CRYSTAL OSCILLATORS
LVPECL TYPE
SPO-02
-
-
-
-
Metal Package
Low RMS phase jitter(12 kHz to 20 MHz)
2.5 V, 3.3 V Supply Voltage
LVPECL Output
■ ELECTRICAL SPECIFICATIONS
ITEM
Output Logic Type
Frequency Range
Supply Voltage(V
DD
)
Operating Temperature Range
Storage Temperature Range
Frequency Stability
Input Current
Output Voltage Logic High(V
OH
)
Output Voltage Logic Low(V
OL
)
Rise / Fall Time
Duty Cycle
Start-up Time
Output Load Condition(LVPECL)
Output Enable Function
(V
IH
and V
IL
)
RMS Phase Jitter
Frequency Aging
LVPECL
9.500 MHz to 250.000 MHz
2.5 V
DC
±5 %, 3.3 V
DC
±5 %
-20 to +70 ℃, -40 to +85 ℃
-55 to +125 ℃
±25 ppm, ±50 ppm, ±100 ppm Max.
55 mA Max. at 2.5 V, 88 mA Max. at 3.3 V
V
DD
–
1.025 V
DC
Min.
V
DD
–
1.620 V
DC
Max.
0.3 ns Typ., 0.7 ns Max.
45 to 55 %, 40 to 60 %
10 ms Max.
50 Ω into V
DD
- 2.0 V
DC
70 % of V
DD
Min. to Enable Output
30 % of V
DD
Max. to Disable Output
1 ps Max.
±3 ppm Max.
High Impedance
BW : 12 kHz to 20 MHz
25 ℃, First year
Measured over
20 % to 80 % of waveform
Measured at 50 % of
waveform
Over operating temperature
range
Value
Remarks
LVPECL XO
■ MECHANICAL DIMENSIONS
(mm)
http://www.sunny.co.kr
SUNNY ELECTRONICS CORP
CRYSTAL OSCILLATORS
■ PART NUMBERING GUIDE
SPO – 023 50 A D S R
–
156.250M
SUPPLY VOLTAGE(V
DD
)
3: 3.3 V, 2 : 2.5 V
FREQUENCY
M : MHz
PACKAGE OPTION
R : TAPE AND REEL
BLANK : BULK
PIN 1 CONNECTION
S : TRI-STATE, E/D
BLANK : NO CONNECTION
FREQUENCY STABILITY
25 : ±25 ppm, 50 : ±50 ppm
BLANK : ±100 ppm
OPERATING
TEMPERAURE RANGE
A : -40 to 85 ℃, B : -20 to 70 ℃
BLANK : 0 to 70 ℃
DUTY CYCLE
D : 45/55, E : 40/60
■
TEST CIRCUIT (PECL)
■
WAVEFORM (PECL)
■
ENVIRONMENTAL & MECHANICAL SPECIFICATIONS
Temperature Cycling
Fine Leak Test
Gross Leak Test
Mechanical Shock
Vibration
Moisture Resistance
Moisture Sensitivity
Resistance to Soldering Heat
Solderability
http://www.sunny.co.kr
MIL-STD-883, Method 1010, Condition B
MIL-STD-883, Method 1014, Condition A
MIL-STD-883, Method 1014, Condition C
MIL-STD-202, Method 213, Condition C
MIL-STD-883, Method 2007, Condition A
MIL-STD-883, Method 1004
J-STD-020, MSL 1
MIL-STD-202, Method 210, Condition K
MIL-STD-883, Method 2003
SUNNY ELECTRONICS CORP
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