Octal Buffers/Drivers
54BCT244
Memory
Logic Diagram
F
EATURES
:
• 3-state outputs drive bus lines or buffer memory address
registers
• R
AD
-P
AK
® radiation-hardened against natural space radia-
tion
• Total dose hardness:
- >100 krad (Si), depending upon space mission
• Package:
- 20-pin R
AD
-P
AK
® flat package
• Operating temperature range:
-55 to 125
°
C
• P-N-P inputs reduce DC loading
• Typical V
OLP
(output ground bounce)
- < 0.8 V at V
CC
=3.3 V, T
A
=25
°
C
• ESD protection exceeds 2000 V
D
ESCRIPTION
:
Maxwell Technologies’ 54BCT244 octal buffers and line driv-
ers features a greater than 100 krad (Si) total dose tolerance;
depending upon space misssion. The 54BCT244 is organized
as two 4-bit drivers with separate output enable (OE) inputs.
When OE is low, the device passes data from the A inputs to
the Y outputs. When OE is high, the outputs are in the high
impedance state.
Maxwell Technologies' patented R
AD
-P
AK
® packaging technol-
ogy incorporates radiation shielding in the microcircuit pack-
age. It eliminates the need for box shielding while providing
the required radiation shielding for a lifetime in orbit or a space
mission. In a GEO orbit, R
AD
-P
AK
provides true greater than
100 krad (Si) total radiation dose tolerance, dependent upon
space mission. This product is available with packaging and
screening up to Class S.
1000608
12.19.01 Rev 5
All data sheets are subject to change without notice
1
(858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com
©2001 Maxwell Technologies
All rights reserved.
Octal Buffers/Drivers
T
ABLE
1. P
INOUT
D
ESCRIPTION
P
IN
1, 19
2, 4, 6, 8
3, 5, 7, 9
10
11, 13, 15, 17
12, 14, 16, 18
20
S
YMBOL
1OE-2OE
1A1-1A4
2Y4-2Y1
GND
2A1-2A4
1Y4-1Y1
V
CC
Input
Output
Ground
Input
Output
Power Supply
D
ESCRIPTION
Output Enables
54BCT244
T
ABLE
2. 54BCT244 A
BSOLUTE
M
AXIMUM
R
ATINGS 1
P
ARAMETER
Supply Voltage Range
Input Voltage Range
2
Voltage Range Applied to any Output in the Disable or Power-Off
State
2
Voltage Range Applied to any Output in High State
2
Current Into Any Output in the Low State
Total Power Dissipation @ T
A
= +55
°
C
3
Operating Temperature Range
Storage Temperature Range
S
YMBOL
V
CC
V
I
V
O
V
O
I
O
P
D
T
A
T
S
M
IN
-0.5
-0.5
-0.5
-0.5
--
--
-55
-65
M
AX
7.0
7.0
5.5
V
CC
96
651
125
150
U
NIT
V
V
V
V
mA
mW
°C
°C
Memory
1. Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maxi-
mum levels may degrade performance and affect reliability.
2.
The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
3. Must be able to withstand the additional P
D
due to short circuit test, e.g. I
DS
. The P
D
number is based upon dc values.
T
ABLE
3. D
ELTA
L
IMITS
P
ARAMETER
I
CC(OP)
I
OZH
I
OZL
V
ARIATION
±10% of specified value on Table 5
±10% of specified value on Table 5
±10% of specified value on Table 5
1000608
12.19.01 Rev 5
All data sheets are subject to change without notice
2
©2001 Maxwell Technologies
All rights reserved.
Octal Buffers/Drivers
P
ARAMETER
Supply Voltage
High-Level Input Voltage
Low-Level Input Voltage
High-Level Output Current
Low-Level Output Current
Input Clamp Current
Thermal Impedance — Flat Package
Operating Temperature
S
YMBOL
V
CC
V
IH
V
IL
I
OH
I
OL
I
IK
M
IN
4.5
2.0
--
--
--
--
--
-55
54BCT244
M
AX
5.5
--
0.8
-12
48
-18
5.56
125
U
NIT
V
V
V
mA
mA
mA
°C/W
°
C
T
ABLE
4. 54BCT244 R
ECOMMENDED
O
PERATING
C
ONDITIONS1
Θ
JC
T
A
1. All unused control inputs must be held high or low to ensure proper device operation.
T
ABLE
5. 54BCT244 DC E
LECTRICAL
C
HARACTERISTICS
(V
CC
= 5V ±10%, T
A
= -55
°
C
TO
125
°
C,
UNLESS OTHERWISE SPECIFIED
)
P
ARAMETER
Input Clamp Voltage
High-Level Output Voltage
Low-Level Output Voltage
Input Current
Off-State Output Current High-Level Volt-
age Applied
Off-State Output Current Low-Level Volt-
age Applied
High Level Input Current
Low Level Input Current
Short-circuit Output Current
1
Supply Current, Outputs High
Supply Current, Outputs Low
Supply Current, Outputs Disabled to High
Impedance State
S
YMBOL
V
IK
V
OH
V
OL
I
I
I
OZH
I
OZL
I
IH1
I
IH2
I
IL
I
OS
I
CCH
I
CCL
I
CCZ
T
EST
C
ONDITIONS
V
CC
= 4.5 V
V
CC
= 4.5 V
V
CC
= 4.5 V
V
CC
= 5.5 V
V
CC
= 5.5 V
V
CC
= 5.5 V
V
CC
= 5.5 V
V
CC
= 5.5 V
V
CC
= 5.5 V
V
CC
= 5.5 V
V
CC
= 5.5 V
V
CC
= 5.5 V
V
CC
= 5.5 V
I
I
= -18 mA
I
OH
= -3 mA
I
OH
= -12 mA
I
OL
= 48 mA
V
I
= 7 V
V
I
= 2.7 V
V
O
= 0.5 V
V
I
= 7 V
V
I
= 2.7 V
V
I
= 0.5 V
V
O
= 0.0 V
Outputs Open
Outputs Open
Outputs Open
--
--
--
--
--
-100
--
--
--
M
IN
--
2.4
2
--
M
AX
-1.2
--
--
0.55
0.1
50
-50
0.1
20
-1.0
-225
40
80
10
V
mA
µA
µA
mA
µA
mA
mA
mA
mA
mA
U
NIT
V
V
Memory
1. Not more than one output should be shorted at one time and the duration of test shall not exceed one second.
1000608
12.19.01 Rev 5
All data sheets are subject to change without notice
3
©2001 Maxwell Technologies
All rights reserved.
Octal Buffers/Drivers
T
ABLE
6. 54BCT244 AC E
LECTRICAL
C
HARACTERISTICS
(V
CC
= 5V ±10%, T
A
= -55
°
C
TO
125
°
C,
UNLESS OTHERWISE SPECIFIED
)
P
ARAMETER
Propagation Delay Time
An to Yn
S
YMBOL
t
PLH
t
PHL
t
PLH
t
PHL
Output Enable Time
OE to Yn
t
PZH
t
PZL
t
PZH
t
PZL
Output Disable Time
OE to Yn
t
PHZ
t
PLZ
t
PHZ
t
PLZ
T
EST
C
ONDITIONS
V
CC
= 4.5 to 5.5 V C
L
= 50 pF
R
1
= 500
Ω
R
2
= 500
Ω
T
A
= -55 to +125
°
C
V
CC
= 5.0 V
C
L
= 50 pF
R
1
= 500
Ω
R
2
= 500
Ω
T
A
= +25
°
C
V
CC
= 4.5 to 5.5 V C
L
= 50 pF
R
1
= 500
Ω
R
2
= 500
Ω
T
A
= -55 to +125
°
C
V
CC
= 5.0 V C
L
= 50 pF
R
1
= 500
Ω
R
2
= 500
Ω
T
A
= +25
°
C
V
CC
= 4.5 to 5.5 V C
L
= 50 pF
R
1
= 500
Ω
R
2
= 500
Ω
T
A
= -55 to +125
°
C
V
CC
= 5.0 V C
L
= 50 pF
R
1
= 500
Ω
R
2
= 500
Ω
T
A
= +25
°
C
M
IN
0.9
1.4
1.2
1.7
2
2
2
2
2
2
2
2
54BCT244
M
AX
5.3
6
4.4
5
9
9.4
7.8
8.1
8
9.8
6.7
7.6
U
NIT
ns
ns
Memory
ns
T
ABLE
7. F
UNCTION
T
ABLE
(
EACH BUFFER
)
INPUTS
OE
l
L
H
A
H
L
X
OUTPUT
Y
H
L
Z
1000608
12.19.01 Rev 5
All data sheets are subject to change without notice
4
©2001 Maxwell Technologies
All rights reserved.
Octal Buffers/Drivers
F
IGURE
1. L
OAD
C
IRCUIT FOR
O
UTPUTS
54BCT244
F
IGURE
N
OTE
:
1. C
L INCLUDES PROBE AND JOG CAPACITANCE
P
ARAMETER
M
EASUREMENT
I
NFORMATION
T
EST
T
PLH
/T
PHL
T
PLZ
/T
PZL
T
PHZ
/T
PZH
S1
Open
6V
GND
Memory
F
IGURE
2. V
OLTAGE
W
AVEFORMS
P
ULSE
D
URATION
F
IGURE
3. O
UTPUT
E
NABLE
T
IMING
1000608
12.19.01 Rev 5
All data sheets are subject to change without notice
5
©2001 Maxwell Technologies
All rights reserved.
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