25LC010A
25LC020A
25LC040A
1K-4K SPI Serial EEPROM High Temp Family Data Sheet
Features:
• Max. Clock 5 MHz
• Low-Power CMOS Technology:
- Max. Write Current: 5 mA at 5.5V, 5 MHz
- Read Current: 5 mA at 5.5V, 5 MHz
- Standby Current: 10
μA
at 5.5V
• 128 x 8 through 512 x 8-bit Organization
• Byte and Page-level Write Operations
• Self-Timed Erase and Write Cycles (6 ms max.)
• Block Write Protection:
- Protect none, 1/4, 1/2 or all of array
• Built-in Write Protection:
- Power-on/off data protection circuitry
- Write enable latch
- Write-protect pin
• Sequential Read
• High Reliability:
- Endurance: >1M erase/write cycles
- Data retention: > 200 years
- ESD protection: > 4000V
• Temperature Range Supported:
- Extended (H):
-40°C to +150°C
• Package is Pb-Free and RoHS Compliant
Description:
Microchip Technology Inc. 25LCXXXA* devices are
low-density 1 through 4 Kbit Serial Electrically Eras-
able PROMs (EEPROM). The devices are organized in
blocks of x8-bit memory and support the Serial Periph-
eral Interface (SPI) compatible serial bus architecture.
Byte-level and page-level functions are supported.
The bus signals required are a clock input (SCK) plus
separate data in (SI) and data out (SO) lines. Access to
the device is controlled through a Chip Select (CS)
input.
Communication to the device can be paused via the
hold pin (HOLD). While the device is paused, transi-
tions on its inputs will be ignored, with the exception of
Chip Select, allowing the host to service higher priority
interrupts.
The 25LCXXXA is available in a standard 8-lead SOIC
package. The package is Pb-free and RoHS
Compliant.
Package Types (not to scale)
SOIC
(SN)
CS
SO
WP
V
SS
1
2
3
4
8
7
6
5
V
CC
HOLD
SCK
SI
Pin Function Table
Name
CS
SO
WP
V
SS
SI
SCK
HOLD
V
CC
Function
Chip Select Input
Serial Data Output
Write-Protect
Ground
Serial Data Input
Serial Clock Input
Hold Input
Supply Voltage
*25LCXXXA is used in this document as a generic part number for the 25 series devices.
©
2009 Microchip Technology Inc.
Preliminary
DS22136B-page 1
25LCXXXA
1.0
ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings
(†)
V
CC
.............................................................................................................................................................................6.5V
All inputs and outputs w.r.t. V
SS
..........................................................................................................-0.6V to V
CC
+1.0V
Storage temperature ................................................................................................................................. -65°C to 155°C
Ambient temperature under bias........................................................................................................... -40°C to 150°C
(1)
ESD protection on all pins.......................................................................................................................................... 4 kV
Note 1:
AEC-Q100 reliability testing for devices intended to operate at 150°C is 1,000 hours. Any design in which
the total operating time between 125°C and 150°C will be greater than 1,000 hours is not warranted with-
out prior written approval from Microchip Technology Inc.
†
NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for an
extended period of time may affect device reliability.
TABLE 1-1:
DC CHARACTERISTICS
Extended (H):
Min.
.7 V
CC
-0.3
-0.3
—
—
V
CC
-0.5
—
—
—
T
A
= -40°C to +150°C
Max.
V
CC
+1
0.3V
CC
0.2V
CC
0.4
0.2
—
±2
±2
7
Units
V
V
V
V
V
V
μA
μA
pF
V
CC
≥
2.7V
V
CC
< 2.7V
I
OL
= 2.1 mA
I
OL
= 1.0 mA
I
OH
= -400
μA
CS = V
CC
, V
IN
= V
SS OR
V
CC
CS = V
CC
, V
OUT
= V
SS OR
V
CC
T
A
= 25°C, CLK = 1.0 MHz,
V
CC
= 5.0V
(Note)
V
CC
= 5.5V; F
CLK
= 5.0 MHz;
SO = Open
V
CC
= 2.5V; F
CLK
= 3.0 MHz;
SO = Open
V
CC
= 5.5V
V
CC
= 2.5V
CS = V
CC
= 5.5V, Inputs tied to V
CC
or
V
SS
, 150°C
V
CC
= 2.5V to 5.5V
Test Conditions
DC CHARACTERISTICS
Param.
No.
D001
D002
D003
D004
D005
D006
D007
D008
D009
Sym.
V
IH1
V
IL1
V
IL2
V
OL
V
OL
V
OH
I
LI
I
LO
C
INT
Characteristic
High-level input
voltage
Low-level input
voltage
Low-level output
voltage
High-level output
voltage
Input leakage current
Output leakage
current
Internal Capacitance
(all inputs and
outputs)
D010
I
CC
Read
Operating Current
—
—
5
2.5
mA
mA
mA
mA
μA
D011
D012
Note:
I
CC
Write
I
CCS
Standby Current
—
—
—
—
5
3
10
This parameter is periodically sampled and not 100% tested.
©
2009 Microchip Technology Inc.
Preliminary
DS22136B-page 3
25LCXXXA
TABLE 1-2:
AC CHARACTERISTICS
Extended (H):
Min.
—
—
100
150
200
250
50
20
30
40
50
—
—
100
150
100
150
50
50
—
—
0
—
—
40
80
40
80
60
160
60
160
—
1,000,000
T
A
= -40°C to +150°C
Max.
5
3
—
—
—
—
—
—
—
—
—
100
100
—
—
—
—
—
—
100
160
—
80
160
—
—
—
—
—
—
—
—
6
—
Units
MHz
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
V
CC
= 2.5V to 5.5V
Test Conditions
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
—
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
(Note 1)
(Note 1)
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
—
—
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
(Note 1)
4.5V
≤
Vcc
≤
5.5V
(Note 1)
2.5V
≤
Vcc
≤
4.5V
(Note 1)
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
4.5V
≤
Vcc
≤
5.5V
(Note 1)
2.5V
≤
Vcc
<
4.5V
(Note 1)
4.5V
≤
Vcc
≤
5.5V
2.5V
≤
Vcc
<
4.5V
(Note 2)
AC CHARACTERISTICS
Param.
Sym.
No.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
F
CLK
T
CSS
T
CSH
T
CSD
Tsu
T
HD
T
R
T
F
T
HI
T
LO
T
CLD
T
CLE
T
V
T
HO
T
DIS
T
HS
T
HH
T
HZ
T
HV
T
WC
—
Characteristic
Clock Frequency
CS Setup Time
CS Hold Time
CS Disable Time
Data Setup Time
Data Hold Time
CLK Rise Time
CLK Fall Time
Clock High Time
Clock Low Time
Clock Delay Time
Clock Enable Time
Output Valid from Clock
Low
Output Hold Time
Output Disable Time
HOLD Setup Time
HOLD Hold Time
HOLD Low to Output
High-Z
HOLD High to Output
Valid
Internal Write Cycle Time
Endurance
E/W Page Mode, 25°C, V
CC
= 5.5V
Cycles
(Note 3)
Note 1:
This parameter is periodically sampled and not 100% tested.
2:
T
WC
begins on the rising edge of CS after a valid write sequence and ends when the internal write cycle
is complete.
3:
This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which can be obtained from our web site:
www.microchip.com.
DS22136B-page 4
Preliminary
©
2009 Microchip Technology Inc.
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