电子工程世界电子工程世界电子工程世界

关键词

搜索

型号

搜索

C1210A112K1GAC7215

产品描述Ceramic Capacitor, Multilayer, Ceramic, 100V, 10% +Tol, 10% -Tol, BP, -/+30ppm/Cel TC, 0.0011uF, 1210,
产品类别无源元件    电容器   
文件大小1MB,共8页
制造商KEMET(基美)
官网地址http://www.kemet.com
标准
下载文档 详细参数 全文预览

C1210A112K1GAC7215概述

Ceramic Capacitor, Multilayer, Ceramic, 100V, 10% +Tol, 10% -Tol, BP, -/+30ppm/Cel TC, 0.0011uF, 1210,

C1210A112K1GAC7215规格参数

参数名称属性值
是否Rohs认证符合
Objectid7076040816
包装说明, 1210
Reach Compliance Codecompliant
ECCN代码EAR99
YTEOL7.63
电容0.0011 µF
电容器类型CERAMIC CAPACITOR
介电材料CERAMIC
高度1.6 mm
JESD-609代码e3
长度3.07 mm
制造商序列号GR900
多层Yes
负容差10%
端子数量2
最高工作温度125 °C
最低工作温度-55 °C
封装形式SMT
包装方法TR, Plastic, 13 Inch
正容差10%
额定(直流)电压(URdc)100 V
系列C1210(BP,100V)
尺寸代码1210
温度特性代码BP
温度系数30ppm/Cel ppm/°C
端子面层Matte Tin (Sn) - with Nickel (Ni) barrier
宽度2.56 mm

文档预览

下载PDF文档
CERAMIC HIGH RELIABILITY
GENERAL INFORMATION GR900 SERIES
HIGH RELIABILITY — GR900
/ Q-SPEC
GR900 capacitors are intended for use in any application where the
chance of failure must be reduced to the lowest possible level. While
any well-made multilayer ceramic capacitor is an inherently reliable
device, GR900 capacitors receive special attention in all phases of
manufacture including:
Raw Materials Selection
Clean Room Production
Individual Batch Testing
C-SAM (when applicable)
Singular Batch Identity is Maintained
Destructive Physical Analysis
These parts are well worth the added investment in comparison to the
cost of a device or system failure.
Typical applications include: Medical, Aerospace, Communication
Satellites, Radar and Guidance Systems.
SCREENING AND SAMPLE TESTS
Each batch receives the following testing/inspections:
In Process Inspection (Per MIL-PRF-123):
1.
2.
100% Visual Inspection.
Destructive Physical Analysis: (DPA) - A sample is pulled from
each lot and examined per EIA-469 and KEMET’s strict internal
void and delamination criteria. Sampling plan is per MIL-PRF-123.
C-SAM (GR900 / “A” in the fifth character position of the ordering
code): May be performed on batches failing to meet the DPA
criteria for removal of marginal product. Not required on each lot.
C-SAM (Q-SPEC / “Q” in the fifth character position of the ordering
code): Receive 100% C-SAM of lot prior to application of end
metallization.
Group A
1. Thermal Shock:
Materials used in the construction of multilayer
ceramic capacitors possess various thermal coefficients of expansion.
To assure maximum uniformity, each part is temperature cycled in
accordance to MIL-STD-202, Method 107, Condition A with Step 3
being 125°C. Number of cycles shall be 20 (100% of lot).
2. Voltage Conditioning:
One of the most strenuous environments for
any capacitor is the high temperature/high voltage test. All units are
subject to twice-rated voltage to the units at the maximum rated
temperature of 125°C for a minimum of 168 hours and a maximum of
264 hours. The voltage conditioning may be terminated at any time
during 168 hours to 264 hours time interval that confirmed failures meet
the requirements of the PDA during the last 48 hours of 1 unit or .4%
(100% of lot).
Optional Voltage Conditioning (Accelerated Voltage
Conditioning):
All conditions of the standard voltage conditioning
apply with the exception of increased voltage and decreased test time.
Refer to MIL-PRF-123 for the proper formula.
*Step 5 is performed on chips at this point (100% of lot).
3. Dielectric Withstanding Voltage:
250% of the DC rated voltage at
25°C (100% of lot).
9. Percent Defective Allowable (PDA):
The overall PDA is 8% for
parts outside the MIL-PRF-123 values. The PDA is per MIL-PRF-
123 for all parts that are valid MIL-PRF-123 values. The PD
includes steps 1 through 8 above with the following exceptions.
Capacitance exclusion - capacitance values no more than 5% or
.5pF, whichever is greater for BX characteristic or 1% or .3pF,
whichever is greater for BP characteristic beyond specified
tolerance limit, shall be removed from the lot but shall not be
considered defective for determination of the PD.
Insulation Resistance at 25°C — Product which is not acceptable
for twice the military limit but is acceptable per the military limit, is
removed from the lot but shall not be considered defective for
determination of the PD.
10. Visual and Mechanical Examination:
Performed per MIL-
PRF-123 criteria.
11. Radiographic Examination (Leaded Devices Only):
Radial
devices receive a one-plane X-ray.
12. Destructive Physical Analysis (DPA):
A sample is examined
on each lot per EIA-469. Sampling Plan is per MIL-PRF-123.
STANDARD PACKAGING
All products are packaged in trays except C512 capacitors which
are packaged 1 piece per bag.
*Note: All packaging is ESD protected.
DATA PACKAGE
A data package is sent with each shipment which contains:
1. Final Destructive Physical Analysis (DPA) report.
2. Certificate of Compliance stating that the parts meet all
applicable requirements of the appropriate military specification to
the best failure level to which KEMET is approved.
3. Summary of Group A Testing.
Group B
MIL-PRF-123 Group B testing is available with special order.
Please contact KEMET for additional information and ordering
details.
4. Insulation Resistance:
The 25°C measurement with rated
voltage applied shall be the lesser of 100 GΩ or 1000 Megohm -
Microfarads (100% of lot).
*5. Insulation Resistance:
The 125°C measurement with rated
voltage applied shall be the lesser of 10 GΩ or 100 Megohm -
Microfarads (100% of lot). For chips, 125°C IR is performed prior to
Step 3 above.
6. Storage
at 150°C for 2 hours minimum without voltage applied
followed by a 12-hour minimum stabilization period (temperature
characteristic BX only).
7. Capacitance:
Shall be within specified tolerance at 25°C (100%
of lot). (Aging phenomenon is taken into account for BX dielectric
to obtain capacitance.)
8. Dissipation Factor:
Shall not exceed 2.5% for X7R (BX)
dielectric, 0.15% for C0G (BP) dielectric at 25°C. (100% of lot.)
3.
12
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com
cd4069实用电路图
哪位仁兄有CD4069(六反相器)的电路应用图啊,急用!...
阿甘 模拟电子
DSP28335-ePWM
#include "DSP28x_Project.h" // Configure the period for each timer #define EPWM1_TIMER_TBPRD 3750 // Period register 系统始终为150MHZ,下面的程序进行了4分频,即为37.5MHZ,这 ......
Jacktang DSP 与 ARM 处理器
高手请进:关于PDA开发的一个问题
有哪些高手做过PDA开发?想实现一个按键式的PDA,设想用ARM7,请问用哪种类型的操作系统最方便?...
gongjin618 嵌入式系统
求购闲置launchpad(已解决)
:loveliness: 本帖最后由 huang91 于 2011-12-1 13:36 编辑 ]...
huang91 淘e淘
国民技术N32G430开发板测评之开箱
在申请通过之后厂家很快联系并寄送了开发板,9月3日下午收到快递。迫不及待取了快递进行开箱,想一睹这块板子的芳容。 打开之后首先是国民技术的包装盒,板板正正(由于手机摄像头原因,在下 ......
Honghuzaitian 国产芯片交流
【LSM6DSOX的MLC机器学习理解】--机器学习使用教程分享
本帖最后由 justd0 于 2020-5-2 13:20 编辑 【LSM6DSOX的MLC机器学习理解】--机器学习简介中简单介绍了机器学习模块的特点和大致的实现流程。上个帖中我简单介绍了下LSM6DSOX机器学习功能实 ......
justd0 ST MEMS传感器创意设计大赛专区

 
EEWorld订阅号

 
EEWorld服务号

 
汽车开发圈

 
机器人开发圈

About Us 关于我们 客户服务 联系方式 器件索引 网站地图 最新更新 手机版

站点相关: 大学堂 TI培训 Datasheet 电子工程 索引文件: 1836  1740  127  2192  2848  37  36  3  45  58 

器件索引   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

北京市海淀区中关村大街18号B座15层1530室 电话:(010)82350740 邮编:100190

电子工程世界版权所有 京B2-20211791 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号 Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved