电子工程世界电子工程世界电子工程世界

关键词

搜索

型号

搜索

C1210A560M2GAG7189

产品描述Ceramic Capacitor, Ceramic, 200V, 20% +Tol, 20% -Tol, C0G, -/+30ppm/Cel TC, 0.000056uF, 1210,
产品类别无源元件    电容器   
文件大小1MB,共8页
制造商KEMET(基美)
官网地址http://www.kemet.com
下载文档 详细参数 全文预览

C1210A560M2GAG7189概述

Ceramic Capacitor, Ceramic, 200V, 20% +Tol, 20% -Tol, C0G, -/+30ppm/Cel TC, 0.000056uF, 1210,

C1210A560M2GAG7189规格参数

参数名称属性值
是否Rohs认证不符合
Objectid709412264
包装说明, 1210
Reach Compliance Codenot_compliant
ECCN代码EAR99
YTEOL7.88
电容0.000056 µF
电容器类型CERAMIC CAPACITOR
介电材料CERAMIC
高度1.6 mm
JESD-609代码e4
长度3.07 mm
负容差20%
端子数量2
最高工作温度125 °C
最低工作温度-55 °C
封装形式SMT
包装方法TR, Plastic, 7 Inch
正容差20%
额定(直流)电压(URdc)200 V
系列C(SIZE)A
尺寸代码1210
温度特性代码C0G
温度系数30ppm/Cel ppm/°C
端子面层Gold (Au)
宽度2.56 mm

文档预览

下载PDF文档
CERAMIC HIGH RELIABILITY
GENERAL INFORMATION GR900 SERIES
HIGH RELIABILITY — GR900
/ Q-SPEC
GR900 capacitors are intended for use in any application where the
chance of failure must be reduced to the lowest possible level. While
any well-made multilayer ceramic capacitor is an inherently reliable
device, GR900 capacitors receive special attention in all phases of
manufacture including:
Raw Materials Selection
Clean Room Production
Individual Batch Testing
C-SAM (when applicable)
Singular Batch Identity is Maintained
Destructive Physical Analysis
These parts are well worth the added investment in comparison to the
cost of a device or system failure.
Typical applications include: Medical, Aerospace, Communication
Satellites, Radar and Guidance Systems.
SCREENING AND SAMPLE TESTS
Each batch receives the following testing/inspections:
In Process Inspection (Per MIL-PRF-123):
1.
2.
100% Visual Inspection.
Destructive Physical Analysis: (DPA) - A sample is pulled from
each lot and examined per EIA-469 and KEMET’s strict internal
void and delamination criteria. Sampling plan is per MIL-PRF-123.
C-SAM (GR900 / “A” in the fifth character position of the ordering
code): May be performed on batches failing to meet the DPA
criteria for removal of marginal product. Not required on each lot.
C-SAM (Q-SPEC / “Q” in the fifth character position of the ordering
code): Receive 100% C-SAM of lot prior to application of end
metallization.
Group A
1. Thermal Shock:
Materials used in the construction of multilayer
ceramic capacitors possess various thermal coefficients of expansion.
To assure maximum uniformity, each part is temperature cycled in
accordance to MIL-STD-202, Method 107, Condition A with Step 3
being 125°C. Number of cycles shall be 20 (100% of lot).
2. Voltage Conditioning:
One of the most strenuous environments for
any capacitor is the high temperature/high voltage test. All units are
subject to twice-rated voltage to the units at the maximum rated
temperature of 125°C for a minimum of 168 hours and a maximum of
264 hours. The voltage conditioning may be terminated at any time
during 168 hours to 264 hours time interval that confirmed failures meet
the requirements of the PDA during the last 48 hours of 1 unit or .4%
(100% of lot).
Optional Voltage Conditioning (Accelerated Voltage
Conditioning):
All conditions of the standard voltage conditioning
apply with the exception of increased voltage and decreased test time.
Refer to MIL-PRF-123 for the proper formula.
*Step 5 is performed on chips at this point (100% of lot).
3. Dielectric Withstanding Voltage:
250% of the DC rated voltage at
25°C (100% of lot).
9. Percent Defective Allowable (PDA):
The overall PDA is 8% for
parts outside the MIL-PRF-123 values. The PDA is per MIL-PRF-
123 for all parts that are valid MIL-PRF-123 values. The PD
includes steps 1 through 8 above with the following exceptions.
Capacitance exclusion - capacitance values no more than 5% or
.5pF, whichever is greater for BX characteristic or 1% or .3pF,
whichever is greater for BP characteristic beyond specified
tolerance limit, shall be removed from the lot but shall not be
considered defective for determination of the PD.
Insulation Resistance at 25°C — Product which is not acceptable
for twice the military limit but is acceptable per the military limit, is
removed from the lot but shall not be considered defective for
determination of the PD.
10. Visual and Mechanical Examination:
Performed per MIL-
PRF-123 criteria.
11. Radiographic Examination (Leaded Devices Only):
Radial
devices receive a one-plane X-ray.
12. Destructive Physical Analysis (DPA):
A sample is examined
on each lot per EIA-469. Sampling Plan is per MIL-PRF-123.
STANDARD PACKAGING
All products are packaged in trays except C512 capacitors which
are packaged 1 piece per bag.
*Note: All packaging is ESD protected.
DATA PACKAGE
A data package is sent with each shipment which contains:
1. Final Destructive Physical Analysis (DPA) report.
2. Certificate of Compliance stating that the parts meet all
applicable requirements of the appropriate military specification to
the best failure level to which KEMET is approved.
3. Summary of Group A Testing.
Group B
MIL-PRF-123 Group B testing is available with special order.
Please contact KEMET for additional information and ordering
details.
4. Insulation Resistance:
The 25°C measurement with rated
voltage applied shall be the lesser of 100 GΩ or 1000 Megohm -
Microfarads (100% of lot).
*5. Insulation Resistance:
The 125°C measurement with rated
voltage applied shall be the lesser of 10 GΩ or 100 Megohm -
Microfarads (100% of lot). For chips, 125°C IR is performed prior to
Step 3 above.
6. Storage
at 150°C for 2 hours minimum without voltage applied
followed by a 12-hour minimum stabilization period (temperature
characteristic BX only).
7. Capacitance:
Shall be within specified tolerance at 25°C (100%
of lot). (Aging phenomenon is taken into account for BX dielectric
to obtain capacitance.)
8. Dissipation Factor:
Shall not exceed 2.5% for X7R (BX)
dielectric, 0.15% for C0G (BP) dielectric at 25°C. (100% of lot.)
3.
12
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com
干货|如何学好硬件设计?高手教你从理论走向实践
一般缺乏经验的工程师或者学生,拿着一个项目任务书,或者一个成品的电路板的时候,往往会感觉到,根本无从下手。主要原因是,知识储备不足,少实践少动手。 但也不用着急,这是需要慢慢 ......
okhxyyo DIY/开源硬件专区
测水流量选什么型号传感器
想用单片机实现检测水流量,选用什么型号的传感器较好,谢谢了。...
丽水威 传感器
[转帖]史上最重元素进驻周期表
IUPAC(国际纯粹与应用化☆合会)决定,把13年前发现的尚未命名的新元素加入元素周期表,这是目前为止最重的元素,也是5年来唯一承认的新元素。以前周期表上这个位置都写的是Uub,是拉丁文的112 ......
蔡强人 测试/测量
【EGE+SKIA】持续更新:在PC上验证2D图形库SKIA
本帖最后由 辛昕 于 2017-12-8 00:58 编辑 osc git上的 仓库地址: LcdMonitorBaseEGE log:2017.12.8 暂时放弃skia,使用agg-2.5这个源码的编译是很简单的。 今 ......
辛昕 嵌入式系统
发运放资料全集
本帖最后由 paulhyde 于 2014-9-15 03:31 编辑 发点运放的资源,供电赛学习参考~~(可能有的已经有了,但还是发下吧):loveliness: ...
pcbddd 电子竞赛
技术专家是否也能成为职业发展的方向?
人到30,从事具体的技术工作,家庭、精力都不允许。作为多年技术开发的工程师,未来职业发展方向是啥?技术专家?技术管理?管理?...
eeleader 工作这点儿事

技术资料推荐更多

 
EEWorld订阅号

 
EEWorld服务号

 
汽车开发圈

 
机器人开发圈

About Us 关于我们 客户服务 联系方式 器件索引 网站地图 最新更新 手机版

站点相关: 大学堂 TI培训 Datasheet 电子工程 索引文件: 1015  1600  1152  420  165  21  33  24  9  4 

器件索引   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

北京市海淀区中关村大街18号B座15层1530室 电话:(010)82350740 邮编:100190

电子工程世界版权所有 京B2-20211791 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号 Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved