RE46C180
CMOS Programmable Ionization Smoke Detector ASIC with
Interconnect, Timer Mode and Alarm Memory
Features
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6 – 12V Operation
Low Quiescent Current Consumption
Programmable Standby Sensitivity
Programmable HUSH Sensitivity
Programmable Hysteresis
Programmable Chamber Voltage for Push-to-Test
(PTT) and Chamber Test
Programmable ±150 mV Low Battery Set Point
Internal Ionization Chamber Test
Internal Low Battery Test
Internal Power-On Reset and Power-up Low
Battery Test
Alarm Memory
Auto Alarm Locate
Horn Synchronization
IO Filter and Charge Dump
Smart Interconnect
Interconnect up to 40 Detectors
±5% All Internal Oscillator
9 Minute or 80 Second Timer for Sensitivity
Control
Temporal or Continuous Horn Pattern
Guard Outputs for Ion Detector Input
±0.75 pA Detect Input Current
10-year End-of-Life Indication
Description
The RE46C180 is a next generation low power, CMOS
ionization-type, smoke detector IC. With minimal exter-
nal components, this circuit will provide all the required
features for an ionization-type smoke detector.
An on-chip oscillator strobes power to the smoke
detection circuitry for 5 ms every 10 seconds to keep
the standby current to a minimum.
A check for a Low Battery condition is performed every
80s and an ionization chamber test is performed once
every 320s when in Standby. The temporal horn pattern
complies with the National Fire Protection Association
NFPA 72
®
National Fire Alarm and Signaling Code
®
for
emergency evacuation signals.
An interconnect pin allows multiple detectors to be con-
nected, such that when one unit alarms, all units will
sound. A charge dump feature quickly discharges the
interconnect line when exiting a Local Alarm condition.
The interconnect input is also digitally filtered.
An internal 9 minute or 80s timer can be used for a
Reduced Sensitivity mode.
An alarm memory feature allows the user to determine
whether the unit has previously entered a Local Alarm
condition.
Utilizing low-power CMOS technology, the RE46C180
is designed for use in smoke detectors that comply with
the Standard for Single and Multiple Station Smoke
Alarms, UL217 and the Standard for Smoke Detectors
for Fire Alarm Systems, UL268.
Package Types
RE46C180
PDIP, SOIC
TEST
IO
GLED
CHAMBER
RLED
V
DD
TESTOUT
FEED
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
GUARD2
DETECT
GUARD1
T3
T2
HS
HB
V
SS
2011 Microchip Technology Inc.
DS22275A-page 1
DS22275A-page 2
IO (2)
RE46C180
TEST (1)
Functional Block Diagram
V
DD
(6)
Low Batt
Comp
+
-
Smoke
Comp
+
Logic
and
Timing
Trimmable
Low Batt
Reference
FEED (8)
Trimmable
Low Batt
Setting
HS (11)
Trimmable
Smoke
Reference
-
HB (10)
RLED (5)
GUARD1 (14)
+
-
GLED (3)
BIAS, Power Reset
and
Trimmable Oscillator
TESTOUT (7)
Test and
Program
Mode Sel
T2 (12)
T3 (13)
Programmable
Trim
Chamber
Voltage
DETECT (15)
GUARD2 (16)
Guard
Amp
V
SS
(9)
2011 Microchip Technology Inc.
CHAMBER (4)
RE46C180
Typical Application
To Other
Units
TEST and HUSH
R5
100
10 µF
C3
RE46C180
1 TEST
GUARD2 16
DETECT 15
GUARD1 14
T3 13
T2 12
HS 11
HB 10
V
SS
9
R3
1.5M
R4
220K
C1
.001 µF
Rled
Gled
2 IO
3 GLED
R1
390
R2
390
4 CHAMBER
5 RLED
9V
Battery
+
-
1 µF
C2
6
7
V
DD
TESTOUT
8 FEED
Note 1:
R3, R4 and C1 are typical values, and may be adjusted to maximize sound pressure.
2:
3:
4:
C2 should be located as close as possible to the device power pins.
Route the pin 8 PC board trace away from pin 4 to avoid coupling.
No internal reverse battery protection. External reverse battery protection circuitry required.
2011 Microchip Technology Inc.
DS22275A-page 3
RE46C180
1.0
1.1
ELECTRICAL
CHARACTERISTICS
Absolute Maximum Ratings†
V
DD
.................................................................................12.5V
Input Voltage Range Except FEED, IO .......... V
IN
= -.3V to V
DD
+.3V
FEED Input Voltage Range ..................... V
INFD
=-10 to +22V
IO Input Voltage Range................................. V
IO1
= -.3 to 15V
Input Current except FEED ...................................I
IN
= 10 mA
Operating Temperature ................................T
A =
-10 to +60°C
Storage Temperature............................ T
STG
= -55 to +125°C
Maximum Junction Temperature ............................T
J
= +150°
† Notice:
Stresses above those listed under “Maximum
ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of
the device at these or any other conditions above those
indicated in the operation listings of this specification is
not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.
DC ELECTRICAL CHARACTERISTICS
DC Electrical Characteristics:
Unless otherwise indicated, all parameters apply at T
A
= -10°C to +60°C,
V
DD
= 9V, V
SS
= 0V (Note
1)
Parameter
Supply Voltage
Supply Current
Symbol
V
DD
I
DD1
I
DD2
I
DD3
I
DD4
Input Voltage High
V
IH1
V
IH2
V
IH3
V
IH4
Input Voltage Low
V
IL1
V
IL2
V
IL3
V
IL4
Input Leakage Low
IL
DET1
IL
DET2
IL
FD1
IL
FD2
Note 1:
2:
3:
4:
Test
Pin
6
6
6
6
6
8
2
1
12
8
2
1
12
15
15
8
8
Min
6
—
—
—
—
6
3
5.6
5.6
—
—
—
—
—
—
—
—
Typ
—
3.8
—
9.6
21.4
—
—
—
—
—
—
—
—
—
—
—
—
Max
12
5.3
6
13.9
30
—
—
—
—
2.8
1
3.4
3.4
-0.75
-1.5
-50
-100
pA
pA
µA
nA
V
DD
= 9V, DETECT = V
SS
,
0-40% RH, T
A
= +25°C
V
DD
= 9V, DETECT = V
SS
,
85% RH, T
A
= +25°C (Note
2)
FEED = -10V
FEED = V
SS
Units
V
µA
µA
µA
µA
V
V
V
V
V
V
V
No Local Alarm, IO as an input
No Local Alarm, IO as an input
Operating
Operating, RLED off, GLED off
Operating, V
DD
= 12V,
RLED off, GLED off
Operating, RLED off,
GLED off, Smoke check
Operating, RLED off, GLED off,
Low Battery check
Conditions
Production tested at room temperature with temperature guard banded limits.
Sample test only.
Not 100% production tested.
Same limit range at each programmable step, see
Table 4-1.
DS22275A-page 4
2011 Microchip Technology Inc.
RE46C180
DC ELECTRICAL CHARACTERISTICS (CONTINUED)
DC Electrical Characteristics:
Unless otherwise indicated, all parameters apply at T
A
= -10°C to +60°C,
V
DD
= 9V, V
SS
= 0V (Note
1)
Parameter
Input Leakage High
Symbol
IH
DET1
IH
DET2
IH
FD1
IH
FD2
I
IOL2
Output Off Leakage High
Input Pull Down Current
Output High Voltage
Output Low Voltage
Output Current
I
IOHZ
I
PD1
I
PD2
V
OH1
V
OL1
V
OL3
I
IOL1
I
IOH1
I
IODMP
Low Battery Voltage
V
LB
Test
Pin
15
15
8
8
2
3, 5
1
12
10,11
10,11
3, 5
2
2
2
6
Min
—
—
—
—
—
—
20
0.4
6.3
—
—
25
-4
5
6.75
7.05
7.35
7.65
Offset Voltage
V
GOS1
V
GOS2
V
GOS3
Common Mode Voltage
Output Impedance
Chamber Voltage in
PTT/Chamber Test
Hysteresis
V
CM1
V
CM2
Z
OUT
V
CHAMBER
V
HYS
14,15
15,16
15
14,15
15
14,16
4
13
-50
-50
-50
2
0.5
—
4.49
140
Typ
—
—
—
—
—
—
50
0.8
—
—
—
—
—
—
6.9
7.2
7.5
7.8
—
—
—
—
—
10
4.5
150
Max
0.75
1.5
50
100
150
1
80
1.3
—
0.9
1
60
-16
—
7.05
7.35
7.65
7.95
50
50
50
V
DD
–.5
V
DD
–2
—
4.51
160
Units
pA
pA
µA
nA
µA
µA
µA
mA
V
V
V
µA
mA
mA
V
V
V
V
mV
mV
mV
V
V
k
V
mV
Conditions
V
DD
= 9V, DETECT = V
DD
,
0–40% RH, T
A
= +25°C
V
DD
= 9V, DETECT = V
DD
,
85% RH, T
A
= +25°C (Note
2)
FEED = 22V
FEED = V
DD
No Alarm, V
IO
= 15V
Outputs Off,
V
RLED
= 9V, V
GLED
= 9V
TEST = 9V
T2 = 9V
I
OH
= -16 mA, V
DD
= 7.2V
I
OL
= 16 mA, V
DD
= 7.2V
I
OL
= 10 mA, V
DD
= 7.2V
No Alarm, V
IO
= V
DD
-2V
Alarm, V
IO
= 4V or V
IO
= 0V
At conclusion of Local Alarm
or PTT, V
IO
= 1V
LBTR[2:1] =
1 0
LBTR[2:1] =
1 1
LBTR[2:1] =
0 0
LBTR[2:1] =
0 1
Guard amplifier
Guard amplifier
Smoke comparator
Guard amplifier (Note
3)
Smoke comparator (Note
3)
Guard amplifier outputs (Note
3)
User programmable
(2.1V to 6.75V) (Note
4)
No Alarm to Alarm condition,
user programmable
(50 to 225 mV) (Note
4)
Note 1:
2:
3:
4:
Production tested at room temperature with temperature guard banded limits.
Sample test only.
Not 100% production tested.
Same limit range at each programmable step, see
Table 4-1.
2011 Microchip Technology Inc.
DS22275A-page 5
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