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RN1309TE85LF

产品描述Multilayer Ceramic Capacitors MLCC - SMD/SMT 0603 10uF 25volts X5R 20%
产品类别半导体    分立半导体   
文件大小661KB,共7页
制造商Toshiba(东芝)
官网地址http://toshiba-semicon-storage.com/
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RN1309TE85LF概述

Multilayer Ceramic Capacitors MLCC - SMD/SMT 0603 10uF 25volts X5R 20%

RN1309TE85LF规格参数

参数名称属性值
产品种类
Product Category
Bipolar Transistors - Pre-Biased
制造商
Manufacturer
Toshiba(东芝)
RoHSDetails
ConfigurationSingle
Transistor PolarityNPN
Typical Input Resistor47 kOhms
Typical Resistor Ratio2.14
安装风格
Mounting Style
SMD/SMT
封装 / 箱体
Package / Case
SC-70
DC Collector/Base Gain hfe Min70
Collector- Emitter Voltage VCEO Max50 V
Continuous Collector Current100 mA
Peak DC Collector Current100 mA
Pd-功率耗散
Pd - Power Dissipation
100 mW
最大工作温度
Maximum Operating Temperature
+ 150 C
系列
Packaging
Reel
DC Current Gain hFE Max70
高度
Height
0.9 mm
长度
Length
2 mm
工厂包装数量
Factory Pack Quantity
3000
宽度
Width
1.25 mm
单位重量
Unit Weight
0.000988 oz

文档预览

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RN1307 to RN1309
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)
RN1307, RN1308, RN1309
Switching, Inverter Circuit, Interface Circuit
and Driver Circuit Applications
With built-in bias resistors.
Simplify circuit design
Reduce a quantity of parts and manufacturing process
Complementary to RN2307 to RN2309
Unit: mm
Equivalent Circuit and Bias Resistor Values
Type No.
RN1307
RN1308
RN1309
R1 (kΩ)
10
22
47
R2 (kΩ)
47
47
22
USM
JEDEC
JEITA
SC-70
TOSHIBA
2-2E1A
Weight: 0.006g (typ.)
Rating
50
50
6
V
EBO
7
15
I
C
P
C
T
j
T
stg
100
100
150
-55 to 150
mA
mW
°C
°C
V
Unit
V
V
Absolute Maximum Ratings
(Ta = 25°C)
Characteristic
Collector-base voltage
Collector-emitter voltage
RN1307
Emitter-base voltage
RN1308
RN1309
Collector current
Collector power dissipation
Junction temperature
Storage temperature range
Symbol
V
CBO
V
CEO
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Start of commercial production
1988-04
1
2017-01-06

 
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