without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can
reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such
applications unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that:
a.) the risk of injury or damage has been minimized;
b.) the user assume all such risks; and
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances
Integrated Silicon Solution, Inc.-
www.issi.com
Rev. A1
03/16/2018
1
IS62/65WV1288FALL
IS62/65WV1288FBLL
PIN CONFIGURATIONS
36-Pin mini BGA (6mm x 8mm)
1
2
3
4
5
6
32-Pin TSOP (Type I), STSOP (Type I)
A
A0
A1
CS2
A3
A6
A8
A11
1
2
3
32
31
30
OE#
A10
A9
B
A8
I/O4
A2
WE#
A4
A7
I/O0
CS1#
I/O7
A13
WE#
4
5
6
7
8
29
28
27
26
I/O6
I/O5
I/O4
I/O3
GND
I/O2
I/O1
C
I/O5
NC
A5
I/O1
CS2
A15
D
GND
VDD
VDD
NC
25
24
23
22
9
10
11
12
13
14
E
VDD
VSS
A16
A14
A12
21
20
19
18
17
I/O0
A0
A1
A2
A3
F
I/O6
NC
NC
I/O2
A7
A6
A5
A4
G
I/O7
OE#
CS1#
A16
A15
I/O3
15
16
H
A9
A10
A11
A12
A13
A14
PIN DESCRIPTIONS
A0-A16
I/O0-I/O7
CS1#, CS2
OE#
WE#
NC
V
DD
GND
Address Inputs
Data Inputs/Outputs
Chip Enable Input
Output Enable Input
Write Enable Input
No Connection
Power
Ground
32-Pin SOP
NC
A16
A14
1
2
3
4
5
32
VDD
A15
CS2
WE#
A13
31
30
29
A12
A7
28
27
26
25
24
23
22
21
20
A6
A5
A4
A3
A2
A1
A0
I/O0
I/O1
I/O2
GND
6
7
A8
A9
8
9
10
11
12
13
14
15
A11
OE#
A10
CS1#
I/O7
I/O6
I/O5
19
18
17
I/O4
I/O3
16
Integrated Silicon Solution, Inc.-
www.issi.com
Rev. A1
03/16/2018
2
IS62/65WV1288FALL
IS62/65WV1288FBLL
FUNCTION DESCRIPTION
SRAM is one of random access memories. SRAM has three different modes supported. Each function is described
below with Truth Table.
STANDBY MODE
Device enters standby mode when deselected (CS1# HIGH or CS2 LOW). The input and output pins (I/O0-7) are
placed in a high impedance state. CMOS input in this mode will maximize saving power.
WRITE MODE
Write operation issues with Chip selected (CS1# LOW and CS2 HIGH) and Write Enable (WE#) input LOW. The input
and output pins (I/O0-7) are in data input mode. Output buffers are closed during this time even if OE# is LOW.
READ MODE
Read operation issues with Chip selected (CS1# LOW and CS2 HIGH) and Write Enable (WE#) input HIGH. When
OE# is LOW, output buffer turns on to make data output. Any input to I/O pins during READ mode is not permitted.
In the READ mode, output buffers can be turned off by pulling OE# HIGH. In this mode, internal device operates as
READ but I/Os are in a high impedance state. Since device is in READ mode, active current is used.
TRUTH TABLE
Mode
Not Selected
Output Disabled
Read
Write
CS1#
H
X
L
L
L
CS2
X
L
H
H
H
WE#
X
X
H
H
L
OE#
X
X
H
L
X
I/O0-I/O7
High-Z
High-Z
High-Z
D
OUT
D
IN
VDD Current
ISB2
ICC
ICC
ICC
Integrated Silicon Solution, Inc.-
www.issi.com
Rev. A1
03/16/2018
3
IS62/65WV1288FALL
IS62/65WV1288FBLL
ABSOLUTE MAXIMUM RATINGS AND OPERATING RANGE
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Vt er m
tBIAS
V
DD
tStg
I
OUT(2)
Notes:
1.
Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification
is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
This condition is not per pin. Total current of all pins must meet this value.
Parameter
Terminal Voltage with Respect to GND
Temperature Under Bias
V
DD
Related to GND
Storage Temperature
DC Output Current (LOW)
Value
–0.2 to +3.9 (V
DD
+0.3V)
–55 to +125
–0.2 to +3.9 (V
DD
+0.3V)
–65 to +150
20
Unit
V
C
V
C
mA
2.
OPERATING RANGE
(1)
Range
Commercial
Industrial
Commercial
Industrial
Automotive
Note:
1.
Ambient Temperature
0C to +70C
-40C to +85C
0C to +70C
-40C to +85C
-40C to +125C
Device Marking
IS62WV1288FALL
IS62WV1288FALL
IS62WV1288FBLL
IS62WV1288FBLL
IS65WV1288FBLL
V
DD
1.65V-2.2V
1.65V-2.2V
2.2V-3.6V
2.2V-3.6V
2.2V-3.6V
Full device AC operation assumes a 100 µs ramp time from 0 to V
DD
(min) and 200 µs wait time after V
DD
stabilization.
PIN CAPACITANCE
(1)
Parameter
Input capacitance
DQ capacitance (IO0–IO7)
Symbol
C
IN
C
I/O
Test Condition
T
A
= 25°C, f = 1 MHz, V
DD
= V
DD
(typ)
Max
10
10
Units
pF
pF
Note:
1. These parameters are guaranteed by design and tested by a sample basis only.
THERMAL CHARACTERISTICS
(1)
Parameter
Thermal resistance from junction to ambient (airflow = 1m/s)
Thermal resistance from junction to pins
Thermal resistance from junction to case
Note:
1. These parameters are guaranteed by design and tested by a sample basis only.
Symbol
R
θJA
R
θJB
R
θJC
Rating
TBD
TBD
TBD
Units
°C/W
°C/W
°C/W
Integrated Silicon Solution, Inc.-
www.issi.com
Rev. A1
03/16/2018
4
IS62/65WV1288FALL
IS62/65WV1288FBLL
ELECTRICAL CHARACTERISTICS
IS62WV1288FALL DC ELECTRICAL CHARACTERISTICS-I (OVER THE OPERATING RANGE)
VDD = 1.65V~2.2V
Symbol
V
OH
V
OL
V
IH(1)
V
IL(1)
I
LI
I
LO
Parameter
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input Leakage
Output Leakage
Test Conditions
I
OH
= -0.1 mA
I
OL
= 0.1 mA
Min
1.4
—
1.4
–0.2
–1
–1
Max
—
0.2
V
DD
+ 0.2
0.4
1
1
Unit
V
V
V
V
µA
µA
GND < V
IN
< V
DD
GND < V
IN
< V
DD
, Output Disabled
Notes:
1. VILL(min) = -1.0V AC (pulse width < 10ns). Not 100% tested.
VIHH (max) = VDD + 1.0V AC (pulse width < 10ns). Not 100% tested.
IS62 (5) WV1288FBLL DC ELECTRICAL CHARACTERISTICS-I (OVER THE OPERATING RANGE)
VDD = 2.2V~3.6V
Symbol
V
OH
V
OL
V
IH(1)
V
IL(1)
I
LI
I
LO
Parameter
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input Leakage
Output Leakage
Test Conditions
2.2 ≤ V
DD
< 2.7, I
OH
= -0.1 mA
2.7 ≤ V
DD
≤ 3.6, I
OH
= -1.0 mA
2.2 ≤ V
DD
< 2.7, I
OL
= 0.1 mA
2.7 ≤ V
DD
≤ 3.6, I
OL
= 2.1 mA
2.2 ≤ V
DD
< 2.7
2.7 ≤ V
DD
≤ 3.6
2.2 ≤ V
DD
< 2.7
2.7 ≤ V
DD
≤ 3.6
GND < V
IN
< V
DD
GND < V
IN
< V
DD
, Output Disabled
Min
2.0
2.4
—
—
1.8
2.2
–0.3
–0.3
–1
–1
Max
—
—
0.4
0.4
V
DD
+ 0.3
V
DD
+ 0.3
0.6
0.8
1
1
Unit
V
V
V
V
V
V
V
V
µA
µA
Note:
1. VILL(min) = -2.0V AC (pulse width < 10ns). Not 100% tested.
VIHH (max) = VDD + 2.0V AC (pulse width < 10ns). Not 100% tested.
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