电子工程世界电子工程世界电子工程世界

关键词

搜索

型号

搜索

C1206Q621F1GALTU

产品描述Ceramic Capacitor, Multilayer, Ceramic, 100V, 1% +Tol, 1% -Tol, BP, -/+30ppm/Cel TC, 0.00062uF, 1206,
产品类别无源元件    电容器   
文件大小160KB,共8页
制造商KEMET(基美)
官网地址http://www.kemet.com
下载文档 详细参数 全文预览

C1206Q621F1GALTU概述

Ceramic Capacitor, Multilayer, Ceramic, 100V, 1% +Tol, 1% -Tol, BP, -/+30ppm/Cel TC, 0.00062uF, 1206,

C1206Q621F1GALTU规格参数

参数名称属性值
是否Rohs认证不符合
Objectid926559485
包装说明, 1206
Reach Compliance Codenot_compliant
ECCN代码EAR99
YTEOL7.65
电容0.00062 µF
电容器类型CERAMIC CAPACITOR
介电材料CERAMIC
高度1.6 mm
JESD-609代码e0
长度3.07 mm
多层Yes
负容差1%
端子数量2
最高工作温度125 °C
最低工作温度-55 °C
封装形式SMT
包装方法TR, Plastic, 7 Inch
正容差1%
额定(直流)电压(URdc)100 V
尺寸代码1206
温度特性代码BP
温度系数30ppm/Cel ppm/°C
端子面层Tin/Lead (Sn70Pb30) - with Nickel (Ni) barrier
宽度1.52 mm

文档预览

下载PDF文档
CERAMIC HIGH RELIABILITY
GENERAL INFORMATION GR900 SERIES
HIGH RELIABILITY — GR900
GR900 capacitors are intended for use in any application where
the chance of failure must be reduced to the lowest possible
level. While any well-made multilayer ceramic capacitor is an
inherently reliable device, GR900 capacitors receive special
attention in all phases of manufacture including:
— Raw Materials Selection
— Special Designs
— Clean Room Production
— Individual Batch Testing
— C-SAM (when applicable)
— Singular Batch Identity is Maintained
— Destructive Physical Analysis
These parts are well worth the added investment in comparison
to the cost of a device or system failure.
Typical applications include:
Medical, Aerospace, Communication Satellites, Radar, Guidance
Systems.
SCREENING AND SAMPLE TESTS
Each batch receives the following testing/inspections:
Preliminary:
1. Destructive Physical Analysis: (DPA) - A sample is pulled from
each lot and examined per EIA-469 and KEMET’s strict internal
void and delamination criteria. Sampling plan is per MIL-PRF-123.
2. C-SAM - May be performed on batches failing to meet the
DPA criteria for removal of marginal product. Not required on
each lot.
Group A
1. Thermal Shock
— Materials used in the construction of mul-
tilayer ceramic capacitors possess various thermal coefficients of
expansion. To assure maximum uniformity, each part is temper-
ature cycled in accordance to MIL-STD-202, Method 107,
Condition A with Step 3 being 125°C. Number of cycles shall be
20 (100% of lot).
2. Voltage Conditioning
— One of the most strenuous environ-
ments for any capacitor is the high temperature/high voltage test.
All units are subject to twice-rated voltage to the units at the max-
imum rated temperature of 125°C for a minimum of 168 hours
and a maximum of 264 hours. The voltage conditioning may be
terminated at any time during 168 hours to 264 hours time inter-
val that confirmed failures meet the requirements of the PDA dur-
ing the last 48 hours of 1 unit or .4% (100% of lot).
Optional Voltage Conditioning (Accelerated Voltage
Conditioning)
— All conditions of the standard voltage condi-
tioning apply with the exception of increased voltage and
decreased test time. Refer to MIL-PRF-123 for the proper formula.
*Step 5 is performed on chips at this point (100% of lot).
3. Dielectric Withstanding Voltage
— 250% of the dc rated volt-
age at 25°C (100% of lot).
4. Insulation Resistance
— The 25°C measurement with rated
voltage applied shall be the lesser of 100 GΩ or 1000 megohm-
microfarads (100% of lot).
*5. Insulation Resistance
— The 125°C measurement with
rated voltage applied shall be the lesser of 10 GΩ or 100
megohm-microfarads (100% of lot). For chips, 125°C IR is per-
formed prior to Step 3 above.
6. Storage
at 150°C for 2 hours minimum without voltage applied
followed by a 12-hour minimum stabilization period (temperature
characteristic BX only).
7. Capacitance
— Shall be within specified tolerance at 25°C
(100% of lot). (Aging phenomenon is taken into account for BX
dielectric to obtain capacitance.)
8. Dissipation Factor
— Shall not exceed 2.5% for X7R (BX)
dielectric, 0.15% for C0G (BP) dielectric at 25°C. (100% of lot.)
9. Percent Defective Allowable (PDA)
— The overall PDA is 8%
for parts outside the MIL-PRF-123 values. The PDA is per MIL-
PRF-123 for all parts that are valid MIL-PRF-123 values. The PD
includes steps 1 through 8 above with the following exceptions.
Capacitance exclusion - capacitance values no more than 5% or
.5pF, whichever is greater for BX characteristic or 1% or .3pF,
whichever is greater for BP characteristic beyond specified toler-
ance limit, shall be removed from the lot but shall not be consid-
ered defective for determination of the PD.
Insulation Resistance at 25°C — Product which is not acceptable
for twice the military limit but is acceptable per the military limit,
is removed from the lot but shall not be considered defective for
determination of the PD.
10. Visual and Mechanical Examination
— Performed per MIL-
PRF-123 criteria.
11. Radiographic Examination (Leaded Devices Only)
Radial devices receive a one-plane X-ray.
12. Destructive Physical Analysis (DPA)
— A sample is exam-
ined on each lot per EIA-469. Sampling Plan is per MIL-PRF-123.
STANDARD PACKAGING
All products are packaged in trays except C512 capacitors which
are packaged 1 piece per bag.
DATA PACKAGE
A data package is sent with each shipment which contains:
1.
Final Destructive Physical Analysis (DPA) report.
2.
Certificate of Compliance stating that the parts meet all applic-
able requirements of the appropriate military specification to the
best failure level to which KEMET is approved.
3.
Summary of Group A Testing.
12
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com
咋过几天了就没有什么动静了啊
咋过几天了就没有什么动静了啊,看到的大多回复都是7月30号以前的? ...
亚洲之东 DIY/开源硬件专区
新手,请大家帮忙指点下。
新接触FPGA SOC,买的是友晶DE1的板子,系统是WIN7 X64,安装了Quartus primer 17,和SOCEDS 、DS-5,运行培训教材的图形读取例子demo1_axi,遇到以下问题: Error (210039): File D:/test/d ......
ksq200802166 FPGA/CPLD
有关摄像头加工工艺
那位仁兄知道,pc摄像头加工工艺以及详细的技术参数是什么吗?给哥们指导一下。主要是在芯片参数,感光参数,光学镜头方面的。哥们在这里先谢谢了...
fund123 嵌入式系统
散热第一步—选用合适的导热材料
本帖最后由 jameswangsynnex 于 2015-3-3 19:59 编辑 电子设备中传统应用到的导热介质材料主要有导热硅脂、导热硅胶、导热云母片、导热陶瓷片、导热相变材料,这里要向大家介绍的是新一代导热 ......
lorant 消费电子
2600A系列数字源表实现精密脉冲定时和直流偏置开启序列2
2600A系列型数字源表触发模型,允许用户在微秒数量级的精度对源电平和延迟时间进行编程。下面的命令序列将2602A型数字源表SMUA与SMUB开启时间延迟设置为200µs 。 The Series 2600A ......
Jack_ma 测试/测量
DSP28027 的CCS使用
在使用CCS5.3时,在一个C文件中定义一 个数组showdata,但是编译后系统提示“_showdata ” redefined :frist define in "./xianshi.obj" xainshi.c 则是我定义数组的文件,但是定义其他形式的数 ......
liuming759 微控制器 MCU

 
EEWorld订阅号

 
EEWorld服务号

 
汽车开发圈

 
机器人开发圈

About Us 关于我们 客户服务 联系方式 器件索引 网站地图 最新更新 手机版

站点相关: 大学堂 TI培训 Datasheet 电子工程 索引文件: 855  2074  531  2745  2504  18  42  11  56  51 

器件索引   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

北京市海淀区中关村大街18号B座15层1530室 电话:(010)82350740 邮编:100190

电子工程世界版权所有 京B2-20211791 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号 Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved