Voltage Regulators
AN78Lxx/AN78LxxM Series
3-pin positive output voltage regulator (100 mA type)
I
Overview
The AN78Lxx series and the AN78LxxM series are 3-
pin fixed positive output type monolithic voltage regula-
tor.
A stabilized fixed output voltage is obtained from an
unstable DC input voltage without using any external
parts. 12 types of fixed output voltage are available; 4V,
5V, 6V, 7V, 8V, 9V, 10V, 12V, 15V, 18V, 20V and 24V.
They can be used widely as power circuits with a current
capacity of up to 100mA.
AN78Lxx series
5.0±0.2
Unit: mm
4.0±0.2
(1.0)
5.1±0.2
2.3±0.2
0.6±0.15
(1.0)
13.5±0.5
0.43
+0.1
–0.05
0.43
+0.1
–0.05
I
Features
•
No external components
•
Output voltage: 4V, 5V, 6V, 7V, 8V, 9V, 10V, 12V, 15V,
18V, 20V, 24V
•
Built-in overcurrent limit circuit
•
Built-in thermal overload protection circuit
2.54
2 3 1
1: Input
2: Output
3: Common
SSIP003-P-0000
AN78LxxM series
4.6 max.
1.8 max.
Unit: mm
1.6 max.
2.6 typ.
0.48 max.
1.5
3.0
0.58 max.
1.5
0.8 min.
4.25 max.
2.6 max.
0.44 max.
3
2
1
1: Output
2: Common
3: Input
HSIP003-P-0000B
Note) The packages (SSIP003-P-0000 and HSIP003-
P-0000B) of this product will be changed to
I
Block Diagram
(AN78Lxx series)
1
Pass Tr
Q
1
Current
Source
Current
Limiter
R
SC
2
Starter
Voltage
Reference
Output
(1)
Input
(3)
lead-free type (SSIP003-P-0000S and
HSIP003-P-0000Q). See the new package di-
mensions section later of this datasheet.
+
Error Amp.
R
2
Thermal
Protection
R
1
3
−
Common
(2)
Note) The number in ( ) shows the pin number for the AN78LxxM series.
Publication date: Jaunuary 2002
SFF00005CEB
1
AN78Lxx/AN78LxxM Series
I
Absolute Maximum Ratings at T
a
=
25°C
Parameter
Input voltage
Power dissipation
Operating ambient temperature
Storage temperature
AN78Lxx series
AN78LxxM series
Symbol
V
I
P
D
T
opr
T
stg
Rating
35 *
1
40 *
2
650 *
3
−30
to
+80
−55
to
+150
−55
to
+125
Unit
V
V
mW
°C
°C
*1 AN78L04/M, AN78L05/M, AN78L06/M, AN78L07/M, AN78L08/M, AN78L09/M, AN78L10/M, AN78L12/M, AN78L15/M
*2 AN78L18/M, AN78L20/M, AN78L24/M
*3 Follow the derating curve. When T
j
exceeds 150°C, the internal circuit cuts off the output.
AN78LxxM series is mounted on a standard board (glass epoxy: 20mm
×
20mm
×
t1.7mm with Cu foil of 1cm
2
or more).
I
Electrical Characteristics at T
a
=
25°C
•
AN78L04, AN78L04M (4V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
=
6.5 to 19V, I
O
=
1 to 70mA
V
I
=
6.5 to 19V, T
j
=
25°C
V
I
=
7 to 19V, T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
=
7 to 19V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz
V
I
=
7 to 17V, I
O
=
40mA, f
=
120Hz
T
j
=
25°C
T
j
=
25°C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125°C
48
40
58
1.7
140
−
0.6
Conditions
Min
3.84
3.8
50
40
10
4.5
2
Typ
4
Max
4.16
4.2
145
95
55
30
3
1
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
9V, I
O
=
40mA, C
I
=
0.33µF, C
O
=
0.1µF, T
j
=
0 to 125°C (AN78L04) and T
j
=
0 to 100°C
(AN78L04M)
2
SFF00005CEB
AN78Lxx/AN78LxxM Series
I
Electrical Characteristics at T
a
=
25°C (continued)
•
AN78L05, AN78L05M (5V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
=
7.5 to 20V, I
O
=
1 to 70mA
V
I
=
7.5 to 20V, T
j
=
25°C
V
I
=
8 to 20V, T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
=
8 to 20V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz
V
I
=
8 to 18V, I
O
=
40mA, f
=
120Hz
T
j
=
25°C
T
j
=
25°C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125°C
47
40
57
1.7
140
−
0.65
Conditions
Min
4.8
4.75
55
45
11
5
2
Typ
5
Max
5.2
5.25
150
100
60
30
3
1
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
10V, I
O
=
40mA, C
I
=
0.33µF, C
O
=
0.1µF, T
j
=
0 to 125°C (AN78L05) and T
j
=
0 to 100°C
(AN78L05M)
•
AN78L06, AN78L06M (6V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
=
8.5 to 21V, I
O
=
1 to 70mA
V
I
=
8.5 to 21V, T
j
=
25°C
V
I
=
9 to 21V, T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
=
9 to 21V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz
V
I
=
9 to 19V, I
O
=
40mA, f
=
120Hz
T
j
=
25°C
T
j
=
25°C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125°C
46
50
56
1.7
140
−
0.7
Conditions
Min
5.76
5.7
60
50
12
5.5
2
Typ
6
Max
6.24
6.3
155
105
65
35
3
1
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
11V, I
O
=
40mA, C
I
=
0.33µF, C
O
=
0.1µF, T
j
=
0 to 125°C (AN78L06) and T
j
=
0 to 100°C
(AN78L06M)
SFF00005CEB
3
AN78Lxx/AN78LxxM Series
I
Electrical Characteristics at T
a
=
25°C (continued)
•
AN78L07, AN78L07M (7V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
=
9.5 to 22V, I
O
=
1 to 70mA
V
I
=
9.5 to 22V, T
j
=
25°C
V
I
=
10 to 22V, T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
=
10 to 22V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz
V
I
=
10 to 20V, I
O
=
40mA, f
=
120Hz
T
j
=
25°C
T
j
=
25°C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125°C
45
50
55
1.7
140
−
0.75
Conditions
Min
6.72
6.65
70
60
13
6
2
Typ
7
Max
7.28
7.35
165
115
75
35
3
1
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
12V, I
O
=
40mA, C
I
=
0.33µF, C
O
=
0.1µF, T
j
=
0 to 125°C (AN78L07) and T
j
=
0 to 100°C
(AN78L07M)
•
AN78L08, AN78L08M (8V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
=
10.5 to 23V, I
O
=
1 to 70mA
V
I
=
10.5 to 23V, T
j
=
25°C
V
I
=
11 to 23V, T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
=
11 to 23V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz
V
I
=
11 to 21V, I
O
=
40mA, f
=
120Hz
T
j
=
25°C
T
j
=
25°C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125°C
44
60
54
1.7
140
−
0.8
Conditions
Min
7.7
7.6
80
70
15
7
2
Typ
8
Max
8.3
8.4
175
125
80
40
3
1
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
14V, I
O
=
40mA, C
I
=
0.33µF, C
O
=
0.1µF, T
j
=
0 to 125°C (AN78L08) and T
j
=
0 to 100°C
(AN78L08M)
4
SFF00005CEB
AN78Lxx/AN78LxxM Series
I
Electrical Characteristics at T
a
=
25°C (continued)
•
AN78L09, AN78L09M (9V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
=
11.5 to 24V, I
O
=
1 to 70mA
V
I
=
11.5 to 24V, T
j
=
25°C
V
I
=
12 to 24V, T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
=
12 to 24V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz
V
I
=
12 to 22V, I
O
=
40mA, f
=
120Hz
T
j
=
25°C
T
j
=
25°C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125°C
43
65
53
1.7
140
−
0.85
Conditions
Min
8.64
8.55
90
80
16
8
2
Typ
9
Max
9.35
9.45
190
140
85
45
3
1
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
15V, I
O
=
40mA, C
I
=
0.33µF, C
O
=
0.1µF, T
j
=
0 to 125°C (AN78L09) and T
j
=
0 to 100°C
(AN78L09M)
•
AN78L10, AN78L10M (10V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
=
12.5 to 25V, I
O
=
1 to 70mA
V
I
=
12.5 to 25V, T
j
=
25°C
V
I
=
13 to 25V, T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
=
13 to 25V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz
V
I
=
13 to 23V, I
O
=
40mA, f
=
120Hz
T
j
=
25°C
T
j
=
25°C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125°C
42
70
52
1.7
140
−
0.9
Conditions
Min
9.6
9.5
100
90
17
9
2
Typ
10
Max
10.4
10.5
210
160
90
45
3
1
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
16V, I
O
=
40mA, C
I
=
0.33µF, C
O
=
0.1µF, T
j
=
0 to 125°C (AN78L10) and T
j
=
0 to 100°C
(AN78L10M)
SFF00005CEB
5
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