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8403701CA

产品描述HC/UH SERIES, QUAD 2-INPUT NAND GATE, CDIP14, CERAMIC, DIP-14
产品类别逻辑    逻辑   
文件大小151KB,共21页
制造商Intersil ( Renesas )
官网地址http://www.intersil.com/cda/home/
下载文档 详细参数 全文预览

8403701CA概述

HC/UH SERIES, QUAD 2-INPUT NAND GATE, CDIP14, CERAMIC, DIP-14

8403701CA规格参数

参数名称属性值
Objectid2078474166
零件包装代码DIP
包装说明DIP,
针数14
Reach Compliance Codeunknown
YTEOL0
系列HC/UH
JESD-30 代码R-GDIP-T14
长度19.56 mm
逻辑集成电路类型NAND GATE
湿度敏感等级NOT APPLICABLE
功能数量4
输入次数2
端子数量14
最高工作温度125 °C
最低工作温度-55 °C
封装主体材料CERAMIC, GLASS-SEALED
封装代码DIP
封装形状RECTANGULAR
封装形式IN-LINE
峰值回流温度(摄氏度)NOT APPLICABLE
传播延迟(tpd)135 ns
认证状态Not Qualified
座面最大高度5.08 mm
最大供电电压 (Vsup)6 V
最小供电电压 (Vsup)2 V
标称供电电压 (Vsup)5 V
表面贴装NO
技术CMOS
温度等级MILITARY
端子形式THROUGH-HOLE
端子节距2.54 mm
端子位置DUAL
处于峰值回流温度下的最长时间NOT APPLICABLE
宽度7.62 mm

8403701CA文档预览

Live Insertion
SDYA012
October 1996
1
IMPORTANT NOTICE
Texas Instruments (TI) reserves the right to make changes to its products or to discontinue any
semiconductor product or service without notice, and advises its customers to obtain the latest
version of relevant information to verify, before placing orders, that the information being relied
on is current.
TI warrants performance of its semiconductor products and related software to the specifications
applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality
control techniques are utilized to the extent TI deems necessary to support this warranty.
Specific testing of all parameters of each device is not necessarily performed, except those
mandated by government requirements.
Certain applications using semiconductor products may involve potential risks of death,
personal injury, or severe property or environmental damage (“Critical Applications”).
TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, INTENDED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT APPLICATIONS, DEVICES
OR SYSTEMS OR OTHER CRITICAL APPLICATIONS.
Inclusion of TI products in such applications is understood to be fully at the risk of the customer.
Use of TI products in such applications requires the written approval of an appropriate TI officer.
Questions concerning potential risk applications should be directed to TI through a local SC
sales office.
In order to minimize risks associated with the customer’s applications, adequate design and
operating safeguards should be provided by the customer to minimize inherent or procedural
hazards.
TI assumes no liability for applications assistance, customer product design, software
performance, or infringement of patents or services described herein. Nor does TI warrant or
represent that any license, either express or implied, is granted under any patent right, copyright,
mask work right, or other intellectual property right of TI covering or relating to any combination,
machine, or process in which such semiconductor products or services might be or are used.
Copyright
©
1996, Texas Instruments Incorporated
2
Contents
Title
Page
Abstract
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1
1 Introduction
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1
2 Internal Construction of Integrated Circuits
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2
3 Operating Conditions When Changing Modules With the Supply Voltage On
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3.1 GND and the signal line (SL) make contact first; the output of circuit N1 is low
. . . . . . . . . . . . . . . . . . . . . . . . . .
3.2 V
CC
and the signal line (SL) make contact first; the output of circuit N1 is low
. . . . . . . . . . . . . . . . . . . . . . . . . . .
3.3 GND and the signal line (SL) make contact first; the output of circuit N1 is high
. . . . . . . . . . . . . . . . . . . . . . . . .
3.4 V
CC
and the signal line (SL) make contact first; the output of circuit N1 is high
. . . . . . . . . . . . . . . . . . . . . . . . . .
3.5 V
CC
and GND make contact first . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
4
4
4
4
5
5
4 Simple Circuit Modifications
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
5
5 Avoidance of Bus Conflicts
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
6
6 Avoidance of Disturbances on the System Bus
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
7
7 Special Bus-Interface Circuits
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
11
8 Avoidance of Disturbances to the Supply Voltage
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
13
9 Summary
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
17
Acknowledgment
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
17
List of Illustrations
Figure
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Title
Page
Diodes in the Inputs and Outputs of Integrated Circuits
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2
Voltage-Monitoring Circuit in BiCMOS ICs
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
4
Simplified Circuit to Show Current Paths When Connecting a Module to a System
. . . . . . . . . . . . . . . . . . . . . . . . .
4
Improved Circuit Using Bipolar or BiCMOS Circuits
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
5
Curve for Calculating the Short-Circuit Currents That Occur With Bus Conflicts
. . . . . . . . . . . . . . . . . . . . . . . . . . .
6
Monitoring Bus-Interface Circuits
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
7
Connecting a Capacitor to a Line
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
8
Voltage Peaks When Making Contacts to Signal Lines (Without Voltage Bias)
. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
8
Connection of a Capacitor to a Line (With Voltage Bias)
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
9
Voltage Peaks When Making Contacts to Signal Lines (With Voltage Bias)
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
9
Generation of the Voltage Bias and Control of the Interface
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
10
Generation of the Voltage Bias and Control in the SN74ABTE16245
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
11
Bus-Interface Control in ETL Circuits
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
12
Bus-Interface Control With BTL Circuits
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
13
Widebus is a trademark of Texas Instruments Incorporated.
iii
List of Illustrations (Continued)
15
16
17
18
Equivalent Circuit of the Current Supply to a Module
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
14
Transient Behavior of the Supply Voltage at Switch On, With Various Degrees of Damping
. . . . . . . . . . . . . . . . .
15
Switch-On Delay Circuit Using a MOS Transistor
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
15
Decentralized Power Supply With Limiting of Switch-On Current
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
16
iv
Abstract
In many current applications, there is a requirement to exchange modules in electronic systems while the supply voltage
remains on. This procedure is commonly known as live insertion. To understand this requirement, consider the case of an
electronic telephone exchange in which replacing modules for maintenance or repair must be possible at any time without
interrupting the operation of the system. To avoid damage to components, and any interruption of operation when changing
modules in this way, additional circuitry modifications are necessary.
This report describes the phenomena that occur during live insertion, then presents circuit proposals to solve the potential
problems that might otherwise arise.
1 Introduction
For many years, diverse functions and processes have been monitored and controlled successfully by electronic systems. The
advantages of electronic controls in such cases (compared with manual or mechanical controls) are lower operating costs and
the improved reliability that electronics now provide. However, faults also can arise in such electronic systems, which then
require repair. By using modular construction for the equipment, it is possible to quickly exchange a defective module and clear
the fault.
With most equipment, it is necessary to switch off the supply voltage during the exchange of the modules to avoid incorrect
operation or destruction of components. In many cases–an obvious example is the computer in an office–the exchange of
modules while the equipment is turned off is permissible.
In many electronic systems, switching off the equipment to exchange a defective module is unacceptable. Examples include
an electronic telephone exchange, the switching control center of an electric utility, or the computer that processes data in the
air-traffic control center of an airport. In all of these cases, when a fault is found in a module, exchanging this module in a
running system without disturbing or otherwise compromising the rest of the system functions must be possible.
The engineer planning and developing electronic systems for such applications must consider the operating states that can arise
and meet these requirements by choosing appropriate components and circuitry layout.
A distinction must be made at this point between two different cases. In the first, it is necessary only to ensure that a module
or a part of the installation can be exchanged during operation without switching off the system and without damaging it. In
such cases, it can be acceptable (for reasons described later) that the operation of the equipment is disturbed. An example is
the installation or exchange of a printer for an operating office computer. The primary requirement is the simple and safe
operation of the entire system; in this case, the requirements can be fulfilled by choosing appropriate components for
the interfaces.
In the second case, the additional requirement must be met that, during exchange of the modules, the components involved
should neither be damaged, nor should the operation be disturbed. To ensure this, beside choosing the appropriate components,
the development engineer also must incorporate additional circuit modifications to allow continuous and reliable operation
of the system.
This applications report provides the development engineer with suggestions for fulfilling these requirements. The report
begins with the choice of the most appropriate components for the application, and continues with a description of circuit
modifications that are necessary under the operating conditions described.
1

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