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EN29LV010-55NIP

产品描述Flash, 128KX8, 55ns, PBGA34
产品类别存储    存储   
文件大小383KB,共36页
制造商Eon
官网地址http://www.essi.com.tw/
标准
下载文档 详细参数 全文预览

EN29LV010-55NIP概述

Flash, 128KX8, 55ns, PBGA34

EN29LV010-55NIP规格参数

参数名称属性值
是否Rohs认证符合
Objectid109398742
包装说明FBGA, BGA34,6X9,20
Reach Compliance Codeunknown
ECCN代码EAR99
YTEOL0
最长访问时间55 ns
命令用户界面YES
数据轮询YES
耐久性100000 Write/Erase Cycles
JESD-30 代码R-PBGA-B34
内存密度1048576 bit
内存集成电路类型FLASH
内存宽度8
部门数/规模8
端子数量34
字数131072 words
字数代码128000
最高工作温度85 °C
最低工作温度-40 °C
组织128KX8
封装主体材料PLASTIC/EPOXY
封装代码FBGA
封装等效代码BGA34,6X9,20
封装形状RECTANGULAR
封装形式GRID ARRAY, FINE PITCH
并行/串行PARALLEL
认证状态Not Qualified
部门规模16K
最大待机电流0.000005 A
最大压摆率0.03 mA
表面贴装YES
技术CMOS
温度等级INDUSTRIAL
端子形式BALL
端子节距0.5 mm
端子位置BOTTOM
切换位YES
类型NOR TYPE

文档预览

下载PDF文档
EN29LV010
EN29LV010
da0.
1 Megabit (128K x 8-bit ) Uniform Sector,
CMOS 3.0 Volt-only Flash Memory
FEATURES
Single power supply operation
- Full voltage range: 2.7-3.6 volt read and write
operations for battery-powered applications.
- Regulated voltage range: 3.0-3.6 volt read
and write operations for high performance
3.3 volt microprocessors.
High performance
- Full voltage range: access times as fast as 55
ns
- Regulated voltage range: access times as fast
as 45ns
Low power consumption (typical values at 5
MHz)
- 7 mA typical active read current
- 15 mA typical program/erase current
- 1
μA
typical standby current (standard access
time to active mode)
-
-
-
-
Flexible Sector Architecture:
Eight 16 Kbyte sectors
Supports full chip erase
Individual sector erase supported
Sector protection and unprotection:
Hardware locking of sectors to prevent
program or erase operations within individual
sectors
High performance program/erase speed
- Byte program time: 8µs typical
- Sector erase time: 500ms typical
JEDEC Standard program and erase
commands
JEDEC standard
DATA
polling and toggle bits
feature
Single Sector and Chip Erase
Embedded Erase and Program Algorithms
Erase Suspend / Resume modes:
Read or program another Sector during
Erase Suspend Mode
triple-metal double-poly triple-well CMOS Flash
Technology
Low Vcc write inhibit < 2.5V
>100K program/erase endurance cycle
Package options
- 4mm x 6mm 34-ball WFBGA
- 8mm x 20mm 32-pin TSOP (Type 1)
- 8mm x 14mm 32-pin TSOP (Type 1)
- 32-pin PLCC
Commercial and industrial Temperature Range
GENERAL DESCRIPTION
The EN29LV010 is a 1-Megabit, electrically erasable, read/write non-volatile flash memory,
organized as 131,072 bytes. Any byte can be programmed typically in 8µs.The EN29LV010
features 3.0V voltage read and write operation, with access times as fast as 45ns to eliminate the
need for WAIT states in high-performance microprocessor systems.
The EN29LV010 has separate Output Enable (
OE
), Chip Enable (
CE
), and Write Enable (WE)
controls, which eliminate bus contention issues. This device is designed to allow either single Sector
or full chip erase operation, where each Sector can be individually protected against program/erase
operations or temporarily unprotected to erase or program. The device can sustain a minimum of
100K program/erase cycles on each Sector.
This Data Sheet may be revised by subsequent versions
1
or modifications due to changes in technical specifications.
©2003 Eon Silicon Solution, Inc., www.essi.com.tw
Rev. C, Issue Date: 2008/04/23
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