IDT54/74FCT16823AT/BT/CT/ET
FAST CMOS 18-BIT REGISTER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
FAST CMOS 18-BIT
REGISTER
IDT54/74FCT16823AT/BT/CT/ET
FEATURES:
•
•
•
•
•
•
•
•
•
•
0.5 MICRON CMOS Technology
High-speed, low-power CMOS replacement for ABT functions
Typical t
SK(o)
(Output Skew) < 250ps
Low input and output leakage
≤
1µA (max.)
ESD > 2000V per MIL-STD-883, Method 3015; > 200V using
machine model (C = 200pF, R = 0)
V
CC
= 5V ± 10%
High drive outputs (-32mA I
OH
, 64mA I
OL
)
Power off disable outputs permit “live insertion”
Typical V
OLP
(Output Ground Bounce) < 1.0V at V
CC
= 5V,
T
A
= 25°C
Available in the following packages:
– Industrial: SSOP, TSSOP
– Military: CERPACK
DESCRIPTION:
The FCT16823T 18-bit bus interface registers are built using advanced,
dual metal CMOS technology. These high-speed, low-power registers with
clock enable (xCLKEN) and clear (xCLR) controls are ideal for parity bus
interfacing in high-performance synchronous systems. The control inputs
are organized to operate the device as two 9-bit registers or one 18-bit
register. Flow-through organization of signal pins simplifies layout. All inputs
are designed with hysteresis for improved noise margin.
The FCT16823T is ideally suited for driving high-capacitance loads and
low-impedance backplanes. The output buffers are designed with power off
disable capability to allow "live insertion" of boards when used as backplane
drivers.
FUNCTIONAL BLOCK DIAGRAM
2
1
OE
1
CLR
1
CLK
55
1
CLKEN
2
CLKEN
1
56
2
CLK
2
OE
2
CLR
27
28
29
30
R
C
D
54
1
D
1
2
D
1
3
1
Q
1
42
R
C
D
15
2
Q
1
TO EIGHT OTHER CHANNELS
TO EIGHT OTHER CHANNELS
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
1
2002
Integrated Device Technology, Inc.
MAY 2002
DSC-5438/1
IDT54/74FCT16823AT/BT/CT/ET
FAST CMOS 18-BIT REGISTER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
PIN CONFIGURATION
1
CLR
1
OE
1
Q
1
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Description
Terminal Voltage with Respect to GND
Terminal Voltage with Respect to GND
Storage Temperature
DC Output Current
Max
–0.5 to +7
–0.5 to V
CC
+0.5
–65 to +150
–60 to +120
Unit
V
V
°C
mA
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
1
CLK
1
CLKEN
1
D
1
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
V
TERM(2)
V
TERM(3)
T
STG
I
OUT
GND
1
Q
2
1
Q
3
GND
1
D
2
1
D
3
V
CC
1
Q
4
1
Q
5
1
Q
6
V
CC
1
D
4
1
D
5
1
D
6
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. All device terminals except FCT162XXX Output and I/O terminals.
3. Output and I/O terminals for FCT162XXX.
CAPACITANCE
(T
A
= +25°C, F = 1.0MHz)
Symbol
C
IN
C
OUT
Parameter
(1)
Input Capacitance
Output Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ.
3.5
3.5
Max.
6
8
Unit
pF
pF
GND
1
Q
7
1
Q
8
1
Q
9
2
Q
1
2
Q
2
2
Q
3
GND
1
D
7
1
D
8
1
D
9
2
D
1
2
D
2
2
D
3
NOTE:
1. This parameter is measured at characterization but not tested.
PIN DESCRIPTION
Pin Names
xDx
xCLK
xCLKEN
xCLR
xOE
xQx
Description
Data Inputs
Clock Inputs
Clock Enable Inputs (Active LOW)
Asynchronous Clear Inputs (Active LOW)
Output Enable Inputs (Active LOW)
3-State Outputs
GND
2
Q
4
2
Q
5
2
Q
6
GND
2
D
4
2
D
5
2
D
6
V
CC
2
Q
7
2
Q
8
V
CC
2
D
7
2
D
8
GND
2
Q
9
2
OE
2
CLR
GND
2
D
9
2
CLKEN
2
CLK
FUNCTION TABLE
(1)
xOE
H
L
L
H
H
L
L
xCLR
X
L
H
H
H
H
H
Inputs
xCLKEN
X
X
H
L
L
L
L
xCLK
X
X
X
↑
↑
↑
↑
xDx
X
X
X
L
H
L
H
Outputs
xQx
Z
L
Q
(2)
Z
Z
L
H
Function
High Z
Clear
Hold
Load
SSOP/ TSSOP/ CERPACK
TOP VIEW
NOTES:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
Z = High-Impedance
2. Output level before indicated steady-state input conditions were established.
2
IDT54/74FCT16823AT/BT/CT/ET
FAST CMOS 18-BIT REGISTER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: T
A
= –40°C to +85°C, V
CC
= 5.0V ±10%; Military: T
A
= –55°C to +125°C, V
CC
= 5.0V ±10%
Symbol
V
IH
V
IL
I
IH
I
IL
I
OZH
I
OZL
V
IK
I
OS
V
H
I
CCL
I
CCH
I
CCZ
Parameter
Input HIGH Level
Input LOW Level
Input HIGH Current (Input pins)
(5)
Input HIGH Current (I/O pins)
(5)
Input LOW Current (Input pins)
(5)
Input LOW Current (I/O pins)
(5)
High Impedance Output Current
(3-State Output pins)
(5)
Clamp Diode Voltage
Short Circuit Current
Input Hysteresis
Quiescent Power Supply Current
V
CC
= Max.
V
IN
= GND or V
CC
V
CC
= Min., I
IN
= –18mA
V
CC
= Max., V
O
= GND
(3)
—
V
CC
= Max.
V
O
= 2.7V
V
O
= 0.5V
V
I
= GND
Test Conditions
(1)
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
V
CC
= Max.
V
I
= V
CC
Min.
2
—
—
—
—
—
—
—
—
–80
—
—
Typ.
(2)
—
—
—
—
—
—
—
—
–0.7
–140
100
5
Max.
—
0.8
±1
±1
±1
±1
±1
±1
–1.2
–250
—
500
V
mA
mV
µA
µA
Unit
V
V
µA
OUTPUT DRIVE CHARACTERISTICS
Symbol
I
O
V
OH
Parameter
Output Drive Current
Output HIGH Voltage
Test Conditions
(1)
V
CC
= Max., V
O
= 2.5V
(3)
V
CC
= Min.
V
IN
= V
IH
or V
IL
I
OH
= –3mA
I
OH
= –12mA MIL
I
OH
= –15mA IND
I
OH
= –24mA MIL
V
OH
I
OFF
Output LOW Voltage
Input/Output Power Off Leakage
(5)
V
CC
= Min.
V
IN
= V
IH
or V
IL
V
CC
= 0V, V
IN
or V
O
≤
4.5V
I
OH
= –32mA IND
(4)
I
OL
= 48mA MIL
I
OL
= 64mA IND
Min.
–50
2.5
2.4
2
—
—
Typ.
(2)
—
3.5
3.5
3
0.2
—
Max.
–180
—
—
—
0.55
±1
V
µA
Unit
mA
V
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. The test limit for this parameter is ±5µA at T
A
= -55°C.
3
IDT54/74FCT16823AT/BT/CT/ET
FAST CMOS 18-BIT REGISTER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
Symbol
∆I
CC
I
CCD
Parameter
Quiescent Power Supply
Current TTL Inputs HIGH
Dynamic Power Supply Current
(4)
Test Conditions
(1)
V
CC
= Max.
V
IN
= 3.4V
(3)
V
CC
= Max.,
Outputs Open
xOE = xCLKEN = GND
One Input Toggling
50% Duty Cycle
V
CC
= Max.,
Outputs Open
f
CP
= 10MHz
50% Duty Cycle
xOE = xCLKEN = GND
fi = 5MHz
50% Duty Cycle
One Bit Toggling
V
CC
= Max.,
Outputs Open
f
CP
= 10MHz
50% Duty Cycle
xOE = xCLKEN = GND
fi = 2.5MHz
50% Duty Cycle
Eighteen Bits Toggling
Min.
—
—
Typ.
(2)
0.5
75
Max.
1.5
120
Unit
mA
µA/
MHz
V
IN
= V
CC
V
IN
= GND
I
C
Total Power Supply Current
(6)
V
IN
= V
CC
V
IN
= GND
—
0.8
1.7
mA
V
IN
= 3.4V
V
IN
= GND
—
1.3
3.2
V
IN
= V
CC
V
IN
= GND
—
4.2
7.1
(5)
V
IN
= 3.4V
V
IN
= GND
—
9.2
22.1
(5)
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Per TTL driven input (V
IN
= 3.4V). All other inputs at V
CC
or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed but not tested.
6. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
∆I
CC
D
H
N
T
+ I
CCD
(f
CP
N
CP
/2 + fiNi)
I
CC
= Quiescent Current (I
CCL
, I
CCH
and I
CCZ
)
∆I
CC
= Power Supply Current for a TTL High Input (V
IN
= 3.4V)
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at D
H
I
CCD
= Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
f
CP
= Clock Frequency for Register Devices (Zero for Non-Register Devices)
N
CP
= Number of Clock Inputs at f
CP
f
i
= Input Frequency
N
i
= Number of Inputs at f
i
4
IDT54/74FCT16823AT/BT/CT/ET
FAST CMOS 18-BIT REGISTER
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE - INDUSTRIAL
FCT16823AT
Symbol
t
PLH
t
PHL
Parameter
Propagation Delay
CLK to xQx
Condition
(1)
C
L
= 50pF
R
L
= 500Ω
C
L
= 300pF
(5)
R
L
= 500Ω
t
PHL
t
PHZ
t
PLZ
Propagation Delay
xCLR to xQx
Output EnableTime
xOE to xQx
C
L
= 50pF
R
L
= 500Ω
C
L
= 50pF
R
L
= 500Ω
C
L
= 300pF
(5)
R
L
= 500Ω
t
PHZ
Output Disable Time
xOE to xQx
C
L
= 5pF
(5)
R
L
= 500Ω
C
L
= 50pF
)
R
L
= 500Ω
t
SU
t
H
t
SU
t
H
t
W
t
W
t
REM
t
SK
(o)
Set-up Time HIGH or LOW, xDx to xCLK
Hold Time HIGH or LOW, xDx to xCLK
Set-up Time HIGH or LOW, xCLKEN to xCLK
Hold Time HIGH or LOW, xCLKEN to xCLK
xCLK Pulse Width HIGH or LOW
xCLR Pulse Width LOW
Recovery Time xCLR to xCLK
Output Skew
(3)
C
L
= 50pF
R
L
= 500Ω
1.5
1.5
1.5
1.5
1.5
3
1.5
3
0
6
6
6
—
14
12
23
7
8
—
—
—
—
—
—
—
0.5
1.5
1.5
1.5
1.5
1.5
3
1.5
3
0
6
6
6
—
9
8
15
6.5
7.5
—
—
—
—
—
—
—
0.5
1.5
1.5
1.5
1.5
1.5
2
1.5
3
0
3.3
3.3
6
—
6.1
5.5
12.5
5.2
6.5
—
—
—
—
—
—
—
0.5
1.5
1.5
1.5
1.5
1.5
1.5
0
2.5
0
3
(4)
3
(4)
3
—
4.4
4.4
9
3.6
3.6
—
—
—
—
—
—
—
0.5
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Min
.
(2)
1.5
1.5
Max
.
10
20
FCT16823BT FCT16823CT
Min
.
(2)
Max
.
1.5
1.5
7.5
15
Min
.
(2)
Max
.
1.5
1.5
6
12.5
FCT16823ET
Min
.
(2)
1.5
1.5
Max
.
4.4
8
Unit
ns
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. Skew between any two outputs, of the same package, switching in the same direction. This parameter is guaranteed by design.
4. This limit is guaranteed but not tested.
5. This condition is guaranteed but not tested.
5
嵌入式系统
京公网安备 11010802033920号
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved
电子工程世界
