520C
Model 520C
Industrial Transistor Tester
The B+K Precision model 520C Transistor
Tester is designed for in-circuit and out-of
circuit transistor testing with special features for
making additional tests on devices out-of circuit.
The instrument is designed for a minimum amount of
control manipulation, making for rapid testing of most devices.
■Determines
good or bad transistors, FET’s, SCR’s,
or diodes.
■Patented
limited-energy pulse circuit permits in-circuit
testing in the presence of low shunt impedance’s with
complete safety for the device under test.
■Easy
to operate panel eliminates the need to refer to
a reference or operating manual-only three switches,
no panel adjustments.
■Six
position test switch makes it unnecessary to know the
device terminal identification.
■A
LED array identifies leakage in both
Silicon and Germanium devices.
■Front
Panel socket for out-of –circuit transistor testing.
Specifications
520C
IN-CIRCUIT TEST
GOOD/BAD TEST
IDENTIFIES
PNP and NPN transistors
FET’s, SCR’s
NPN or PNP
FET as N-channel or P-channel
Silicone or germanium transistors
transistors in LO drive, base lead
in HI drive all leads of SCR
models
510A
NPN or PNP
FET as N-channel or
P-channel
FET-gate lead, all leads of
OUT-OF-CIRCUIT TEST
GOOD/BAD TEST
IDENTIFIES
PNP and NPN transistors
FET’s, SCR’s
NPN or PNP
FET as N-channel or P-channel
Silicone or germanium transistors
Reverse leakage
from 0.1mA to 9mA
PNP and NPN transistors
FET’s
NPN or PNP
FET as N-channel or
P-channel
Does not apply
MEASURES
AUTOMATIC INDICATORS
AUDIBLE TONE
LED
TEST SWITCH
METER SCALES
GOOD
NPN or PNP Ge or Si
,
Base or Gate for good transistor
or FET’s
Readable from 0.1µA to 9mA
for Ice leakage, calibrated for silicon
and germanium power and signal
transistor leakage limits
Does not apply
NPN or PNP Ge or Si
,
Base or Gate for good
transistor or FET’s
Does not apply
Model 510A
Portable Transistor Tester
The model 510A performs Good/Bad test for
transistors, FET’s, and SCR’s. It also identifies
NPN or PNP for transistors, N-channel or P-
channel for FET, FET-gate lead, all leads of tran-
sistors in LO drive, base lead in HI drive, and all
leads of SCR. It uses a patented limited-energy
pulse circuit, which provides highly successful
in-circuit testing in the presence of low shunt
impedance’s with complete safety for the
device under test. The instrument is
designed for a minimum amount of con-
trol manipulation, allowing for rapid test-
ing of most devices.
APPLIED TEST CURRENTS
BASE DRIVE*
COLLECTOR*
TEST REPETITION
250mA (HI), 1mA (LO)
125mA
10Hz
5Hz
IN-CIRCUIT SHUNT LIMIT FOR VALID GOOD/BAD TEST
RESISTANCE
CAPACITANCE
>10Ω (HI), 1.5kΩ (LO)
<15mF (HI), 0.3mF (LO)
<25mF (HI), 0.3µF (LO)
GENERAL
POWER
REQUIREMENT
OPERATING TEMP
DIMENSIONS
(HxWxD)
WEIGHT
9V Battery (Supplied)
or optional AC adaptor
6VDC from
4 “AA” batteries
(not supplied)
32˚ to 104˚F (0˚ to 40˚C), <75% RH
7.5 x 4.0 x 2.0"
(191 x 102 x 51 mm)
1 lb. (450g)
510A
Accessories
One Year Warranty
■Rapid
In-circuit and out-of circuit testing
■Good/Bad
test
■NPN
or PNP identification for transistors
■N-channel
or P-channel identification for FET
■FET
-gate and SCR lead identification
■Battery
operated (4 x 1.5 AA batteries)
SUPPLIED: FP-6 Semiconductor Test Leads (three test leads w/mini-lock clips),
Instruction manual, Battery (520C only)
Optional: BE 12 AC adaptor(9VDC)
* Duty Cycle @8% for 520C, 2% for 510A
For your nearest distributor, call 800-462-9832 or www.bkprecision.com
69
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