If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Above which the useful life may be impaired. (Note 1)
−65˚C to +150˚C
Storage Temperature (T
STG
)
Maximum Junction Temperature (T
J
)
Ceramic
+175˚C
Plastic
+150˚C
−7.0V to +0.5V
V
EE
Pin Potential to Ground Pin
Input Voltage (DC)
V
EE
to +0.5V
Output Current (DC Output HIGH)
−50 mA
ESD (Note 2)
≥2000V
Recommended Operating
Conditions
Case Temperature (T
C
)
Military
Supply Voltage (V
EE
)
−55˚C to +125˚C
−5.7V to −4.2V
Note 1:
Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2:
ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
V
EE
= −4.2V to −5.7V, V
CC
= V
CCA
= GND, T
C
= −55˚C to +125˚C
Symbol
V
OH
Parameter
Output HIGH Voltage
Min
−1025
−1085
V
OL
Output LOW Voltage
−1830
−1830
V
OHC
Output HIGH Voltage
−1035
−1085
V
OLC
Output LOW Voltage
−1610
−1555
V
IH
V
IL
I
IL
I
IH
Input HIGH Voltage
Input LOW Voltage
Input LOW Current
Input High Current
D
2a
–D
2e
D
1a
–D
1e
D
2a
–D
2e
D
1a
–D
1e
I
EE
Power Supply Current
−75
250
350
350
500
−25
mA
−55˚C to
+125˚C
Note 3:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4:
Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2 3, 7, and 8.
Note 5:
Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6:
Guaranteed by applying specified input condition and testing V
OH
/V
OL
.
Max
−870
−870
−1620
−1555
Units
mV
mV
mV
mV
mV
mV
mV
mV
mV
mV
µA
T
C
0˚C to
+125˚C
−55˚C
0˚C to
+125˚C
−55˚C
0˚C to
+125˚C
−55˚C
0˚C to
+125˚C
−55˚C
−55˚C
+125˚C
−55˚C to
+125˚C
−55˚C to
+125˚C
Conditions
Notes
V
IN
= V
IH
(Max)
or V
IL
(Min)
Loading with
50Ω to −2.0V
1, 2, 3
V
IN
= V
IH
(Min)
or V
IL
(Max)
Loading with
50Ω0 to −2.0V
1, 2, 3
−1165
−1830
0.50
−870
−1475
Guaranteed HIGH Signal
for All Inputs
Guaranteed LOW Signal
for All Inputs
V
EE
= −4.2V
V
IN
= V
IL
(Min)
1, 2, 3, 4
1, 2, 3,4
1, 2, 3
µA
µA
0˚C to
+125˚C
−55˚C
V
EE
= −5.7V
V
IN
= V
IH
(Max)
Inputs Open
1, 2, 3
1, 2, 3
3
www.national.com
AC Electrical Characteristics
V
EE
= −4.2V to −5.7V, V
CC
= V
CCA
= GND
Symbol
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
TLH
t
THL
Parameter
Propagation Delay
D
2a
–D
2e
to O, O
Propagation Delay
D
1a
–D
1e
to O, O
Propagation Delay
Data to F
Transition Time
20% to 80%, 80% to 20%
0.20
1.70
0.30
1.60
0.20
1.70
ns
4
0.80
2.90
0.90
2.80
0.90
3.40
ns
0.30
1.90
0.40
1.80
0.40
2.20
ns
1, 2, 3
T
C
= −55˚C
Min
0.30
Max
2.10
T
C
= +25˚C
Min
0.40
Max
1.90
T
C
= +125˚C
Min
0.40
Max
2.40
ns
Units
Conditions
Notes
Figures 1, 2
Note 7:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 8:
Screen tested 100% on each device at +25˚C temperature only, Subgroup A9.
Note 9:
Sample tested (Method 5005, Table I) on each mfg. lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11.
Note 10:
Not tested at +25˚C, +125˚C, and −55˚C temperature (design characterization data).
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