•
•
Internal Power On Reset
Low Quiescent Current Consumption
Available in 16L PDIP, 16L N SOIC or 16L W SOIC
ESD Protection on all Pins
Interconnect up to 40 Detectors
75% Duty Cycle Horn Pattern
Low Battery and Chamber Test
Compatible with Motorola MC145010
UL Recognized per File S24036
Available in Standard Packaging or RoHS
Compliant Pb Free Packaging.
Pin Configuration
C1
C2
DETECT
STROBE
VDD
IRED
IO
HORNB
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
TEST
LBSET
VSS
ROSC
COSC
LED
FEED
HORNS
ABSOLUTE MAXIMUM RATINGS
PARAMETER
Supply Voltage
Input Voltage Range Except FEED, IO
FEED Input Voltage Range
IO Input Voltage Range
Input Current except FEED
Operating Temperature
Storage Temperature
Maximum Junction Temperature
SYMBOL
V
DD
V
in
V
infd
V
io1
I
in
T
A
T
STG
T
J
VALUE
12.5
-.3 to V
dd
+.3
-10 to +22
-.3 to +17
10
-25 to 75
-55 to 125
150
UNITS
V
V
V
V
mA
°C
°C
°C
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are
stress ratings only and operation at these conditions for extended periods may affect device reliability.
This product utilizes CMOS technology with static protection; however proper ESD prevention procedures should be used when
handling this product. Damage can occur when exposed to extremely high static electrical charge.
© 2009 Microchip Technology Inc.
DS22178B-page 1
RE46C143
CMOS Photoelectric Smoke Detector ASIC with Interconnect
Product Specification
R&E International
A Subsidiary of Microchip Technology Inc.
DC Electrical Characteristics at TA = -25° to 75°C, VDD=9V, Typical Application (unless otherwise noted)
Parameter
Supply Voltage
Supply Current
Symbol
V
DD
I
DD1
I
DD2
I
DD3
I
DD4
Test
Pin
5
5
5
5
5
10
7
16
10
7
16
1,2,3
12,15
16
10
1,2
3,12,15
10
16
7
7
11,13
11,13
Test Conditions
Operating
Configured as in Figure 2,
COSC=VSS
Configured as in Figure 2,
VDD=12V, COSC=VSS
Configured as in Figure 2,
STROBE on, IRED off, VDD=12V
Configured as in Figure 2,
STROBE on, IRED on, VDD=12V,
Note 1
FEED
No Local Alarm, IO as an Input
TEST
FEED
No Local Alarm, IO as an Input
TEST
VDD=12V, COSC=12V, STROBE
active
VDD=12V, Vin=VSS
VDD=12V, Vin=VSS
FEED=-10V
VDD=12V, Vin=VDD, STROBE
active
VDD=12V, Vin=VDD
FEED=22V
Vin=VDD
Vin=VDD
Vin=17V, VDD=12
Output Off, Output=VSS
Output Off, Output=VDD
Min
6
Limits
Typ
Max
12
4
5.5
6
8
2
3
Units
V
uA
uA
mA
mA
V
V
V
Input Voltage High
V
IH1
V
IH2
V
IH4
6.2
3.2
8.5
4.5
Input Voltage Low
V
IL1
V
IL2
V
IL4
4.5
2.7
1.5
7
-100
-100
-1
-50
100
100
50
V
V
V
nA
nA
uA
uA
nA
nA
uA
uA
uA
uA
uA
uA
Input Leakage Low
I
IL1
I
IL2
I
IL3
I
LFD
Input Leakage High
I
IH1
I
IH2
I
HFD
Input Pull Down Current
I
PD1
I
PDIO1
I
PDIO2
.25
20
10
80
140
-1
1
Output Leakage Current
Low
Output Leakage Current
High
I
OZL1
I
OZH1
Note 1: Does not include Q3 emitter current.
© 2009 Microchip Technology Inc.
DS22178B-page 2
RE46C143
CMOS Photoelectric Smoke Detector ASIC with Interconnect
Product Specification
R&E International
A Subsidiary of Microchip Technology Inc.
DC Electrical Characteristics (continued) at TA= -25° to 75°, VDD=9V, Typical Application (unless
otherwise noted)
Parameter
Output Voltage Low
Symbol
V
OL1
V
OL2
V
OL3
Test
Pin
8,9
13
11
8,9
7
7
5
4
4
6
6
1,2,3
-
4
6
4,5
6,5
Test Conditions
Iol=16mA, VDD=6.5V
Iol=5mA, VDD=6.5V
Iol=10mA, VDD=6.5V
Ioh=-16mA, VDD=6.5V
Alarm, Vio=Vdd-2V or Vio=0V
At Conclusion of Local Alarm or
Test, Vio=1V
R14=100K, R15=47K, ILed=10mA
STROBE off, VDD=12V,
Iout=-1uA
STROBE on, VDD=9V
Iout= 100uA to 500uA
IRED off, VDD=12V, Iout=1uA
IRED on, VDD=9V
Iout=0 to -6mA, Ta=25C
Local smoke, Push to Test or
Chamber Test, Note 1
Internal Reference
VDD=6V to 12V, STROBE Output
Voltage
VDD=6V to 12V, IRED Output
Voltage
Active, VDD=6V to 12V
Active, VDD=6V to 12V
Min
Limits
Typ
Max
1
.5
.6
Units
V
V
V
V
mA
mA
Output Voltage High
Output Current
V
Oh1
I
IOH1
I
IODMP
5.5
-4
5
6.9
V
DD
-
.1
V
DD
-
5.3
2.25
.5
V
DD
-
3.85
.01
.3
-50
-30
7.2
7.5
-16
Low Battery Alarm Voltage
Output Voltage
V
LB
V
STOF
V
STON
V
IREDOF
V
IREDON
V
V
V
DD
-
5
3.1
V
DD
-
4.7
.1
3.75
V
DD
-2
V
DD
-
3.15
V
V
V
V
V
%/ºC
%/ºC
dB
dB
Common Mode Voltage
Smoke Compare
Reference
Temperature Coefficient
V
CM1
V
ref
TC
ST
TC
IRED
Line Regulation
ΔV
STON
ΔV
IREDON
Note 1: Not production tested
Typical values are for design information and are not guaranteed.
Limits over the specified temperature range are not production tested and are based on characterization data.
© 2009 Microchip Technology Inc.
DS22178B-page 3
RE46C143
CMOS Photoelectric Smoke Detector ASIC with Interconnect
Product Specification
R&E International
A Subsidiary of Microchip Technology Inc.
AC Electrical Characteristics at TA =-25° to 75°, VDD=9V, VSS=0V, Component Values from Figure 2 ;
R9=100KΩ, R12=10MΩ, C5= 1.5nF(unless otherwise noted)
Test
Pin
12
11,4
11
11
11
4,6
4,6
4,6
4,6
4,6
4,6
4,6
6
8,9
8,9
8,9
8,9
7
7
7
7
Parameter
Oscillator Period
LED and STROBE On Time
LED Period
Symbol
T
POSC
T
ON1
T
PLED1
T
PLED2
T
PLED4
Test Conditions
No Alarm Condition,
Note 2
Operating
Standby, No Alarm
Local Alarm Condition
Remote Alarm Only
Standby, No Alarm
Standby, After 1 Valid Smoke
Sample
Standby, After 2 Consecutive Valid
Smoke Samples
In Local Alarm – (3 Consecutive
Valid Smoke Samples)
In Remote Alarm
Pushbutton Test
Chamber Test or Low Battery
Test, no Alarms
Operating,
Note 2
Operating, Alarm Condition, Note 1
Low Battery or Failed Chamber
Test , No Alarm
Operating, Alarm Condition, Note 1
Low Battery or Failed Chamber
Test, No Alarm
At Conclusion of Local Alarm or
Test
From Start of Local Alarm to IO
Active
IO pulse width guaranteed to be
filtered. IO as Input, No Local
Alarm
No Local Alarm, From IO Active
Horn Active
Min
9.4
9.4
38
.6
9.7
2.42
1.21
1.21
9.7
Limits
Typ
Max
10.5
10.5
43
.67
11.5
11.5
47
.74
11.8
2.96
1.47
1.47
11.8
Units
mS
mS
S
S
S
S
S
S
S
S
mS
LED IS NOT ON
STROBE and IRED Pulse
Period
T
PER1
T
PER1A
T
PER1B
T
PER2
T
PER3
T
PER4
T
PER5
10.5
2.7
1.33
1.33
10.5
336
39
94
227
9.5
76
39
.91
0
104
252
10.5
84
43
47
115
277
11.5
92
47
1.46
S
uS
mS
mS
mS
S
S
S
IRED On Time
Horn On Time
T
ON2
T
HON1
T
HON2
Horn Off Time
T
HOF1
T
HOF3
IO Charge Dump Duration
IO Delay
IO Filter
T
IODMP
T
IODLY1
T
IOFILT
600
.75
1.65
mS
S
Remote Alarm Delay
T
IODLY2
Note 1 – See timing diagram for Horn Temporal Pattern
Note 2 - T
POSC
and T
ON2
are 100% production tested. All other timing is guaranteed by functional testing.
Typical values are for design information and are not guaranteed.
Limits over the specified temperature range are not production tested and are based on characterization data.
© 2009 Microchip Technology Inc.
DS22178B-page 4
RE46C143
CMOS Photoelectric Smoke Detector ASIC with Interconnect
Product Specification
R&E International
A Subsidiary of Microchip Technology Inc.
Functional Block Diagram
Figure 1
© 2009 Microchip Technology Inc.
DS22178B-page 5
微控制器 MCU
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
