REVISIONS
LTR
A
B
C
D
DESCRIPTION
Changes in accordance with NOR 5962-R275-94.
Changes in accordance with NOR 5962-R365-97.
Add device types 03, 04, and CAGE code 88379. Correct note 1 in
table I.
Corrections to tables I and II.
DATE
(YR-MO-DA)
94-09-14
97-06-19
98-01-15
98-05-14
APPROVED
K. A. Cottongim
K. A. Cottongim
K. A. Cottongim
K. A. Cottongim
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
D
15
D
16
D
17
D
18
REV
SHEET
PREPARED BY
Steve L. Duncan
D
19
D
1
D
2
D
3
D
4
D
5
D
6
D
7
D
8
D
9
D
10
D
11
D
12
D
13
D
14
PMIC N/A
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DEFENSE SUPPLY CENTER COLUMBUS
P. O. BOX 3990
COLUMBUS, OHIO 43216-5000
CHECKED BY
Michael C. Jones
APPROVED BY
Gregory Lude
MICROCIRCUIT, HYBRID, LINEAR, DUAL REDUNDANT
REMOTE TERMINAL UNIT (RTU)
DRAWING APPROVAL DATE
91-11-25
SIZE
REVISION LEVEL
D
CAGE CODE
AMSC N/A
A
SHEET
67268
1
OF
19
5962-89798
DSCC FORM 2233
APR 97
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
5962-E309-98
1. SCOPE
1.1 Scope. This drawing describes device requirements for class H hybrid microcircuits to be processed in accordance with
MIL-PRF-38534.
1.2 Part or Identifying Number (PIN). The complete PIN shall be as shown in the following example:
5962-89798
Drawing number
01
Device type
(See 1.2.1)
X
Case outline
(See 1.2.2)
X
Lead finish
(See 1.2.3)
1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows:
Device types
01
02
03
04
Generic number
BUS-65142, BUS-65144,
BUS-65143, BUS-65145,
CT2542, CT2542-FP
CT2543, CT2543-FP
Circuit function
Dual redundant remote terminal unit (RTU)
Dual redundant remote terminal unit (RTU)
Dual redundant remote terminal unit (RTU)
Dual redundant remote terminal unit (RTU)
1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows:
Outline letter
X
Y
Descriptive designator
See figure 1
See figure 1
Terminals
78
82
Package style
Hybrid package
Flat package
1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings. 1/
Logic supply voltage (V
L
) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Negative supply voltage (V
EE
) . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . .
Thermal rise, case to junction (
T
J
) . . . . . . . . . . . . . . . . . . . . .
Lead soldering temperature (10 seconds) . . . . . . . . . . . . . . . .
Power dissipation (T
C
= +125(C) . . . . . . . . . . . . . . . . . . . . . . .
1.4 Recommended operating conditions.
Logic supply voltage (V
L
) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Negative supply voltage (V
EE
):
Device types 01 and 03 . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Device types 02 and 04 . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Case operating temperature range (T
C
) . . . . . . . . . . . . . . . . . .
Maximum differential input voltage . . . . . . . . . . . . . . . . . . . . . .
+4.5 V dc to +5.5 V dc
-14.25 V dc to -15.75 V dc
-11.4 V dc to -12.6 V dc
-55(C to +125(C
40 Vp-p
5.5 V dc
-18.0 V dc
-65(C to +150(C
13.9(C
+300(C
Duty cycle dependent (see table I power supplies)
1/
Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
SIZE
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
A
REVISION LEVEL
D
5962-89798
SHEET
2
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbook. The following specification, standards, and handbook form a part of
this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the
issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the
solitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883
MIL-STD-973
MIL-STD-1553
MIL-STD-1835
HANDBOOK
DEPARTMENT OF DEFENSE
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Unless otherwise indicated, copies of the specification, standards, and handbook are available from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements shall be in accordance with MIL-PRF-38534.
Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturer's
Quality Management (QM) plan or as designated for applicable device class. Therefore, the tests and inspections herein may
not be performed for applicable device class (see MIL-PRF-38534). Futhermore, the manufacturers may take exceptions or use
alternate methods to the tests and inspections herein and not perform them. However, the performance requirements as defined
in MIL-PRF-38534 shall be met for the applicable device class. The modification in the QM plan shall not affect the form, fit, or
function as described herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in
MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 and figure 1 herein.
3.2.2 Terminal connections and pin functions. The terminal connections and pin functions shall be as specified on figure 2.
-
-
-
-
Test Methods and Procedures for Microelectronics.
Configuration Management.
Aircraft Internal Time Division Command/Response Multiplex Bus.
Microcircuit Case Outlines.
SIZE
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
A
REVISION LEVEL
D
5962-89798
SHEET
3
3.2.3 Block diagram. Block diagram shall be as specified on figure 3.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with
the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked as listed in QML-38534.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample,
for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those
which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be
made available to the preparing activity (DSCC-VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets
the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified
in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or
function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a.
Burn-in test, method 1015 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified
in test method 1015 of MIL-STD-883.
T A as specified in accordance with table I of method 1015 of MIL-STD-883.
(2)
b.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests
prior to burn-in are optional at the discretion of the manufacturer.
SIZE
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
A
REVISION LEVEL
D
5962-89798
SHEET
4
TABLE I. Electrical performance characteristics.
Symbol
Z
IN
diff
V
IN
diff
V
TH
CMRR
CMV
V
OUT
diff
t
r
, t
f
N
OUT
Conditions
1/
-55(C < T
C
< +125(C
unless otherwise specified
DC to 1 MHz 2/
2/
Direct
coupled (across
356
load)
Transformer
coupled (across
706
load)
DC to 2 MHz 2/ 3/
DC to 2 MHz 2/ 3/
Direct
coupled (across
356
load)
Transformer
coupled (across
706
load)
Transformer
coupled (across
706 load) 10 to 90 percent
of
full waveform peak to
peak. In accordance with
MIL-STD-1553.
2/ 3/
V
L
= 5.5 V
Group
A
subgroups
Device
types
Unit
Test
Limits
Min
Max
40
1.2
0.86
+10
9.0
27.0
300
14
Receiver
Differential input
impedance
Differential input
voltage
Input threshold
1, 2, 3
All
4
k6
1, 2, 3
All
Vp-p
4, 5, 6
All
Vp-p
Common mode
rejection ratio
Common mode voltage
1, 2, 3
All
40
dB
1, 2, 3
All
-10
V
Transmitter
Differential
output voltage
4, 5, 6
9, 10, 11
4, 5, 6
All
6.0
18.0
100
Vp-p
ns
mVp-p
V
Output rise and
fall time
All
Output noise
All
Logic
High level
V
IH
input voltage
See footnotes at end of table.
1, 2, 3
All
2.4
SIZE
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
A
REVISION LEVEL
D
5962-89798
SHEET
5
意法半导体-低功耗射频
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