•
MKP with double side met. current carriers
•
box with lug terminals
•
snubber
•
high pulse applications
•
high current
•
high frequency
•
RMB: small size
Main applications
Snubber capacitor for energy conversion and control in power
semiconductor circuits, IGBT modules protection and SMPS protection
circuits, resonant circuits, high voltage, high current and high pulse
applications
Dielectric
Polypropylene
Electrodes
Vacuum deposited metal layers
Coating
Solvent resistant plastic case with resin sealing (UL 94 V-0). Flame
retardant execution
Construction
Extended double side metallized carrier film with internal series
connection and metallized film (refer to General Technical
Information)
Terminals
Tinned copper (brass) lugs (lead-free) for screw fixing (please refer to
article table)
Degree of protection
IP00
Installation
Whatever position assuring correct heat dissipation. Arrangement of
many components with box walls in contact not admitted; suggested
minimum distance between side by side elements ≥ 1/8 of the box
thickness (B size). Box with lugs terminals must be free to correctly
dissipate from all the body faces
Reference standard
IEC 61071, IEC 60068, RoHS compliant
Climatic category
40/85/56 (IEC 60068/1), GPD (DIN40040)
Please refer also to paragraph C10 (humid ambient) of the General
Technical Information
Operating temperature range (case)
PMB: -40°...+85°C (+100°C observing voltage and current de-rating)
RMB: -40...+85°C
Max. permissible ambient temperature
PMB: +70°C, operation at rated power, current, voltage and natural
cooling (+85°C observing voltage and current de-rating)
RMB: +70°C operation at rated power,current, voltage and natural
cooling
Nominal Capacitance (Cn) µF
0,047µF to 12µF. Refer to article table
Capacitance tolerance (at 1kHz)
±10% (code=K), ±5% (code=J). Other tolerances upon request
Capacitance temperature coefficient
Refer to General Technical Information
Long term stability (at 1kHz)
Capacitance variation ≤ ±1% after a period of 2 years at standard
environmental conditions
Rated voltage (Ur) (Vdc) at 85°C
700, 850, 1000, 1200, 1500, 2000, 2500, 3000 Vdc
Temperature de-rated voltage
PMB: for operating temperature (case)> +85°C
Ur must be decreased 1,5% for every °C exceeding +85°C
Urms must be decreased 2,5% for every °C exceeding +85°C
RMB: not applicable
Non recurrent surge voltage (Upk) at 85°C
PMB: 1100, 1300, 1550, 1750, 2200, 2600, 3300, 4000 Vdc
RMB: 950, 1200, 1300, 1600, 2000, 2400, 3000, 3500 Vdc
Self inductance
≤ 1nH/mm of fixing pitch
Maximum pulse rise time V/µs
Refer to article table
Maximum peak current (Ipeak)
Refer to article table. Max. non repetitive Ipk = 1,5 x Ipeak
Dissipation factor (DF), max.
tgδ x10
-4
, measured at 25 ±5°C, 1 kHz
Cn ≤ 0.1 μF 0.1 μF < Cn ≤ 1 μF 1 μF < Cn ≤ 5.6 μF 5.6 μF < Cn ≤ 9 μF Cn > 9 μF
6
5
6
7
9
PMB / RMB
Insulation resistance (R
INS
)
≥ 30000s but need not exceed 30 GΩ, between terminals, at
±25°C, after 1 minute of electrification at 100 Vdc
Test voltage between terminals (Ut)
1,6xUr (DC) applied for 10s / 2xUr (DC) applied for 2s, at 25±5°C
Test voltage between terminals and case (Utc)
3kV 50÷60Hz applied for 60s at 25 ±5°C
Damp heat test (steady state)
List of admitted high humidity and temperature tests (please refer to
paragraph C10 of the GTI);
Biased tests applicable from 03/2019 production codes only
Test ID
a
b
c
d
e
f
g
Reference
Permissible
Damp heat test (steady state) not biased
YES
- IEC60068
Damp heat test (steady state) biased
YES
- AEC Q-200 cockpit
Robustness under high humidity, Grade II
YES
- IEC 60384-17:2019
High robustness under high humidity, Grade III
YES
- IEC 60384-17:2019
(PMB ONLY)
Damp heat test (steady state) biased - 70/70/1000
NO
Humidity load test, Test Cy, Severity II - IEC 60068-2-67
NO
Humidity load test, Test Cy, Severity III
NO
- IEC 60068-2-67 and 85/85/1000 Level 1 - AEC Q-200
Rated Ur (DC
ONLY)
applied for biased tests
Performance:
Capacitance change ≤ ±2% (for test “a”)
Capacitance change ≤ ±10% (for test “b”, “c” and “d”)
DF change ≤ 0.0010 at 1kHz (for test “a”)
DF change ≤ 2 x initial limit at 1kHz (for test “b”, “c” and “d”)
R
INS
≥ 50% of initial limit value
PMB: Box distorsion ≤ 1/16 of the nominal box thickness (B size) or ≤
1mm whichever is the highest
RMB: Box distorsion ≤ 1/16 of the nominal box thickness (B size) or ≤
1.5mm whichever is the highest
Typical capacitance change versus operating time
-3% after 30000 hours at Urms or after 100000 hours at Ur
Life expectancy
≥ 100000 hours (Ur); 30000 hours (Urms)
Failure quota
300/10
9
component hours
Ed. 04 Rev. 02
24.1
10.2021
微控制器 MCU
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