电子工程世界电子工程世界电子工程世界

关键词

搜索

型号

搜索

C1206A330K2GAG7210

产品描述Ceramic Capacitor, Multilayer, Ceramic, 200V, 10% +Tol, 10% -Tol, BP, -/+30ppm/Cel TC, 0.000033uF, 1206,
产品类别无源元件    电容器   
文件大小160KB,共8页
制造商KEMET(基美)
官网地址http://www.kemet.com
下载文档 详细参数 全文预览

C1206A330K2GAG7210概述

Ceramic Capacitor, Multilayer, Ceramic, 200V, 10% +Tol, 10% -Tol, BP, -/+30ppm/Cel TC, 0.000033uF, 1206,

C1206A330K2GAG7210规格参数

参数名称属性值
是否Rohs认证不符合
Objectid926566314
包装说明, 1206
Reach Compliance Codenot_compliant
ECCN代码EAR99
YTEOL7.82
电容0.000033 µF
电容器类型CERAMIC CAPACITOR
介电材料CERAMIC
高度1.6 mm
JESD-609代码e4
长度3.07 mm
多层Yes
负容差10%
端子数量2
最高工作温度125 °C
最低工作温度-55 °C
封装形式SMT
包装方法TR, Plastic, 13 Inch
正容差10%
额定(直流)电压(URdc)200 V
系列C1206(BP,200V)
尺寸代码1206
温度特性代码BP
温度系数30ppm/Cel ppm/°C
端子面层Gold (Au)
宽度1.52 mm

文档预览

下载PDF文档
CERAMIC HIGH RELIABILITY
GENERAL INFORMATION GR900 SERIES
HIGH RELIABILITY — GR900
GR900 capacitors are intended for use in any application where
the chance of failure must be reduced to the lowest possible
level. While any well-made multilayer ceramic capacitor is an
inherently reliable device, GR900 capacitors receive special
attention in all phases of manufacture including:
— Raw Materials Selection
— Special Designs
— Clean Room Production
— Individual Batch Testing
— C-SAM (when applicable)
— Singular Batch Identity is Maintained
— Destructive Physical Analysis
These parts are well worth the added investment in comparison
to the cost of a device or system failure.
Typical applications include:
Medical, Aerospace, Communication Satellites, Radar, Guidance
Systems.
SCREENING AND SAMPLE TESTS
Each batch receives the following testing/inspections:
Preliminary:
1. Destructive Physical Analysis: (DPA) - A sample is pulled from
each lot and examined per EIA-469 and KEMET’s strict internal
void and delamination criteria. Sampling plan is per MIL-PRF-123.
2. C-SAM - May be performed on batches failing to meet the
DPA criteria for removal of marginal product. Not required on
each lot.
Group A
1. Thermal Shock
— Materials used in the construction of mul-
tilayer ceramic capacitors possess various thermal coefficients of
expansion. To assure maximum uniformity, each part is temper-
ature cycled in accordance to MIL-STD-202, Method 107,
Condition A with Step 3 being 125°C. Number of cycles shall be
20 (100% of lot).
2. Voltage Conditioning
— One of the most strenuous environ-
ments for any capacitor is the high temperature/high voltage test.
All units are subject to twice-rated voltage to the units at the max-
imum rated temperature of 125°C for a minimum of 168 hours
and a maximum of 264 hours. The voltage conditioning may be
terminated at any time during 168 hours to 264 hours time inter-
val that confirmed failures meet the requirements of the PDA dur-
ing the last 48 hours of 1 unit or .4% (100% of lot).
Optional Voltage Conditioning (Accelerated Voltage
Conditioning)
— All conditions of the standard voltage condi-
tioning apply with the exception of increased voltage and
decreased test time. Refer to MIL-PRF-123 for the proper formula.
*Step 5 is performed on chips at this point (100% of lot).
3. Dielectric Withstanding Voltage
— 250% of the dc rated volt-
age at 25°C (100% of lot).
4. Insulation Resistance
— The 25°C measurement with rated
voltage applied shall be the lesser of 100 GΩ or 1000 megohm-
microfarads (100% of lot).
*5. Insulation Resistance
— The 125°C measurement with
rated voltage applied shall be the lesser of 10 GΩ or 100
megohm-microfarads (100% of lot). For chips, 125°C IR is per-
formed prior to Step 3 above.
6. Storage
at 150°C for 2 hours minimum without voltage applied
followed by a 12-hour minimum stabilization period (temperature
characteristic BX only).
7. Capacitance
— Shall be within specified tolerance at 25°C
(100% of lot). (Aging phenomenon is taken into account for BX
dielectric to obtain capacitance.)
8. Dissipation Factor
— Shall not exceed 2.5% for X7R (BX)
dielectric, 0.15% for C0G (BP) dielectric at 25°C. (100% of lot.)
9. Percent Defective Allowable (PDA)
— The overall PDA is 8%
for parts outside the MIL-PRF-123 values. The PDA is per MIL-
PRF-123 for all parts that are valid MIL-PRF-123 values. The PD
includes steps 1 through 8 above with the following exceptions.
Capacitance exclusion - capacitance values no more than 5% or
.5pF, whichever is greater for BX characteristic or 1% or .3pF,
whichever is greater for BP characteristic beyond specified toler-
ance limit, shall be removed from the lot but shall not be consid-
ered defective for determination of the PD.
Insulation Resistance at 25°C — Product which is not acceptable
for twice the military limit but is acceptable per the military limit,
is removed from the lot but shall not be considered defective for
determination of the PD.
10. Visual and Mechanical Examination
— Performed per MIL-
PRF-123 criteria.
11. Radiographic Examination (Leaded Devices Only)
Radial devices receive a one-plane X-ray.
12. Destructive Physical Analysis (DPA)
— A sample is exam-
ined on each lot per EIA-469. Sampling Plan is per MIL-PRF-123.
STANDARD PACKAGING
All products are packaged in trays except C512 capacitors which
are packaged 1 piece per bag.
DATA PACKAGE
A data package is sent with each shipment which contains:
1.
Final Destructive Physical Analysis (DPA) report.
2.
Certificate of Compliance stating that the parts meet all applic-
able requirements of the appropriate military specification to the
best failure level to which KEMET is approved.
3.
Summary of Group A Testing.
12
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com
ATMEL ZIGBIT出新版本了 BitCloud_SAMR21_3_3_0
本帖最后由 damiaa 于 2015-9-25 11:05 编辑 ATMEL ZIGBIT出新版本了 BitCloud_SAMR21_3_3_0 来一段英文: Atmel BitCloud SDK provides a comprehensive set of tools — including ful ......
damiaa Microchip MCU
SAMD21开发板试用心得-初识Xplained Pro平台
很幸运申请到SAMD21 Xplained Pro免费的评估版,一直想使用Atmel的MCU开发一个项目,这次希望能通过这个平台熟悉Atmel的开发流程,为下一步的项目做准备。通过从各个论坛和官方网站的学习,找到 ......
zjbwxl 单片机
让我们一起做一个小程序
在 我的C语言之路 里,我反复强调的一句话是:作为一个程序员应该做的事情只有一件,那就是coding。回想过去,我的很多coding都是教科书上的编程习题。这次学习C++。当然它本身就为下面所说的这 ......
辛昕 编程基础
限时100%有礼:下载、分享Keysight毫米波雷达资料抽好礼
本活动与送个车,抽取Keysight牌碎片赢好礼为同一个活动,如您已参与,请勿重复参与。 {:1_97:}本活动截止到5月20日前面设置的鸡腿已经领取完毕现在奖池奖品数量增加,已设置100%有礼,先到 ......
EEWORLD社区 测试/测量
关于emwin移植到stm32f2时GUI_Init卡死问题
程序编译通过了 仿真的时候在GUI_Init卡死,停止的时候也跳不到卡死的地方 405119 网上解决方法都是说 CRC没使能或者内存不够的原因 CRC已经在stm32cubeMX里打开了, 程序里也试过加RCC_AH ......
linlinlinxf stm32/stm8
09年全国电子设计大赛B题
本帖最后由 paulhyde 于 2014-9-15 09:36 编辑 现在学校为了今年的电子设计大赛,让我们从2009年的电子设计大赛的题目中选择一道题来练习一下!我们选择了声音引导系统这道题目,可所需要的元 ......
HI_huluwa 电子竞赛

 
EEWorld订阅号

 
EEWorld服务号

 
汽车开发圈

 
机器人开发圈

About Us 关于我们 客户服务 联系方式 器件索引 网站地图 最新更新 手机版

站点相关: 大学堂 TI培训 Datasheet 电子工程 索引文件: 2805  2519  1756  1518  2466  57  51  36  31  50 

器件索引   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

北京市海淀区中关村大街18号B座15层1530室 电话:(010)82350740 邮编:100190

电子工程世界版权所有 京B2-20211791 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号 Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved