电子工程世界电子工程世界电子工程世界

关键词

搜索

型号

搜索

T493D336M035BK6211

产品描述Tantalum Capacitor, Tantalum (dry/solid),
产品类别无源元件    电容器   
文件大小1MB,共26页
制造商KEMET(基美)
官网地址http://www.kemet.com
下载文档 详细参数 全文预览

T493D336M035BK6211概述

Tantalum Capacitor, Tantalum (dry/solid),

T493D336M035BK6211规格参数

参数名称属性值
JESD-609代码e0
包装方法TR, Embossed Plastic, 7 Inch
表面贴装YES
端子面层Tin/Lead (Sn90Pb10)
端子形状J BEND
端子数量2
封装形式SMT
最高工作温度125 °C
最低工作温度-55 °C
是否Rohs认证No
Objectid7006584945
Reach Compliance CodeCompliant
ECCN代码EAR99
YTEOL6.75
包装说明, 2917
Country Of OriginMexico
Is SamacsysN
其他特性ESR IS MEASURED AT 100 KHZ
漏电流0.0116 mA
Delta切线0.06
电容器类型TANTALUM CAPACITOR
安装特点SURFACE MOUNT
负容差20%
正容差20%
额定(直流)电压(URdc)35 V
尺寸代码2917
电容33 µF
介电材料TANTALUM (DRY/SOLID)
ESR300 mΩ
极性POLARIZED
高度2.8 mm
长度7.3 mm
宽度4.3 mm

文档预览

下载PDF文档
Tantalum Surface Mount Capacitors – High Reliability
T493 High Reliability Alternative MnO
2
(CWR11 Style)
Overview
The KEMET T493 is designed for the High Reliability
Series (HRA) requirements of military and aerospace
applications. The T493 is a surface mount product,
offering various lead-frame plating options, Weibull grading
options, surge current testing, F-Tech (an improved anode
manufacturing process), and Simulated Breakdown Voltage
(SBDV) screening options to improve long term reliability.
Standard, low, and ultra-low ESR options are available.
All lots of T493 are conditioned with MIL-PRF-55365
Group A testing. This series is also approved for DLA
drawing 07016 (please see part number list specific to this
drawing).
KEMET’s F-Tech eliminates hidden defects in the dielectric,
which continue to grow in the field, causing capacitor
failures. Based on the fundamental understanding of
degradation mechanisms in tantalum and niobium
capacitors, F-Tech incorporates multiple process
methodologies. Some minimize the oxygen and carbon
content in the anodes, which become contaminants
and can lead to the crystallization of the anodic oxide
dielectric. This process methodology reduces the
contaminants, improving quality of the dielectric. An
additional technology provides a stronger mechanical
connection point between the tantalum lead wire and
tantalum anode, enhancing robustness and product
reliability. The benefit of F-Tech is illustrated by a 2,000
hour, 85°C, 1.32 X rated voltage accelerated life test.
F-Tech parts see no degradation while standard tantalums
have 1.5 orders of magnitude degradation in leakage
current. F-Tech is currently available for T493 Series
(select D and X case capacitance values in 25 V and
higher rated voltage). Please contact KEMET for details on
ordering other part types with these capabilities.
The KEMET patented Simulated Breakdown Screening (SBDS)
is a nondestructive testing technique that simulates the
breakdown voltage (BDV) of a capacitor, without the damage
to its dielectric or to the general population of capacitors.
This screening identifies hidden defects in the dielectric,
providing the highest level of dielectric testing. SBDS is
based on the simulation of breakdown voltage (BDV), the
ultimate test of the dielectric in a capacitor.
Low BDV indicates defects in the dielectric, and therefore, a
higher probability of failure in the field. High BDV indicates
a stronger dielectric and high-reliability performance in the
field. This new screening method allows KEMET to identify
the breakdown voltage of each individual capacitor and
provide only the strongest capacitors from each lot.
SBDS is currently available on select part types in the T493
and T497. Please contact KEMET for details on ordering other
part types with these capabilities.
KEMET offers these technologies per the following options:
• F-Tech only
• SBDS only
• Combination of both F-Tech and SBDS for the ultimate
protection
Click image above for interactive 3D content
Open PDF in Adobe Reader for full functionality
One world. One KEMET
© KEMET Electronics Corporation • KEMET Tower • One East Broward Boulevard
Fort Lauderdale, FL 33301 USA • 954-766-2800 • www.kemet.com
T2007_T493 • 2/14/2020
1
键盘上的人生
http://www.5time.cn/attachments/0812/ec49183fe4fcce2c5a1ee9c89a21ed02.jpg 想一想,你真的竭尽所能了吗? http://www.5time.cn/attachments/0812/1082e46a43c763b8e4a680c6276c4003.jpg ......
sunhope 聊聊、笑笑、闹闹
SD WiFi 插拔之后工作不正常(Wince 5.0) Urgent
SD WiFi在首次插入后均可以与指定AP(Access Point)成功连接,后经过一次拔插后,就无法工作了,只有重新系统才可以。经Trace log可知,无法得到BSSI List,其列表为空,由此可知,WiFi Adapter ......
yezhengmin 嵌入式系统
双电源运放正负电源怎么做啊?
如题,想用线性光耦HCNR201做个电池电压隔离检测电路官方参考电路用Multisim仿真了下,运放要有负电压输出,双电源供电结果才正确 怎么做正负电源啊?要用电池(30-60V)供电做,地好像也没法 ......
hsmywgc2012 模拟电子
msp430g2331超声波测距不准确
/*请教一个小小的问题,我用msp430g2331超声波测距模块测距,用数码管显示,但发现我测量的数据都比实际值大1.5-1,8倍,我不太清楚程序时序如何,但也不会差距如此大,难道是超声波模块有问题吗 ......
dadangjia 微控制器 MCU
MSP430F149 串口1设置问题
***************************************************************************************************/ #include "io430.h" #include //引用本征函数需包含本头文件 #include "nbc43 ......
c316348771 微控制器 MCU
VISHAY电容讲座PPT、参考设计及datasheet集锦
薄膜电容在工业DC-Link上的应用 Douglas Pang Regional Marketing Manager Vishay Capacitors Divisions, Asia 58384 Wet Tantalum Capacitors Parameter Comparison Guide.pdf 58385 ......
EEWORLD社区 分立器件

 
EEWorld订阅号

 
EEWorld服务号

 
汽车开发圈

 
机器人开发圈

About Us 关于我们 客户服务 联系方式 器件索引 网站地图 最新更新 手机版

站点相关: 大学堂 TI培训 Datasheet 电子工程 索引文件: 1224  1080  1937  2483  2188  25  22  39  50  45 

器件索引   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

北京市海淀区中关村大街18号B座15层1530室 电话:(010)82350740 邮编:100190

电子工程世界版权所有 京B2-20211791 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号 Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved