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T497H685K035CB62157280

产品描述Tantalum Capacitor, Polarized, Tantalum (dry/solid), 35V, 10% +Tol, 10% -Tol, 6.8uF, 2915,
产品类别无源元件    电容器   
文件大小933KB,共19页
制造商KEMET(基美)
官网地址http://www.kemet.com
标准
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T497H685K035CB62157280概述

Tantalum Capacitor, Polarized, Tantalum (dry/solid), 35V, 10% +Tol, 10% -Tol, 6.8uF, 2915,

T497H685K035CB62157280规格参数

参数名称属性值
是否Rohs认证符合
Objectid7074188411
包装说明, 2915
Reach Compliance Codecompliant
Country Of OriginMexico
ECCN代码EAR99
YTEOL7.25
其他特性ESR is MEASURED AT 100KHZ,
电容6.8 µF
电容器类型TANTALUM CAPACITOR
介电材料TANTALUM (DRY/SOLID)
ESR1300 mΩ
高度2.79 mm
JESD-609代码e4
漏电流0.0024 mA
长度7.24 mm
安装特点SURFACE MOUNT
负容差10%
端子数量2
最高工作温度125 °C
最低工作温度-55 °C
封装形式SMT
包装方法TR, EMBOSSED PLASTIC, 13 INCH
极性POLARIZED
正容差10%
额定(直流)电压(URdc)35 V
尺寸代码2915
表面贴装YES
Delta切线0.06
端子面层Gold (Au)
端子形状J BEND
宽度3.81 mm

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Tantalum Surface Mount Capacitors – High Reliability
T497 High Reliability Series (HRA)
MnO
2
(CWR09/19/29 Style)
Overview
The KEMET T497 is designed for the High Reliability
Series (HRA) requirements of military, medical, and
aerospace applications. This product is a HRA version
of CWR09,19, and 29 products. The T497 Series is a
surface mount product offering various lead-frame plating
options, Weibull grading options, X-ray inspection, surge
current testing, F-Tech (an improved anode manufacturing
process) and Simulated Breakdown Voltage (SBDV)
screening options to improve long term reliability.
KEMET’s F-Tech eliminates hidden defects in the dielectric,
which continue to grow in the field, causing capacitor
failures. Based on the fundamental understanding of
degradation mechanisms in tantalum and niobium
capacitors, F-Tech incorporates multiple process
methodologies. Some minimize the oxygen and carbon
content in the anodes, which become contaminants
and can lead to the crystallization of the anodic oxide
dielectric. This process methodology reduces the
contaminants, improving quality of the dielectric. An
additional technology provides a stronger mechanical
connection point between the tantalum lead wire and
tantalum anode, enhancing robustness and product
reliability. The benefit of F-Tech is illustrated by a 2,000
hour, 85°C, 1.32 X rated voltage accelerated life test. The
F-Tech parts see no degradation while standard tantalums
have 1.5 orders of magnitude degradation in leakage
current. F-Tech is currently available for T493 (select D
and X case capacitance values in 25 V and higher rated
voltage), and T497 (select H case capacitance values in
25 V and higher rated voltage). Please contact KEMET for
details on ordering other part types with these capabilities.
KEMET’s patented Simulated Breakdown Screening (SBDS)
is a nondestructive testing technique that simulates the
breakdown voltage (BDV) of a capacitor without damage to
its dielectric or to the general population of capacitors. This
screening identifies hidden defects in the dielectric, providing
the highest level of dielectric testing. SBDS is based on the
simulation of breakdown voltage (BDV), the ultimate test of
the dielectric in a capacitor.
Low BDV indicates defects in the dielectric, and therefore, a
higher probability of failure in the field. High BDV indicates
a stronger dielectric and high-reliability performance in the
field. This new screening method allows KEMET to identify
the breakdown voltage of each individual capacitor and
provides only the strongest capacitors from each lot.
SBDS is currently available on select part types in the T493
and T497 series. Please contact KEMET for details on
ordering other part types with these capabilities.
KEMET offers these technologies per the following options:
• F-Tech only
• SBDS only
• Combination of both F-Tech and SBDS for the ultimate
protection
Built Into Tomorrow
© KEMET Electronics Corporation • KEMET Tower • One East Broward Boulevard
Fort Lauderdale, FL 33301 USA • 954-766-2800 • www.kemet.com
T2011_T497 • 10/12/2021
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