HITANO ENTERPRISE CORP.
7F-7, No. 3 Wu Chuan 1st Road, New Industrial Park, New Taipei City, TAIWAN R.O.C.
Tel.：886-2-2299 1331 (Rep.)
Fax：886-2-22982466 2298-2969
SPECIFICATION FOR CAPACITOR ARRAY
Series.
: C Series ultra small size
Description : Size 0201 , COG(NPO) , X7R, X5R
16Vdc ~ 50Vdc
DRAWN BY
蕭敏珍
CHECKED BY
蔡永承
APPROVED BY
巫宏俊
HITANO ENTERPRISE CORP.
1. INTRODUCTION
MLCC consists of a conducting material and electrodes. To manufacture a chip-type SMT and achieve miniaturization, high
density and high efficiency, ceramic condensers are used.
0201 MLCC is performed by high precision technology achieve high capacitance in unit size and ensure the stability and
reliability of products.
2. FEATURES
High capacitance in unit size.
High precision dimensional tolerances.
Suitable used in high-accuracy automatic
mounting machine.
3. APPLICATIONS
Miniature microwave module.
Portable equipments (ex. Mobile phone, PDA).
High frequency circuits.
4. HOW TO ORDER
C
Series
C=
series
0201
Size
0201
N
Dielectric
N=NP0
(C0G)
B=X7R
X=X5R
100
Capacitance
Two significant
no. of zeros. And
R is in place of
decimal point.
eg.:
0R5=0.5pF
1R0=1.0pF
100=10x10
=10pF
0
J
Tolerance
J=±5%
M=±20%
500
Rated voltage
N
Termination
V
Packaging
V=7”
reeled
Two significant digits
N=Nickel
barrier
followed by no. of
zeros. And R is in
point.
160=16
VDC
250=25
VDC
500=50
VDC
with 100﹪Tin
digits followed by
K=±10%
Z=+80-20%
place of decimal
5. EXTERNAL DIMENSIONS
L
Size
Inch (mm)
L (mm)
W (mm)
T (mm)/Symbol
M
B
(mm)
T
W
0201
0.60±0.03
0.30±0.03
0.30±0.03
T
0.15±0.05
M
B
M
B
Fig. 1 The outline of Capacitor
HITANO ENTERPRISE CORP.
6. GENERAL ELECTRICAL DATA
Dielectric
Size
Capacitance*
Capacitance tolerance
Rated voltage (WVDC)
Q*/D.F.
Insulation resistance at Ur
Operating temperature
Capacitance change
Termination
±30ppm
0.3pF to 100pF
J(±5%), K(±10%)
16V, 25V, 50V
Cap<30pF, Q
≥
400+20C
Cap
≥
30pF, Q
≥
1000
≥ 10G Ω
NPO
X7R
0201
100pF to 10nF
K(±10%), M(±20%)
6.3V, 10V, 16V, 25V, 50V
Ur=50V:
≤
3.0%
Ur=16V, 25V:
≤
3.5%
Ur=10V:
≤
5.0% Ur=6.3V:≤ 10%
X5R
100pF to 0.22µF
K(±10%), M(±20%)
6.3V,10V, 16V,25V,50V
Ur=50V:
≤
3.0%
Ur=16V, 25V:
≤
3.5%
Ur=10V:
≤
5.0% Ur=6.3V:≤ 10%
≥ 10G Ω or RxC ≥ 500 Ω xF whichever is less
-55 to +125℃
-55 to +85℃
±15%
Cu(or Ag)/Ni/Sn (lead-free termination)
* Measured at the conditions of 30~70% related humidity.
NP0: Apply 1.0 ± 0.2Vrms, 1.0MHz ± 10% at the condition of
25°C ambient temperature
X7R/X5R: Apply 1.0 ± 0.2Vrms, 1.0kHz ± 10% at the condition of
25°C ambient temperature
Preconditioning for Class II MLCC: Perform a heat treatment at 150 ± 10
℃
for 1 hour, then leave in ambient condition for 24 ± 2 hours before
measurement.
7. CAPACITANCE RANGE
SIZE
DIELECTRIC
RATED VOLTAGE
100pF (101)
150pF (151)
180pF (181)
220pF (221)
330pF (331)
470pF (471)
680pF (681)
1000pF (102)
1500pF (152)
2200pF (222)
3300pF (332)
4700pF (472)
6800pF (682)
10nF (103)
15nF (153)
22nF (223)
33nF (333)
47nF (473)
68nF (683)
100nF (104)
220Nf (224)
0.3 ~ 10pF
12pF
15pF
18pF
22pF
33pF
39pF
47pF
56pF
68pF
82pF
100pF
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
T
0201
X7R
6.3V
10V
16V
T
T
T
T
T
T
T
T
T
T
T
T
X5R
25V
T
T
T
T
T
T
T
T
C0G
25V
T
T
T
T
T
T
T
T
50V
T
T
T
T
T
T
T
T
6.3V
10V
16V
T
T
T
T
T
T
T
50V
T
T
T
T
T
T
T
T
16V
25V
50V
T
T
T
T
T
T
T
T
T
T
T
T
8. PACKAGING DIMENSION AND QUANTITY
Size
0201
Thickness (mm)/Symbol
0.30±0.03
T
Paper tape
7” reel
15Kpcs
Capacitance
HITANO ENTERPRISE CORP.
10. RELIABILITY TEST CONDITIONS AND REQUIREMENTS
No.
1.
2.
3.
Item
Visual and
Mechanical
Capacitance
Q/ D.F.
(Dissipation
Factor)
Class I: NP0
1.0 ± 0.2Vrms, 1MHz ± 10%
Class II: X7R, X5R:
1.0 ± 0.2Vrms, 1kHz ± 10%
---
Test Conditions
* No remarkable defect.
Requirements
* Dimensions to conform to individual specification sheet.
* Shall not exceed the limits given in the detailed spec.
*
NP0: Cap ≥ 30pF, Q ≥ 1000; Cap<30pF, Q ≥ 400+20C
X7R, X5R:
Rated Voltage
≧50V
25V
16V
D.F.
≦
3%
≦
3.5%
≦
3.5%
Rated Voltage
10V
6.3V
D.F.
≦
5.0%
≦
10%
4.
Dielectric
Strength
* To apply voltage:
≤50V,
250% of rated voltage.
* Duration: 1 to 5 sec.
* Charge and discharge current less than 50mA.
* No evidence of damage or flash over during test.
5.
6.
Insulation
Resistance
Temperature
Coefficient
To apply rated voltage for max. 120 sec.
≥10GΩ
or RxC≥500Ω-F whichever is smaller
Class II : X7R, X5R, 6.3V
≥100Ω-F
With no electrical load.
T.C.
NP0(C0G)
X7R
X5R
Operating Temp.
-55 ~ 125℃ at 25℃
-55 ~ 125℃ at 25℃
-55 ~ 85℃ at 25℃
* Capacitance change:
NP0(C0G) : within ±30ppm/°C
X7R
X5R
: within ± 15%
: within ± 15%
7.
Adhesive
Strength of
Termination
* Pressurizing force：
5N≤0603: 10N＞0603
* Test time: 10±1 sec.
* Vibration frequency: 10~55 Hz/min.
* Total amplitude: 1.5mm
* Test time: 6 hrs. (Two hrs each in three mutually
perpendicular directions.)
* No remarkable damage or removal of the terminations.
8.
Vibration
Resistance
* No remarkable damage.
* Cap change and Q/D.F.: To meet initial spec.
9.
10.
Solderability
Bending Test
* Solder temperature: 235±5°C
* Dipping time: 2±0.5 sec.
* The middle part of substrate shall be pressurized by means
the deflection becomes 1 mm and then the pressure shall be
maintained for 5±1 sec.
* Measurement to be made after keeping at room temp. for
24±2 hrs.
95% min. coverage of all metalized area.
* No remarkable damage.
NPO: within ±5.0% or ±0.5pF whichever is larger.
X7R: within ±12.5%
Y5V: within ±30%
(This capacitance change means the change of capacitance under
specified flexure of substrate from the capacitance measured before
test.)
of the pressurizing rod at a rate of about 1 mm per second until * Cap change:
11.
Resistance to
* Solder temperature: 270±5°C
* Preheating: 120 to 150°C for 1 minute before immerse the
capacitor in a eutectic solder.
*Before initial measurement (Class II) only): Perform 150
+0/-10°C for 1hr and then set for 48±4hrs at room temp.
* Measurement to be made after keeping at room temp. for
24±2 hrs.(Class I) or 48±4hrs.(Class II)
* No remarkable damage.
* Cap change:
NPO: within ±2.5% or ±0.25pF whichever is larger.
X7R: within ±7.5%
X5R: within ±7.5%
* Q/D.F., I.R. and dielectric strength: To meet initial requirements.
* 25% max. leaching on each edge.
* No remarkable damage.
* Cap change：
NPO: within ±2.5% or ±0.25pF whichever is larger.
X7R: within ±7.5%
X5R: within ±7.5%
* Q/D.F., I.R. and dielectric strength: To meet initial requirements.
Soldering Heat
* Dipping time: 10±1 sec
12.
Temperature
Cycle
* Conduct the five cycles according to the temperatures and
time.
*Before initial measurement (Class II) only): Perform 150
+0/-10°C for 1hr and then set for 48±4hrs at room temp.
* Measurement to be made after keeping at room temp. for
24±2 hrs.(Class I) or 48±4hrs.(Class II)
HITANO ENTERPRISE CORP.
10. RELIABILITY TEST CONDITIONS AND REQUIREMENTS
No.
13.
Item
Humidity
(Damp Heat)
Steady State
* Test temp.: 40±2°C
* Humidity: 90~95% RH
* Test time: 500+24/-0hrs.
* Measurement to be made after keeping at room temp. for
24±2 hrs.(Class I) or 48±4hrs.(Class II)
Test Condition
* Cap change:
Requirements
* No remarkable damage.
NPO: within ±5.0% or ±0.5pF whichever is larger.
X7R,X5R:
≧
10V, within ±12.5%, 6.3V, within ±25%
* Q/D.F. value:
NPO: Cap≥30pF, Q≥350; 10pF≤Cap<30pF, Q≥275+2.5C
Cap<10pF; Q≥200+10C
X7R,X5R :
Ur=50V,
≦
6.0% Ur=16, 25V,
≦
5.0%
Ur=10V,
≦
7.5% Ur=6.3V,
≦
15%
* I.R.:
≥10V. ≥1GΩ
or RxC≥50Ω-F whichever is smaller
6.3V
≥10Ω-F
14.
Humidity
(Damp Heat)
Load
* Test temp.: 40±2°C
* Humidity: 90~95%RH
* Test time: 500+24/-0 hrs.
* To apply voltage：rated voltage
* Measurement to be made after keeping at room temp. for
24±2 hrs.(Class I) or 48±4hrs.(Class II)
* No remarkable damage.
* Cap change:
NPO: within ±5.0% or ±0.5pF whichever is larger.
X7R,X5R:
≧
10V, within ±12.5%, 6.3V, within ±25%
* Q/D.F. value:
NPO: Cap≥30pF, Q≥350; 10pF≤Cap<30pF, Q≥275+2.5C
Cap<10pF; Q≥200+10C
X7R,X5R :
Ur=50V,
≦
6.0% Ur=16, 25V,
≦
5.0%
Ur=10V,
≦
7.5% Ur=6.3V,
≦
15%
* I.R.:
≥10V. ≥1GΩ
or RxC≥25Ω-F whichever is smaller
6.3V
≥5Ω-F
15.
High
Temperature
Load
(Endurance)
* Test temp.: NPO, X7R : 125±3°C, X5R: 85±3°C
* To apply voltage:
(1) 6.3V : 150% of rated voltage.
(2)
＞6.3V:
200% of rated voltage
* Test time: 1000+24/-0 hrs.
* Measurement to be made after keeping at room temp. for
24±2 hrs.(Class I) or 48±4hrs.(Class II)
* No remarkable damage.
* Cap change:
NPO: within ±5.0% or ±0.5pF whichever is larger.
X7R,X5R:
≧
10V, within ±12.5%, 6.3V, within ±25%
* Q/D.F. value:
NPO: Cap≥30pF, Q≥350; 10pF≤Cap<30pF, Q≥275+2.5C
Cap<10pF; Q≥200+10C
X7R,X5R :
Ur=50V,
≦
6.0% Ur=16, 25V,
≦
5.0%
Ur=10V,
≦
7.5% Ur=6.3V,
≦
15%
* I.R.:
≥10V. ≥1GΩ
or RxC≥25Ω-F whichever is smaller
6.3V
≥5Ω-F
11. APPENDIXES
◙
Tape & reel dimensions
Size
Thickness
A
0
B
0
T
K
0
W
P
0
10xP
0
P
1
P
2
D
0
D
1
E
F
Size
Reel size
C
W
1
A
N
Fig. 6 The dimension of reel
0201
0.30±0..03
0.38±0.05
0.68±0.05
0.42±0.05
-
8.00±0.10
4.00±0.10
40.0±0.10
2.00±0.05
2.00±0.05
1.55±0.05
-
1.75±0.05
3.50±0.05
0201
7”
13.0+0.5/-0.2
8.4+1.5/-0
178.0±1.0
60.0+1.0/-0
13”
13.0+0.5/-0.2
8.4+1.5/-0
330.0±1.0
100±1.0
Fig. 5 The dimension of paper tape
HITANO ENTERPRISE CORP.
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